ISTFA 2008: conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH
Asm International
c2008
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| Subjects: | |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | 1 Online-Ressource (xx, 528 p.) |
| ISBN: | 0871707144 9780871707147 |
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MARC
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Record in the Search Index
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T00:34:38Z |
| institution | BVB |
| isbn | 0871707144 9780871707147 |
| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 2008, Portland, Or.> Verfasser aut ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International Proceedings of the 34th International Symposium for Testing and Failure Analysis 34th International Symposium for Testing and Failure Analysis Thirty-fourth International Symposium for Testing and Failure Analysis Materials Park, OH Asm International c2008 1 Online-Ressource (xx, 528 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Available via World Wide Web Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth ebrary, Inc Sonstige oth Reproduktion von International Symposium for Testing and Failure Analysis < 2008, Portland, Or.>, ISTFA 2008 c2008 |
| spellingShingle | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
| title_alt | Proceedings of the 34th International Symposium for Testing and Failure Analysis 34th International Symposium for Testing and Failure Analysis Thirty-fourth International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
| title_exact_search | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
| title_full | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
| title_fullStr | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
| title_full_unstemmed | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
| title_short | ISTFA 2008 |
| title_sort | istfa 2008 conference proceedings from the 34th international symposium for testing and failure analysis november 2 6 2008 oregon convention center portland oregon usa |
| title_sub | conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
| topic | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
| topic_facet | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Konferenzschrift |
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