Transmission Electron Microscopy and Diffractometry of Materials:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2013
|
| Ausgabe: | 4th ed. 2013 |
| Schriftenreihe: | Graduate Texts in Physics
|
| Schlagworte: | |
| Online-Zugang: | TUM01 UBT01 Volltext Inhaltsverzeichnis Abstract |
| Beschreibung: | Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9783642297618 |
| DOI: | 10.1007/978-3-642-29761-8 |
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| 500 | |a This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
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Datensatz im Suchindex
| _version_ | 1804150074730610688 |
|---|---|
| adam_text | TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS
/ FULTZ, BRENT
: 2013
TABLE OF CONTENTS / INHALTSVERZEICHNIS
DIFFRACTION AND X-RAY POWDER DIFFRACTOMETER PROBLEMS
TEM AND ITS OPTICS PROBLEMS
NEUTRON SCATTERING PROBLEMS
SCATTERING PROBLEMS
INELASTIC ELECTRON SCATTERING AND SPECTROSCOPY PROBLEMS
DIFFRACTION FROM CRYSTALS SPHERE PROBLEMS
ELECTRON DIFFRACTION AND CRYSTALLOGRAPHY PROBLEMS
DIFFRACTION CONTRAST IN TEM IMAGES PROBLEMS
DIFFRACTION LINESHAPES PROBLEMS
PATTERSON FUNCTIONS AND DIFFUSE SCATTERING PROBLEMS
HIGH-RESOLUTION TEM IMAGING PROBLEMS
HIGH-RESOLUTION STEM AND RELATED IMAGING TECHNIQUES PROBLEMS
DYNAMICAL THEORY PROBLEMS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS
/ FULTZ, BRENT
: 2013
ABSTRACT / INHALTSTEXT
THIS BOOK EXPLAINS CONCEPTS OF TRANSMISSION ELECTRON MICROSCOPY (TEM)
AND X-RAY DIFFRACTOMETRY (XRD) THAT ARE IMPORTANT FOR THE
CHARACTERIZATION OF MATERIALS. THE FOURTH EDITION ADDS IMPORTANT NEW
TECHNIQUES OF TEM SUCH AS ELECTRON TOMOGRAPHY, NANOBEAM DIFFRACTION, AND
GEOMETRIC PHASE ANALYSIS. A NEW CHAPTER ON NEUTRON SCATTERING COMPLETES
THE TRIO OF X-RAY, ELECTRON AND NEUTRON DIFFRACTION. ALL CHAPTERS WERE
UPDATED AND REVISED FOR CLARITY. THE BOOK EXPLAINS THE FUNDAMENTALS OF
HOW WAVES AND WAVEFUNCTIONS INTERACT WITH ATOMS IN SOLIDS, AND THE
SIMILARITIES AND DIFFERENCES OF USING X-RAYS, ELECTRONS, OR NEUTRONS FOR
DIFFRACTION MEASUREMENTS. DIFFRACTION EFFECTS OF CRYSTALLINE ORDER,
DEFECTS, AND DISORDER IN MATERIALS ARE EXPLAINED IN DETAIL. BOTH
PRACTICAL AND THEORETICAL ISSUES ARE COVERED. THE BOOK CAN BE USED IN AN
INTRODUCTORY-LEVEL OR ADVANCED-LEVEL COURSE, SINCE SECTIONS ARE
IDENTIFIED BY DIFFICULTY. EACH CHAPTER INCLUDES A SET OF PROBLEMS TO
ILLUSTRATE PRINCIPLES, AND THE EXTENSIVE APPENDIX INCLUDES LABORATORY
EXERCISES
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
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| edition | 4th ed. 2013 |
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| spelling | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James Howe 4th ed. 2013 Berlin, Heidelberg Springer Berlin Heidelberg 2013 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Graduate Texts in Physics Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Physics Spectroscopy Surfaces (Physics) Spectroscopy and Microscopy Characterization and Evaluation of Materials Spectroscopy/Spectrometry Surfaces and Interfaces, Thin Films Surface and Interface Science, Thin Films Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Röntgendiffraktometrie (DE-588)4336833-5 s 1\p DE-604 Fultz, Brent 1955- Sonstige (DE-588)122354796 oth Howe, James M. 1955- Sonstige (DE-588)122354818 oth https://doi.org/10.1007/978-3-642-29761-8 Verlag Volltext Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025731084&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025731084&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Abstract 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Transmission Electron Microscopy and Diffractometry of Materials Physics Spectroscopy Surfaces (Physics) Spectroscopy and Microscopy Characterization and Evaluation of Materials Spectroscopy/Spectrometry Surfaces and Interfaces, Thin Films Surface and Interface Science, Thin Films Röntgendiffraktometrie (DE-588)4336833-5 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4336833-5 (DE-588)4215608-7 |
| title | Transmission Electron Microscopy and Diffractometry of Materials |
| title_auth | Transmission Electron Microscopy and Diffractometry of Materials |
| title_exact_search | Transmission Electron Microscopy and Diffractometry of Materials |
| title_full | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James Howe |
| title_fullStr | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James Howe |
| title_full_unstemmed | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James Howe |
| title_short | Transmission Electron Microscopy and Diffractometry of Materials |
| title_sort | transmission electron microscopy and diffractometry of materials |
| topic | Physics Spectroscopy Surfaces (Physics) Spectroscopy and Microscopy Characterization and Evaluation of Materials Spectroscopy/Spectrometry Surfaces and Interfaces, Thin Films Surface and Interface Science, Thin Films Röntgendiffraktometrie (DE-588)4336833-5 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Physics Spectroscopy Surfaces (Physics) Spectroscopy and Microscopy Characterization and Evaluation of Materials Spectroscopy/Spectrometry Surfaces and Interfaces, Thin Films Surface and Interface Science, Thin Films Röntgendiffraktometrie Durchstrahlungselektronenmikroskopie |
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