ISTFA 2006: proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Gespeichert in:
Körperschaft: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Materials Park, OH
ASM International
2006
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Schlagworte: | |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | 1 Online-Ressource (xx, 524 p.) |
ISBN: | 9780871708441 0871708442 |
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246 | 1 | 3 | |a Proceedings of the 32nd International Symposium for Testing and Failure Analysis |
246 | 1 | 3 | |a Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
264 | 1 | |a Materials Park, OH |b ASM International |c 2006 | |
300 | |a 1 Online-Ressource (xx, 524 p.) | ||
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Datensatz im Suchindex
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author_corporate | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |
author_corporate_role | aut |
author_facet | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |
author_sort | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |
building | Verbundindex |
bvnumber | BV040885128 |
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dewey-ones | 621 - Applied physics |
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discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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institution | BVB |
isbn | 9780871708441 0871708442 |
language | English |
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publishDate | 2006 |
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publisher | ASM International |
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spelling | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> Verfasser aut ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2006 1 Online-Ressource (xx, 524 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Available via World Wide Web Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Materials / Testing / Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Reproduktion von International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.>, ISTFA 2006 2006 |
spellingShingle | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Materials / Testing / Congresses |
subject_GND | (DE-588)1071861417 |
title | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
title_alt | Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
title_auth | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
title_exact_search | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
title_full | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
title_fullStr | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
title_full_unstemmed | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
title_short | ISTFA 2006 |
title_sort | istfa 2006 proceedings of the 32nd international symposium for testing and failure analysis november 12 16 2006 renaissance austin hotel austin texas usa |
title_sub | proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
topic | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Materials / Testing / Congresses |
topic_facet | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Materials / Testing / Congresses Konferenzschrift |
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