Atomic force microscopy: understanding basic modes and advanced applications
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Bibliographic Details
Format: Electronic eBook
Language:English
Published: Hoboken, NJ Wiley-Blackwell 2012
Subjects:
Item Description:Includes bibliographical references
Physical Description:1 Online-Ressource (XXII, 464 S.) Ill., graph. Darst.
ISBN:9781118360699
9780470638828
9781118360668

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!