Nyquist AD converters, sensor interfaces, and robustness: advances in analog circuit design, 2012
<p>This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor int...
Gespeichert in:
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
2013
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| Schlagworte: | |
| Online-Zugang: | BTU01 FHA01 FHI01 FHN01 FHR01 FKE01 FWS01 UBY01 Volltext Inhaltsverzeichnis Abstract |
| Zusammenfassung: | <p>This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. </p><ul><li>Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;</li><li>Presents material in a tutorial-based format;</li><li>Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.</li></ul> |
| Beschreibung: | <p>Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.</p> |
| Beschreibung: | 1 Online-Ressource (X, 291 p. 230 illus., 77 illus. in color) |
| ISBN: | 9781461445876 |
| DOI: | 10.1007/978-1-4614-4587-6 |
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Datensatz im Suchindex
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| adam_text | NYQUIST AD CONVERTERS, SENSOR INTERFACES, AND ROBUSTNESS
/
: 2013
TABLE OF CONTENTS / INHALTSVERZEICHNIS
PART I: NYQUIST A/D CONVERTERS
HIGH PERFORMANCE PIPELINED A/D CONVERTERS IN CMOS AND BICMOS PROCESSES
DUAL RESIDUE PIPELINE ADC
TIME-INTERLEAVED SAR AND SLOPE CONVERTERS
GS/S AD CONVERSION FOR BROADBAND MULTI-STREAM RECEPTION
CMOS ULTRA HIGH-SPEED TIME-INTERLEAVED ADCS
CMOS ADCS FOR OPTICAL COMMUNICATIONS
PART II: CAPACITIVE SENSOR INTERFACES.-MEMS AND SENSORS, TODAY AND
TOMORROW
ENERGY-EFFICIENT CAPACITIVE SENSOR INTERFACES
INTERFACE CIRCUITSFOR MEMS MICROPHONES
FRONT-END ELECTRONICS FOR SOLID STATE DETECTORS INPRESENT AND FUTURE
HIGH-ENERGY PHYSICS EXPERIMENTS
PART III:ROBUSTNESS
HOW CAN CHIPS LIVE UNDER RADIATION?
TDC AND RAD ENVIRONMENTS
MATCHING AND RESOLUTION
MATCHING IN POLYMER AND EFFECT ON CIRCUIT TOPOLOGIES
STATISTICAL VARIABILITY AND RELIABILITY IN NANO-CMOS TRANSISTORS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
NYQUIST AD CONVERTERS, SENSOR INTERFACES, AND ROBUSTNESS
/
: 2013
ABSTRACT / INHALTSTEXT
THIS BOOK IS BASED ON THEPRESENTATIONS DURING THE 21ST WORKSHOP ON
ADVANCES IN ANALOG CIRCUIT DESIGN. EXPERT DESIGNERS PROVIDE READERS
WITH INFORMATION ABOUT A VARIETY OF TOPICS AT THE FRONTIER OF ANALOG
CIRCUIT DESIGN, INCLUDING NYQUIST ANALOG-TO-DIGITAL CONVERTERS,
CAPACITIVE SENSOR INTERFACES, RELIABILITY, VARIABILITY, AND
CONNECTIVITY. THIS BOOK SERVES AS A VALUABLE REFERENCE TO THE
STATE-OF-THE-ART, FOR ANYONE INVOLVED IN ANALOG CIRCUIT RESEARCH AND
DEVELOPMENT. PROVIDES A STATE-OF-THE-ART REFERENCE IN ANALOG CIRCUIT
DESIGN, WRITTEN BY EXPERTS FROM INDUSTRY AND ACADEMIA; PRESENTS MATERIAL
IN A TUTORIAL-BASED FORMAT; INCLUDES COVERAGE OF NYQUIST A/D CONVERTERS,
CAPACITIVE SENSOR INTERFACES, RELIABILITY, VARIABILITY, AND CONNECTIVITY
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
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| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025691977 |
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| spellingShingle | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 Ingenieurwissenschaften Engineering Electronics Systems engineering |
| title | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 |
| title_auth | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 |
| title_exact_search | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 |
| title_full | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 Arthur H. M. van Roermund ..., eds. |
| title_fullStr | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 Arthur H. M. van Roermund ..., eds. |
| title_full_unstemmed | Nyquist AD converters, sensor interfaces, and robustness advances in analog circuit design, 2012 Arthur H. M. van Roermund ..., eds. |
| title_short | Nyquist AD converters, sensor interfaces, and robustness |
| title_sort | nyquist ad converters sensor interfaces and robustness advances in analog circuit design 2012 |
| title_sub | advances in analog circuit design, 2012 |
| topic | Ingenieurwissenschaften Engineering Electronics Systems engineering |
| topic_facet | Ingenieurwissenschaften Engineering Electronics Systems engineering |
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