Transmission electron microscopy and diffractometry of materials:
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| Format: | Buch |
| Sprache: | English |
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Berlin ; Heidelberg
Springer
2013
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| Ausgabe: | Fourth edition |
| Schriftenreihe: | Graduate texts in physics
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| Beschreibung: | Literaturangaben |
| Beschreibung: | xx, 761 Seiten Illustrationen, Diagramme |
| ISBN: | 9783642297601 3642297609 |
Internformat
MARC
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| 100 | 1 | |a Fultz, Brent |d 1955- |e Verfasser |0 (DE-588)122354796 |4 aut | |
| 245 | 1 | 0 | |a Transmission electron microscopy and diffractometry of materials |c Brent Fultz, James Howe |
| 250 | |a Fourth edition | ||
| 264 | 1 | |a Berlin ; Heidelberg |b Springer |c 2013 | |
| 300 | |a xx, 761 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Graduate texts in physics | |
| 500 | |a Literaturangaben | ||
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| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, eBook |z 978-3-642-29761-8 |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-025691653 | ||
Datensatz im Suchindex
| _version_ | 1804150018248015872 |
|---|---|
| adam_text | Titel: Transmission electron microscopy and diffractometry of materials
Autor: Fultz, Brent
Jahr: 2013
Contents1
1 Diffraction and the X-Ray Powder Diffractometer 1
1.1 Diffraction 1
1.1.1 Introduction to Diffraction 1
1.1.2 Bragg s Law 3
1.1.3 Strain Effects 6
1.1.4 Size Effects 6
1.1.5 A Symmetry Consideration 8
1.1.6 Momentum and Energy 9
1.1.7 Experimental Methods 10
1.2 The Creation of X-Rays 12
1.2.1 Bremsstrahlung 13
1.2.2 Characteristic Radiation 15
1.2.3 Synchrotron Radiation 20
1.3 The X-Ray Powder Diffractometer 22
1.3.1 Practice of X-Ray Generation 22
1.3.2 Goniometer for Powder Diffraction 24
1.3.3 Monochromators, Filters, Mirrors 27
1.4 X-Ray Detectors for XRD and TEM 29
1.4.1 Detector Principles 29
1.4.2 Solid State Detectors 31
1.4.3 Position-Sensitive Detectors 33
1.4.4 Charge Sensitive Preamplifier 34
1.4.5 Other Electronics 35
1.5 Experimental X-Ray Powder Diffraction Data 37
1.5.1 * Intensities of Powder Diffraction Peaks 37
1.5.2 Normals of Diffracting Planes 37
1.5.3 Slit Width 38
1.5.4 Lorentz Factor 38
in section titles, the asterisk, *, denotes a more specialized topic. The double dagger, warns
o f a higher level o f mathematics, physics, or crystallography.
xi
http://d-nb.info/1021362131
xii Contents
1.5.5 Absorption 41
1.5.6 Polarization 42
1.5.7 Multiplicity and Density 42
1.5.8 Measured Intensities 43
1.5.9 Phase Fraction Measurement 44
1.5.10 Peak Ratio Method 44
1.5.11 Absorption Factors 45
1.5.12 Example: Retained Austenite in Steels 46
1.5.13 Lattice Parameter Measurement 48
1.5.14 * Refinement Methods for Powder Diffraction Data . . . . 49
1.6 Further Reading 52
1.7 Problems 53
2 The TEM and Its Optics 59
2.1 Introduction to the Transmission Electron Microscope 59
2.2 Working with Lenses and Ray Diagrams 63
2.2.1 Single Lenses 63
2.2.2 Multi-Lens Systems 67
2.3 Modes of Operation of a TEM 68
2.3.1 Dark-Field and Bright-Field Imaging 68
2.3.2 Selected Area Diffraction 73
2.3.3 Convergent-Beam Electron Diffraction 77
2.3.4 Nanobeam Diffraction 78
2.3.5 High-Resolution Imaging 79
2.4 Practical TEM Optics 82
