Modern diffraction methods:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Weinheim
Wiley-VCH
2013
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| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXVI, 528 S. Ill., graph. Darst. |
| ISBN: | 9783527649884 9783527322794 |
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| 245 | 1 | 0 | |a Modern diffraction methods |c ed. by Eric J. Mittemeijer ... |
| 264 | 1 | |a Weinheim |b Wiley-VCH |c 2013 | |
| 300 | |a XXVI, 528 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| adam_text | IMAGE 1
CONTENTS
PREFACE XV ABOUT T H E EDITORS XXI LIST O F CONTRIBUTORS XXIII
PART I STRUCTURE DETERMINATION 1
1 STRUCTURE DETERMINATION O F SINGLE CRYSTALS 3
SANDER VAN SMAALEN
1.1 INTRODUCTION 3
1.2 THE ELECTRON DENSITY 5
1.3 DIFFRACTION A N D THE PHASE PROBLEM 8
1.4 FOURIER CYCLING AND DIFFERENCE FOURIER MAPS 10
1.5 STATISTICAL PROPERTIES O F DIFFRACTED INTENSITIES 11
1.6 THE PATTERSON FUNCTION 15
1.7 PATTERSON SEARCH METHODS 18
1.8 DIRECT METHODS 19
1.9 CHARGE FLIPPING AND LOW-DENSITY ELIMINATION 21
1.10 OUTLOOK A N D SUMMARY 24
REFERENCES 25
2 MODERN RIETVELD REFINEMENT, A PRACTICAL GUIDE 2 7
ROBERT DINNEBIER AND MELANIE MIILLER 2.1 THE PEAK INTENSITY 29
2.2 THE PEAK POSITION 30
2.3 THE PEAK PROFILE 31
2.4 THE BACKGROUND 38
2.5 THE MATHEMATICAL PROCEDURE 39
2.6 AGREEMENT FACTORS 3 9
2.7 GLOBAL OPTIMIZATION METHOD O F SIMULATED ANNEALING 4 1
2.8 RIGID BODIES 44
2.9 INTRODUCTION O F PENALTY FUNCTIONS 4 6
2.10 PARAMETRIC RIETVELD REFINEMENT 47
HTTP://D-NB.INFO/1022181122
IMAGE 2
V I I CONTENTS
2.10.1 PARAMETERIZATION O F THE SCALE FACTOR DEPENDING O N TIME FOR
KINETIC
ANALYSIS 49
2.10.2 PARAMETERIZATION O F THE LATTICE PARAMETERS DEPENDING O N
PRESSURE FOR DETERMINATION O F THE EQUATIONS O F STATE 5 0 2.10.3
PARAMETERIZATION O F SYMMETRY MODES DEPENDING O N TEMPERATURE FOR
DETERMINATION O F ORDER PARAMETERS 53
REFERENCES 5 8
3 STRUCTURE O F NANOPARTIDES FROM TOTAL SCATTERING 61
KATHARINE L. PAGE, THOMAS PROFFEN, AND REINHARD B. NEDER 3.1
INTRODUCTION 61
3.2 TOTAL SCATTERING EXPERIMENTS 64
3.2.1 USING X-RAYS 66
3.2.2 USING NEUTRONS 67
3.3 STRUCTURE MODELING A N D REFINEMENT 69
3.3.1 USING A PARTICLE FORM FACTOR 69
3.3.2 MODELING FINITE NANOPARTIDES 70
3.4 EXAMPLES 74
3.4.1 BATI0 3 74
3.4.2 CDSE/ZNS CORE-SHELL PARTICLES 78
3.5 OUTLOOK 82
REFERENCES 83
PART II ANALYSIS O F T H E MICROSTRUCTURE 87
4 DIFFRACTION LINE-PROFILE ANALYSIS 89
ERIC J. MITTEMEIJER AND UDO WELZEL 4.1 INTRODUCTION 89
4.2 INSTRUMENTAL BROADENING 90
4.2.1 DETERMINATION O F THE INSTRUMENTAL PROFILE USING A REFERENCE
(STANDARD) SPECIMEN 92 4.2.2 DETERMINATION O F THE INSTRUMENTAL PROFILE
BY CALCULUS 92 4.2.3 SUBTRACTION/INCORPORATION O F THE INSTRUMENTAL
BROADENING 93 4.3 STRUCTURAL, SPECIMEN BROADENING 94
4.3.1 MEASURES O F LINE BROADENING; FOURIER SERIES REPRESENTATION OF
DIFFRACTION LINES 94 4.3.2 COLUMN LENGTH/CRYSTALLITE SIZE A N D
COLUMN-LENGTH/CRYSTALLITE-SIZE DISTRIBUTION 96
4.3.3 MICROSTRAIN BROADENING 98
4.3.3.1 ASSUMPTIONS I N INTEGRAL-BREADTH METHODS 99 4.3.3.2 ASSUMPTIONS
I N FOURIER METHODS 100 4.3.3.3 MICROSTRAIN-BROADENING DESCRIPTIONS
