Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
Gespeichert in:
Format: | Elektronisch E-Book |
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Sprache: | English |
Veröffentlicht: |
London
Institution of Engineering and Technology
2008
|
Ausgabe: | 1. publ. |
Schriftenreihe: | Circuits, devices and systems series
19 |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | 1 Online-Ressource (xx, 389 p.) graph. Darst. |
ISBN: | 9780863419997 |
Internformat
MARC
LEADER | 00000nmm a2200000 cb4500 | ||
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020 | |a 9780863419997 |c online |9 978-0-86341-999-7 | ||
024 | 7 | |a 10.1049/PBCS019E |2 doi | |
035 | |a (OCoLC)862020192 | ||
035 | |a (DE-599)BVBBV040751919 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
245 | 1 | 0 | |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits |b the system on chip approach |c ed. by Yichuang Sun |
250 | |a 1. publ. | ||
264 | 1 | |a London |b Institution of Engineering and Technology |c 2008 | |
300 | |a 1 Online-Ressource (xx, 389 p.) |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 1 | |a Circuits, devices and systems series |v 19 | |
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Linear integrated circuits |x Testing | |
650 | 4 | |a Mixed signal circuits |x Testing | |
650 | 4 | |a Radio frequency integrated circuits |x Testing | |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Funktionstest |0 (DE-588)4155698-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Hochfrequenzschaltung |0 (DE-588)4160147-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mixed-Signal-Schaltung |0 (DE-588)4756481-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Analoge integrierte Schaltung |0 (DE-588)4112519-8 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | 1 | |a Analoge integrierte Schaltung |0 (DE-588)4112519-8 |D s |
689 | 0 | 2 | |a Mixed-Signal-Schaltung |0 (DE-588)4756481-7 |D s |
689 | 0 | 3 | |a Hochfrequenzschaltung |0 (DE-588)4160147-6 |D s |
689 | 0 | 4 | |a Funktionstest |0 (DE-588)4155698-7 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
700 | 1 | |a Sun, Yichuang |e Sonstige |4 oth | |
830 | 0 | |a Circuits, devices and systems series |v 19 |w (DE-604)BV035311331 |9 19 | |
856 | 4 | 0 | |u http://digital-library.theiet.org/content/books/cs/pbcs019e |3 Volltext |
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
912 | |a ebook |
Datensatz im Suchindex
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adam_text | |
any_adam_object | |
building | Verbundindex |
bvnumber | BV040751919 |
collection | ebook |
ctrlnum | (OCoLC)862020192 (DE-599)BVBBV040751919 |
edition | 1. publ. |
format | Electronic eBook |
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id | DE-604.BV040751919 |
illustrated | Not Illustrated |
indexdate | 2024-07-20T05:42:18Z |
institution | BVB |
isbn | 9780863419997 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025731666 |
oclc_num | 862020192 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource (xx, 389 p.) graph. Darst. |
psigel | ebook |
publishDate | 2008 |
publishDateSearch | 2008 |
publishDateSort | 2008 |
publisher | Institution of Engineering and Technology |
record_format | marc |
series | Circuits, devices and systems series |
series2 | Circuits, devices and systems series |
spelling | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun 1. publ. London Institution of Engineering and Technology 2008 1 Online-Ressource (xx, 389 p.) graph. Darst. txt rdacontent c rdamedia cr rdacarrier Circuits, devices and systems series 19 Includes bibliographical references and index Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Funktionstest (DE-588)4155698-7 gnd rswk-swf Hochfrequenzschaltung (DE-588)4160147-6 gnd rswk-swf Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Analoge integrierte Schaltung (DE-588)4112519-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Analoge integrierte Schaltung (DE-588)4112519-8 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Hochfrequenzschaltung (DE-588)4160147-6 s Funktionstest (DE-588)4155698-7 s 1\p DE-604 Sun, Yichuang Sonstige oth Circuits, devices and systems series 19 (DE-604)BV035311331 19 http://digital-library.theiet.org/content/books/cs/pbcs019e Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach Circuits, devices and systems series Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd |
subject_GND | (DE-588)4027242-4 (DE-588)4155698-7 (DE-588)4160147-6 (DE-588)4756481-7 (DE-588)4112519-8 |
title | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
title_auth | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
title_exact_search | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
title_full | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
title_fullStr | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
title_full_unstemmed | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
title_short | Test and diagnosis of analogue, mixed-signal and RF integrated circuits |
title_sort | test and diagnosis of analogue mixed signal and rf integrated circuits the system on chip approach |
title_sub | the system on chip approach |
topic | Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd |
topic_facet | Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung Funktionstest Hochfrequenzschaltung Mixed-Signal-Schaltung Analoge integrierte Schaltung |
url | http://digital-library.theiet.org/content/books/cs/pbcs019e |
volume_link | (DE-604)BV035311331 |
work_keys_str_mv | AT sunyichuang testanddiagnosisofanaloguemixedsignalandrfintegratedcircuitsthesystemonchipapproach |