2.4.1 Electron Guns 82
2.4.2 Illumination Lens Systems 85
2.4.3 Imaging Lens Systems 86
2.5 Glass Lenses 88
2.5.1 Interfaces 88
2.5.2 Lenses and Rays 89
2.5.3 Lenses and Phase Shifts 92
2.6 Magnetic Lenses 93
2.6.1 Focusing 93
2.6.2 Image Rotation 96
2.6.3 Pole Piece Gap 98
2.7 Lens Aberrations and Other Defects 98
2.7.1 Spherical Aberration 98
2.7.2 Chromatic Aberration 99
2.7.3 Diffraction 100
2.7.4 Astigmatism 101
2.7.5 Gun Brightness 104
2.8 Resolution 106
2.9 Further Reading 108
2.10 Problems 109
Contents xiii
3 Neutron Scattering 117
3.1 Neutrons and Neutron Scattering 117
3.1.1 Neutron Scattering 117
3.1.2 Properties of Neutrons 118
3.2 Neutron Sources 120
3.2.1 Fission and Spallation 120
3.2.2 Moderation 121
3.3 Neutron Powder Diffractometers 122
3.3.1 Reactor-Based Powder Diffractometer 122
3.3.2 Pulsed-Source-Based Powder Diffractometer 122
3.4 Waves of Phase 126
3.4.1 Phase in Elastic Scattering 126
3.4.2 * Phase in Inelastic Scattering 128
3.5 Instruments for Measuring Larger Structures 129
3.5.1 Small-Angle Scattering 129
3.5.2 * Neutron Reflectivity 130
3.6 * Inelastic Scattering 133
3.6.1 * Triple-Axis Spectrometer 133
3.6.2 * Fermi Chopper Spectrometer 134
3.6.3 * Other Inelastic Instruments 136
3.7 * Quasielastic Scattering 137
3.8 * Magnetic Scattering 139
3.9 Nuclear Scattering 140
3.10 Further Reading 141
3.11 Problems 142
4 Scattering 145
4.1 Waves and Scattering 145
4.1.1 Wavefunctions 145
4.1.2 Coherent and Incoherent Scattering 148
4.1.3 Elastic and Inelastic Scattering 149
4.1.4 Wave Amplitudes and Cross-Sections 150
4.2 X-Ray Scattering 154
4.2.1 Electrodynamics of X-Ray Scattering 154
4.2.2 * Inelastic Compton Scattering 158
4.2.3 X-Ray Mass Attenuation Coefficients 160
4.3 Coherent Elastic Scattering 162
4-3.1 | Born Approximation for Electrons 162
4.3.2 Atomic Form Factors--Physical Picture 167
4.3.3 $ Scattering of Electrons by Model Potentials 170
4.3.4 $ * Atomic Form Factors--General Formulation 174
4.4 Further Reading 178
4.5 Problems 178
5 Inelastic Electron Scattering and Spectroscopy 181
5.1 Inelastic Electron Scattering 181
5.2 Electron Energy-Loss Spectrometry (EELS) 183
xiv Contents
5.2.1 Instrumentation 183
5.2.2 General Features of EELS Spectra 185
5.2.3 * Fine Structure 186
5.3 Plasmon Excitations 190
5.3.1 Plasmon Principles 190
5.3.2 * Plasmons and Specimen Thickness 192
5.4 Core Excitations 194
5.4.1 Scattering Angles and Energies--Qualitative 194
5.4.2 i Inelastic Form Factor 197
5.4.3 Double-Differential Cross-Section, d2
crin /d0d£ . . . 201
5.4.4 * Scattering Angles and Energies--Quantitative 203
5.4.5 t * Differential Cross-Section, d a m / d E 204
5.4.6 t Partial and Total Cross-Sections, rin 205
5.4.7 Quantification of EELS Core Edges 208
5.5 Energy-Filtered TEM Imaging (EFTEM) 209
5.5.1 Spectrum Imaging 209
5.5.2 Energy Filters 210
5.5.3 Chemical Mapping with Energy-Filtered Images 212
5.5.4 Chemical Analysis with High Spatial Resolution 214
5.6 Energy Dispersive X-Ray Spectrometry (EDS) 216
5.6.1 Electron Trajectories Through Materials 216
5.6.2 Fluorescence Yield 219
5.6.3 EDS Instrumentation Considerations 221
5.6.4 Artifacts in EDS Measurements 224
5.7 Quantitative EDS 225
5.7.1 Thin-Film Approximation 225
5.7.2 * ZAF Correction 228
5.7.3 * Limits of Microanalysis 230
5.8 Further Reading 232
5.9 Problems 233
6 Diffraction from Crystals 237
6.1 Sums of Wavelets from Atoms 237
