ISTFA 2007: proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2007
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xvi, 356 p.) |
| ISBN: | 0871708639 9780871708632 |
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| 246 | 1 | 3 | |a Proceedings of the 33rd International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a 33rd International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Thirty-third International Symposium for Testing and Failure Analysis |
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Datensatz im Suchindex
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| author_corporate | International Symposium for Testing and Failure Analysis < 2007, San Jose, Calif.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 2007, San Jose, Calif.> |
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| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV040886005 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T00:34:38Z |
| institution | BVB |
| isbn | 0871708639 9780871708632 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025865707 |
| oclc_num | 647828198 |
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| physical | 1 Online-Ressource (xvi, 356 p.) |
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| publishDate | 2007 |
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| spelling | International Symposium for Testing and Failure Analysis < 2007, San Jose, Calif.> Verfasser aut ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c2007 1 Online-Ressource (xvi, 356 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Available via World Wide Web Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth ebrary, Inc Sonstige oth Reproduktion von International Symposium for Testing and Failure Analysis < 2007, San Jose, Calif.>, ISTFA 2007 c2007 |
| spellingShingle | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| title_alt | Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| title_full | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_fullStr | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_full_unstemmed | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_short | ISTFA 2007 |
| title_sort | istfa 2007 proceedings of the 33rd international symposium for testing and failure analysis november 4 8 2007 san jose mcenery convention center san jose california usa |
| title_sub | proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| topic | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
| topic_facet | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Konferenzschrift |
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