Atomic force microscopy: understanding basic modes and advanced applications
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hoboken, NJ
Wiley-Blackwell
2012
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references |
| Beschreibung: | 1 Online-Ressource (XXII, 464 S.) Ill., graph. Darst. |
| ISBN: | 9781118360699 9780470638828 9781118360668 |
Internformat
MARC
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| discipline | Physik |
| format | Electronic eBook |
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| id | DE-604.BV040766016 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:33:27Z |
| institution | BVB |
| isbn | 9781118360699 9780470638828 9781118360668 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025744504 |
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| physical | 1 Online-Ressource (XXII, 464 S.) Ill., graph. Darst. |
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| publishDate | 2012 |
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| spelling | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad Hoboken, NJ Wiley-Blackwell 2012 1 Online-Ressource (XXII, 464 S.) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Haugstad, Greg 1963- Sonstige (DE-588)1027424546 oth Erscheint auch als Druck-Ausgabe Atomic force microscopy (DE-604)BV040517501 |
| spellingShingle | Atomic force microscopy understanding basic modes and advanced applications Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Atomic force microscopy understanding basic modes and advanced applications |
| title_auth | Atomic force microscopy understanding basic modes and advanced applications |
| title_exact_search | Atomic force microscopy understanding basic modes and advanced applications |
| title_full | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_fullStr | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_full_unstemmed | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_short | Atomic force microscopy |
| title_sort | atomic force microscopy understanding basic modes and advanced applications |
| title_sub | understanding basic modes and advanced applications |
| topic | Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Atomic force microscopy Rasterkraftmikroskopie |
| work_keys_str_mv | AT haugstadgreg atomicforcemicroscopyunderstandingbasicmodesandadvancedapplications |