Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability
Gespeichert in:
Hauptverfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York, NY [u.a.]
Springer
2012
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Schriftenreihe: | Springer Series in Materials Science
157 |
Schlagworte: | |
Online-Zugang: | TUM01 UBT01 Volltext |
Beschreibung: | 1 Online-Ressource |
ISBN: | 9781461418122 |
DOI: | 10.1007/978-1-4614-1812-2 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV040751107 | ||
003 | DE-604 | ||
005 | 20131204 | ||
007 | cr|uuu---uuuuu | ||
008 | 130214s2012 |||| o||u| ||||||eng d | ||
020 | |a 9781461418122 |c Online |9 978-1-4614-1812-2 | ||
024 | 7 | |a 10.1007/978-1-4614-1812-2 |2 doi | |
035 | |a (OCoLC)838809617 | ||
035 | |a (DE-599)BVBBV040751107 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-703 |a DE-91 | ||
084 | |a UQ 1100 |0 (DE-625)146473: |2 rvk | ||
084 | |a PHY 000 |2 stub | ||
100 | 1 | |a He, Ming |e Verfasser |4 aut | |
245 | 1 | 0 | |a Metal-Dielectric Interfaces in Gigascale Electronics |b Thermal and Electrical Stability |c Ming He ; Toh-Ming Lu |
264 | 1 | |a New York, NY [u.a.] |b Springer |c 2012 | |
300 | |a 1 Online-Ressource | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 1 | |a Springer Series in Materials Science |v 157 | |
650 | 4 | |a Chemie | |
650 | 4 | |a Ingenieurwissenschaften | |
650 | 4 | |a Engineering | |
650 | 4 | |a Chemistry | |
650 | 4 | |a Electronics | |
650 | 4 | |a Optical materials | |
650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
650 | 4 | |a Optical and Electronic Materials | |
650 | 4 | |a Surface and Interface Science, Thin Films | |
650 | 4 | |a Nanotechnology and Microengineering | |
650 | 4 | |a Electrochemistry | |
650 | 4 | |a Engineering Thermodynamics, Heat and Mass Transfer | |
700 | 1 | |a Lu, Toh-Ming |d 1943- |e Verfasser |0 (DE-588)173439993 |4 aut | |
776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-1-4614-1811-5 |
830 | 0 | |a Springer Series in Materials Science |v 157 |w (DE-604)BV040385147 |9 157 | |
856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4614-1812-2 |x Verlag |3 Volltext |
912 | |a ZDB-2-PHA | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-025730859 | ||
966 | e | |u https://doi.org/10.1007/978-1-4614-1812-2 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4614-1812-2 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804150074321666049 |
---|---|
any_adam_object | |
author | He, Ming Lu, Toh-Ming 1943- |
author_GND | (DE-588)173439993 |
author_facet | He, Ming Lu, Toh-Ming 1943- |
author_role | aut aut |
author_sort | He, Ming |
author_variant | m h mh t m l tml |
building | Verbundindex |
bvnumber | BV040751107 |
classification_rvk | UQ 1100 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA |
ctrlnum | (OCoLC)838809617 (DE-599)BVBBV040751107 |
discipline | Physik |
doi_str_mv | 10.1007/978-1-4614-1812-2 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01987nmm a2200529zcb4500</leader><controlfield tag="001">BV040751107</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20131204 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">130214s2012 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781461418122</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4614-1812-2</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4614-1812-2</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)838809617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV040751107</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 1100</subfield><subfield code="0">(DE-625)146473:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">He, Ming</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Metal-Dielectric Interfaces in Gigascale Electronics</subfield><subfield code="b">Thermal and Electrical Stability</subfield><subfield code="c">Ming He ; Toh-Ming Lu</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2012</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Materials Science</subfield><subfield code="v">157</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemie</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface and Interface Science, Thin Films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanotechnology and Microengineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrochemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering Thermodynamics, Heat and Mass Transfer</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lu, Toh-Ming</subfield><subfield code="d">1943-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)173439993</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-1-4614-1811-5</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Materials Science</subfield><subfield code="v">157</subfield><subfield code="w">(DE-604)BV040385147</subfield><subfield code="9">157</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4614-1812-2</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-025730859</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4614-1812-2</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4614-1812-2</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV040751107 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T00:33:08Z |
institution | BVB |
isbn | 9781461418122 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025730859 |
oclc_num | 838809617 |
open_access_boolean | |
owner | DE-703 DE-91 DE-BY-TUM |
owner_facet | DE-703 DE-91 DE-BY-TUM |
physical | 1 Online-Ressource |
psigel | ZDB-2-PHA |
publishDate | 2012 |
publishDateSearch | 2012 |
publishDateSort | 2012 |
publisher | Springer |
record_format | marc |
series | Springer Series in Materials Science |
series2 | Springer Series in Materials Science |
spelling | He, Ming Verfasser aut Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability Ming He ; Toh-Ming Lu New York, NY [u.a.] Springer 2012 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Springer Series in Materials Science 157 Chemie Ingenieurwissenschaften Engineering Chemistry Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Surface and Interface Science, Thin Films Nanotechnology and Microengineering Electrochemistry Engineering Thermodynamics, Heat and Mass Transfer Lu, Toh-Ming 1943- Verfasser (DE-588)173439993 aut Erscheint auch als Druckausgabe 978-1-4614-1811-5 Springer Series in Materials Science 157 (DE-604)BV040385147 157 https://doi.org/10.1007/978-1-4614-1812-2 Verlag Volltext |
spellingShingle | He, Ming Lu, Toh-Ming 1943- Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability Springer Series in Materials Science Chemie Ingenieurwissenschaften Engineering Chemistry Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Surface and Interface Science, Thin Films Nanotechnology and Microengineering Electrochemistry Engineering Thermodynamics, Heat and Mass Transfer |
title | Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability |
title_auth | Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability |
title_exact_search | Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability |
title_full | Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability Ming He ; Toh-Ming Lu |
title_fullStr | Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability Ming He ; Toh-Ming Lu |
title_full_unstemmed | Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability Ming He ; Toh-Ming Lu |
title_short | Metal-Dielectric Interfaces in Gigascale Electronics |
title_sort | metal dielectric interfaces in gigascale electronics thermal and electrical stability |
title_sub | Thermal and Electrical Stability |
topic | Chemie Ingenieurwissenschaften Engineering Chemistry Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Surface and Interface Science, Thin Films Nanotechnology and Microengineering Electrochemistry Engineering Thermodynamics, Heat and Mass Transfer |
topic_facet | Chemie Ingenieurwissenschaften Engineering Chemistry Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Surface and Interface Science, Thin Films Nanotechnology and Microengineering Electrochemistry Engineering Thermodynamics, Heat and Mass Transfer |
url | https://doi.org/10.1007/978-1-4614-1812-2 |
volume_link | (DE-604)BV040385147 |
work_keys_str_mv | AT heming metaldielectricinterfacesingigascaleelectronicsthermalandelectricalstability AT lutohming metaldielectricinterfacesingigascaleelectronicsthermalandelectricalstability |