6.1.1 Electron Diffraction from a Material 238
6.1.2 Wave Diffraction from a Material 240
6.2 The Reciprocal Lattice and the Laue Condition 244
6.2.1 Diffraction from a Simple Lattice 244
6.2.2 Reciprocal Lattice 245
6.2.3 Laue Condition 247
6.2.4 Equivalence of the Laue Condition and Bragg s Law . . . 247
6.2.5 Reciprocal Lattices of Cubic Crystals 248
6.3 Diffraction from a Lattice with a Basis 249
6.3.1 Structure Factor and Shape Factor 249
6.3.2 Structure Factor Rules 251
6.3.3 Symmetry Operations and Forbidden Diffractions 256
Contents x v
6.4 Chemically-Ordered Structures 258
6.4.1 Superlattice Diffractions 258
6.4.2 Order Parameters 261
6.5 Crystal Shape Factor 264
6.5.1 Shape Factor of Rectangular Prism 264
6.5.2 Other Shape Factors 268
6.5.3 Small Particles in a Large Matrix 269
6.6 Deviation Vector (Deviation Parameter) 272
6.7 Ewald Sphere 274
6.7.1 Ewald Sphere Construction 274
6.7.2 Ewald Sphere and Bragg s Law 275
6.7.3 Tilting Specimens and Tilting Electron Beams 276
6.8 Laue Zones 278
6.9 * Effects of Curvature of the Ewald Sphere 280
6.10 Further Reading 281
6.11 Problems 282
7 Electron Diffraction and Crystallography 289
7.1 Indexing Diffraction Patterns 289
7.1.1 Issues in Indexing 290
7.1.2 Method 1--Start with Zone Axis 292
7.1.3 Method 2--Start with Diffraction Spots 296
7.2 Stereographic Projections and Their Manipulation 298
7.2.1 Construction of a Stereographic Projection 298
7.2.2 Relationship Between Stereographic Projections
and Electron Diffraction Patterns 299
7.2.3 Manipulations of Stereographic Projections 300
7.3 Kikuchi Lines and Specimen Orientation 306
7.3.1 Origin of Kikuchi Lines 306
7.3.2 Indexing Kikuchi Lines 309
7.3.3 Specimen Orientation and Deviation Parameter 311
7.3.4 The Sign of s 313
7.3.5 Kikuchi Maps 314
7.4 Double Diffraction 316
7.4.1 Occurrence of Forbidden Diffractions 316
7.4.2 Interactions Between Crystallites 317
7.5 * Convergent-Beam Electron Diffraction 318
7.5.1 Convergence Angle of Incident Electron Beam 319
7.5.2 Determination of Sample Thickness 320
7.5.3 Measurements of Unit Cell Parameters 322
7.5.4 $ Determination of Point Groups 328
7.5.5 + Determination of Space Groups 339
7.6 Further Reading 342
7.7 Problems 343
xvi Contents
8 Diffraction Contrast in TEM Images 349
8.1 Contrast in TEM Images 349
8.2 Diffraction from Crystals with Defects 351
8.2.1 Review of the Deviation Parameter, 5 351
8.2.2 Atom Displacements, Sr 352
8.2.3 Shape Factor and f 353
8.2.4 Diffraction Contrast and {a Sr, t] 353
8.3 Extinction Distance 354
8.4 The Phase-Amplitude Diagram 356
8.5 Fringes from Sample Thickness Variations 358
8.5.1 Thickness and Phase-Amplitude Diagrams 358
8.5.2 Thickness Fringes in TEM Images 360
8.6 Bend Contours in TEM Images 363
8.7 Diffraction Contrast from Strain Fields 368
8.8 Dislocations and Burgers Vector Determination 370
8.8.1 Diffraction Contrast from Dislocation Strain Fields . . . . 370
8.8.2 The g · b Rule for Null Contrast 372
8.8.3 Image Position and Dislocation Pairs or Loops 377
8.9 Semi-Quantitative Diffraction Contrast from Dislocations 381
8.10 Weak-Beam Dark-Field (WBDF) Imaging of Dislocations . . . . 387
8.10.1 Procedure to Make a WBDF Image 387
8.10.2 Diffraction Condition for a WBDF Image 388
8.10.3 Analysis of WBDF Images 389
8.11 Fringes at Interfaces 393
8.11.1 Phase Shifts of Electron Wavelets Across Interfaces . . . . 393
8.11.2 Moire Fringes 396
8.12 Diffraction Contrast from Stacking Faults 400
