ISTFA 2009: conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
Asm International
2009
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xvi, 355 p.) |
| ISBN: | 1615030085 9781615030088 |
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| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2009 |b conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| 264 | 1 | |a Materials Park, Ohio |b Asm International |c 2009 | |
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| 650 | 4 | |a Electronic apparatus and appliances / Testing / Congresses | |
| 650 | 4 | |a Electronics / Materials / Testing / Congresses | |
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Datensatz im Suchindex
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| author_corporate | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |
| author_sort | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |
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| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV040884690 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T00:34:38Z |
| institution | BVB |
| isbn | 1615030085 9781615030088 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025864392 |
| oclc_num | 647897132 |
| open_access_boolean | |
| physical | 1 Online-Ressource (xvi, 355 p.) |
| psigel | ZDB-38-EBR ZDB-38-ESG |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Asm International |
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| spelling | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> Verfasser aut ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International Materials Park, Ohio Asm International 2009 1 Online-Ressource (xvi, 355 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Available via World Wide Web Electronic apparatus and appliances / Testing / Congresses Electronics / Materials / Testing / Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth ebrary, Inc Sonstige oth Reproduktion von International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.>, ISTFA 2009 2009 |
| spellingShingle | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA Electronic apparatus and appliances / Testing / Congresses Electronics / Materials / Testing / Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_auth | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_full | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_fullStr | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_full_unstemmed | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_short | ISTFA 2009 |
| title_sort | istfa 2009 conference proceedings from the 35th international symposium for testing and failure analysis november 14 19 2009 san jose mcenery convention center san jose california usa |
| title_sub | conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| topic | Electronic apparatus and appliances / Testing / Congresses Electronics / Materials / Testing / Congresses |
| topic_facet | Electronic apparatus and appliances / Testing / Congresses Electronics / Materials / Testing / Congresses Konferenzschrift |
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