8.12.1 Kinematical Treatment 400
8.12.2 Results from Dynamical Theory 404
8.12.3 Determination of the Intrinsic or Extrinsic Nature
of Stacking Faults 406
8.12.4 Partial Dislocations Bounding the Fault 407
8.12.5 An Example of a Stacking Fault Analysis 407
8.12.6 Sets of Stacking Faults in TEM Images 409
8.12.7 Related Fringe Contrast 410
8.13 Antiphase (tt) Boundaries and 5 Boundaries 411
8.13.1 Antiphase Boundaries 411
8.13.2 S Boundaries 412
8.14 Contrast from Precipitates and Other Defects 414
8.14.1 Vacancies 414
8.14.2 Coherent Precipitates 415
8.14.3 Semicoherent and Incoherent Particles 419
8.15 Further Reading 420
8.16 Problems 420
Contents xvii
9 Diffraction Lineshapes 429
9.1 Diffraction Line Broadening and Convolution 429
9.1.1 Crystallite Size Broadening 430
9.1.2 Strain Broadening 432
9.1.3 Instrumental Broadening--Convolution 436
9.2 Fourier Transform Deconvolutions 439
9.2.1 Mathematical Features 439
9.2.2 * Effects of Noise on Fourier Transform Deconvolutions . 442
9.3 Simultaneous Strain and Size Broadening 446
9.4 Diffraction Lineshapes from Columns of Crystals 452
9.4.1 Wavelets from Pairs of Unit Cells in One Column 452
9.4.2 A Column Length Distribution 454
9.4.3 + Intensity from Column Length Distribution 456
9.5 Comments on Diffraction Lineshapes 458
9.6 Further Reading 460
9.7 Problems 460
10 Patterson Functions and Diffuse Scattering 463
10.1 The Patterson Function 463
10.1.1 Overview 463
10.1.2 Atom Centers at Points in Space 464
10.1.3 Definition of the Patterson Function 465
10.1.4 Properties of Patterson Functions 467
10.1.5 $ Perfect Crystals 469
10.1.6 Deviations from Periodicity and Diffuse Scattering . . . . 473
10.2 Diffuse Scattering from Atomic Displacements 475
10.2.1 Uncorrelated Displacements--Homogeneous Disorder . . 475
10.2.2 $ Temperature 477
10.2.3 * Correlated Displacements--Atomic Size Effects 482
10.3 Diffuse Scattering from Chemical Disorder 486
10.3.1 Uncorrelated Chemical Disorder--Random Alloys . . . . 486
10.3.2 $ * SRO Parameters 490
10.3.3 i * Patterson Function for Chemical SRO 491
10.3.4 SRO Diffuse Intensity 493
10.3.5 $ * Isotropic Materials 493
10.3.6 * Polycrystalline Average and Single Crystal SRO 495
10.4 * Amorphous Materials 496
10.4.1 $ One-Dimensional Model 496
10.4.2 $ Radial Distribution Function 501
10.4.3 $ Partial Pair Correlation Functions 504
10.5 Small Angle Scattering 506
10.5.1 Concept of Small Angle Scattering 506
10.5.2 * Guinier Approximation (Small Ak) 508
10.5.3 * Porod Law (Large A k ) 512
10.5.4 $ * Density-Density Correlations (All A k ) 514
xviii Contents
10.6 Further Reading 516
10.7 Problems 517
11 High-Resolution TEM Imaging 521
11.1 Huygens Principle 522
11.1.1 Wavelets from Points in a Continuum 522
11.1.2 Huygens Principle for a Spherical Wavefront--Fresnel
Zones 526
11.1.3 $ Fresnel Diffraction Near an Edge 531
11.2 Physical Optics of High-Resolution Imaging 535
11.2.1 + Wavefronts and Fresnel Propagator 535
11.2.2 + Lenses 537
11.2.3 i Materials 539
11.3 Experimental High-Resolution Imaging 542
11.3.1 Defocus and Spherical Aberration 542
11.3.2 $ Lenses and Specimens 546
11.3.3 Lens Characteristics 550
11.4 * Simulations of High-Resolution TEM Images 557
11.4.1 Principles of Simulations 558
11.4.2 Practice of Simulations 563
11.5 Issues and Examples in High-Resolution TEM Imaging 564
11.5.1 Images of Nanostructures 564
11.5.2 Examples of Interfaces 567
11.5.3 * Specimen and Microscope Parameters 570
11.5.4 * Some Practical Issues for HRTEM 577
11.5.5 * Geometric Phase Analysis 580
11.6 Further Reading 584
11.7 Problems 584
12 High-Resolution STEM and Related Imaging Techniques 587
12.1 Characteristics of High-Angle Annular Dark-Field Imaging . . . . 587
12.2 Electron Channeling Along Atomic Columns 590
12.2.1 Optical Fiber Analogy 590
12.2.2 + Critical Angle 592
12.2.3 * Tunneling Between Columns 593
12.3 Scattering of Channeled Electrons 595
12.3.1 Elastic Scattering of Channeled Electrons 595
12.3.2 * Inelastic Scattering of Channeled Electrons 597
12.4 * Comparison of HAADF and HRTEM Imaging 598
12.5 HAADF Imaging with Atomic Resolution 599
12.5.1 * Effect of Defocus 599
12.5.2 Experimental Examples 601
12.6 * Lens Aberrations and Their Corrections 602
12.6.1 Cs Correction with Magnetic Hexapoles 602
12.6.2 $ Higher-Order Aberrations and Instabilities 605
12.7 Examples of Cs-Corrected Images 607
Contents xix
12.7.1 Three-Dimensional Imaging 608
12.7.2 High Resolution EELS 610
12.8 Electron Tomography 610
12.9 Further Reading 614
12.10 Problems 614
13 Dynamical Theory 617
13.1 Chapter Overview 617
13.2 ± * Mathematical Features of High-Energy Electrons
in a Periodic Potential 619
13.2.1 $ * The Schrodinger Equation 619
13.2.2 $ Kinematical and Dynamical Theory 625
13.2.3 * The Crystal as a Phase Grating 627
13.3 First Approach to Dynamical Theory--Beam Propagation . . . . 629
13.4 + Second Approach to Dynamical Theory--Bloch Waves
and Dispersion Surfaces 633
13.4.1 Diffracted Beams, {^g}, are Beats of Bloch Waves, 633
13.4.2 Crystal Periodicity and Dispersion Surfaces 639
13.4.3 Energies of Bloch Waves in a Periodic Potential 642
13.4.4 General Two-Beam Dynamical Theory 645
13.5 Essential Difference Between Kinematical and Dynamical
Theories 652
13.6 $ Diffraction Error, s g , in Two-Beam Dynamical Theory 655
13.6.1 Bloch Wave Amplitudes and Diffraction Error 655
13.6.2 Dispersion Surface Construction 658
13.7 Dynamical Diffraction Contrast from Crystal Defects 660
13.7.1 Dynamical Diffraction Contrast Without Absorption . . . 660
13.7.2 t * Two-Beam Dynamical Theory of Stacking Fault
Contrast 665
13.7.3 Dynamical Diffraction Contrast with Absorption 668
13.8 T* Multi-Beam Dynamical Theories of Electron Diffraction . . . 673
13.9 Further Reading 676
13.10 Problems 676
Appendix 681
A. 1 Indexed Powder Diffraction Patterns 681
A.2 Mass Attenuation Coefficients for Characteristic K a X-Rays . . . 681
A.3 Atomic Form Factors for X-Rays 683
A.4 X-Ray Dispersion Corrections for Anomalous Scattering 683
A.5 Atomic Form Factors for 200 keV Electrons and Procedure
for Conversion to Other Voltages 689
A.6 Indexed Single Crystal Diffraction Patterns: fee, bcc, dc, hep . . . 695
A.7 Stereographic Projections 705
A.8 Examples of Fourier Transforms 709
A.9 Debye-Waller Factor from Wave Amplitude 711
A.10 Time-Varying Potentials and Inelastic Neutron Scattering 712
x x Contents
A.11 Review of Dislocations 715
A.12 TEM Laboratory Exercises 721
A.12.1 Laboratory 1--Microscope Procedures and Calibration
with Au and M0O3 721
A.12.2 Laboratory 2--Diffraction Analysis of 0 Precipitates . . . 725
A.12.3 Laboratory 3--Chemical Analysis of 0 Precipitates . . . . 728
A.12.4 Laboratory 4--Contrast Analysis of Defects 729
A. 13 Fundamental and Derived Constants 730
Bibliography 735
Further Reading 735
References and Figures 739
Index 747
|
| any_adam_object | 1 |
| author | Fultz, Brent 1955- Howe, James M. 1955- |
| author_GND | (DE-588)122354796 (DE-588)122354818 |
| author_facet | Fultz, Brent 1955- Howe, James M. 1955- |
| author_role | aut aut |
| author_sort | Fultz, Brent 1955- |
| author_variant | b f bf j m h jm jmh |
| building | Verbundindex |
| bvnumber | BV040711318 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)823935795 (DE-599)DNB1021362131 |
| dewey-full | 530.411 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.411 |
| dewey-search | 530.411 |
| dewey-sort | 3530.411 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | Fourth edition |
| format | Book |
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| id | DE-604.BV040711318 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:32:15Z |
| institution | BVB |
| isbn | 9783642297601 3642297609 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025691653 |
| oclc_num | 823935795 |
| open_access_boolean | |
| owner | DE-703 DE-19 DE-BY-UBM DE-29T DE-355 DE-BY-UBR DE-20 DE-188 DE-384 |
| owner_facet | DE-703 DE-19 DE-BY-UBM DE-29T DE-355 DE-BY-UBR DE-20 DE-188 DE-384 |
| physical | xx, 761 Seiten Illustrationen, Diagramme |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Springer |
| record_format | marc |
| series2 | Graduate texts in physics |
| spelling | Fultz, Brent 1955- Verfasser (DE-588)122354796 aut Transmission electron microscopy and diffractometry of materials Brent Fultz, James Howe Fourth edition Berlin ; Heidelberg Springer 2013 xx, 761 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Graduate texts in physics Literaturangaben Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Röntgendiffraktometrie (DE-588)4336833-5 s DE-604 Howe, James M. 1955- Verfasser (DE-588)122354818 aut Erscheint auch als Online-Ausgabe, eBook 978-3-642-29761-8 B:DE-101 application/pdf http://d-nb.info/1021362131/04 Inhaltsverzeichnis HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025691653&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Fultz, Brent 1955- Howe, James M. 1955- Transmission electron microscopy and diffractometry of materials Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4336833-5 |
| title | Transmission electron microscopy and diffractometry of materials |
| title_auth | Transmission electron microscopy and diffractometry of materials |
| title_exact_search | Transmission electron microscopy and diffractometry of materials |
| title_full | Transmission electron microscopy and diffractometry of materials Brent Fultz, James Howe |
| title_fullStr | Transmission electron microscopy and diffractometry of materials Brent Fultz, James Howe |
| title_full_unstemmed | Transmission electron microscopy and diffractometry of materials Brent Fultz, James Howe |
| title_short | Transmission electron microscopy and diffractometry of materials |
| title_sort | transmission electron microscopy and diffractometry of materials |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie Röntgendiffraktometrie |
| url | http://d-nb.info/1021362131/04 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025691653&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT fultzbrent transmissionelectronmicroscopyanddiffractometryofmaterials AT howejamesm transmissionelectronmicroscopyanddiffractometryofmaterials |
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Inhaltsverzeichnis