DERIVED FROM A MICROSTRUCTURAL MODEL 101
4.3.4 ANISOTROPIC SIZE A N D MICROSTRAIN(-LIKE) DIFFRACTION-LINE
BROADENING 104
IMAGE 3
C O N T E N T S I VII
4.3.5 MACROSCOPIC ANISOTROPY 106
4.3.6 CRYSTALLITE SIZE A N D COHERENCY O F DIFFRACTION 106 4.4 PRACTICAL
APPLICATION O F LINE-PROFILE ANALYSIS 111 4.4.1 LINE-PROFILE
DECOMPOSITION 111 4.4.1.1 BREADTH METHODS 111
4.4.1.2 FOURIER METHODS 115
4.4.1.3 WHOLE POWDER-PATTERN FITTING 116 4.4.2 LINE-PROFILE SYNTHESIS
116
4.4.2.1 GENERAL STRAIN-FIELD METHOD 117 4.4.2.2 SPECIFIC MICROSTRUCTURAL
MODELS: WHOLE POWDER-PATTERN MODELING (WPPM) AND MULTIPLE WHOLE-PROFILE
MODELING/FITTING (MWP) 118 4.4.2.3 GENERAL ATOMISTIC STRUCTURE: THE
DEBYE SCATTERING FUNCTION 120
4.5 CONCLUSIONS 122
REFERENCES 123
5 RESIDUAL STRESS ANALYSIS BY X-RAY DIFFRACTION METHODS 127 CHRISTOPH
GENZEL, INGWER A. DENKS, AND MANUELA KLAUS 5.1 INTRODUCTION 127
5.2 PRINCIPLES O F NEAR-SURFACE X-RAY RESIDUAL STRESS ANALYSIS 129 5.2.1
FUNDAMENTAL RELATIONS 129
5.2.2 CONCEPTS O F DIFFRACTION DATA ACQUISITION: ANGLE-DISPERSIVE A N D
ENERGY-DISPERSIVE MODES 130 5.2.3 CONCEPTS O F STRAIN DEPTH PROFILING:
LAPLACE A N D REAL SPACE APPROACH 131 5.2.3.1 DEFINITION O F THE
INFORMATION DEPTH 131 5.2.3.2 DEPTH PROFILING IN THE LAPLACE SPACE 133
5.2.3.3 DEPTH PROFILING IN REAL SPACE 136 5.2.3.4 FIXED VERSUS
VARIABLE DEPTH METHODS 139 5.3 NEAR-SURFACE X-RAY RESIDUAL STRESS
ANALYSIS BY ADVANCED A N D COMPLEMENTARY METHODS 141
5.3.1 RESIDUAL STRESS DEPTH PROFILING I N MULTILAYERED COATING SYSTEMS
141 5.3.1.1 THE EQUIVALENCE THICKNESS CONCEPT 141 5.3.1.2 THE STRESS
SCANNING METHOD 144 5.3.2 RESIDUAL STRESS GRADIENT EVALUATION I N
SURFACE-TREATED BULK
SAMPLES 147
5.3.2.1 FIXED DEPTH ANALYSIS I N THE REAL SPACE: DIRECT ACCESS TO R(Z)
147 5.3.2.2 RESIDUAL STRESS EVALUATION I N THE LAPLACE SPACE: F R O M
ER(R) T O TX(Z) 149 5.4 FINAL REMARKS 151
REFERENCES 153
6 STRESS ANALYSIS BY NEUTRON DIFFRACTION 155
LOTHAR PINTSCHOVIUS AND MICHAEL HOJMANN 6.1 INTRODUCTORY REMARKS 155
IMAGE 4
VIII CONTENTS
6.2 FUNDAMENTALS O F THE TECHNIQUE 155
6.2.1 THE DO-PROBLEM 156
6.2.2 MACROSTRAINS VERSUS MICROSTRAINS 157
6.2.3 STRAIN TENSORS 158
6.2.4 REFLECTION LINE BROADENINGS 158
6.3 INSTRUMENTATION 159
6.3.1 ANGLE-DISPERSIVE INSTRUMENTS 159
6.3.1.1 MONOCHROMATORS 159
6.3.1.2 BEAM-DEFINING OPTICS 160 6.3.1.3 DETECTORS 161
6.3.1.4 AUXILLIARIES 162
6.3.2 TIME-OF-FLIGHT INSTRUMENTS 162
6.3.3 SPECIAL INSTRUMENTS 164
6.4 CAPABILITIES 164
6.4.1 TYPES O F MATERIALS
6.4.2 SPATIAL RESOLUTION
6.4.3 PENETRATION DEPTH
6.4.4 ACCURACY 166
6.4.5 THROUGHPUT 166
6.5 EXAMPLES 166
6.5.1 RAILWAY RAIL 166
6.5.2 WELDMENTS 167
6.5.3 CERAMICS 168
6.5.4 COMPOSITE MATERIALS 170
REFERENCES 170
7 TEXTURE ANALYSIS BY ADVANCED DIFFRACTION METHODS 173
HANS-RUDOLF WENK
7.1 INTRODUCTION A N D BACKGROUND 173
7.2 SYNCHROTRON X-RAYS 177
7.2.1 GENERAL APPROACH 177
7.2.2 HARD SYNCHROTRON X-RAYS 178
7.2.3 IN SITU HIGH-PRESSURE EXPERIMENTS 180
1.2.4 FROM DIFFRACTION IMAGES TO ORIENTATION DISTRIBUTION 183 7.2.5
OPPORTUNITIES WITH THE LAUE TECHNIQUE 188
7.2.6 SYNCHROTRON APPLICATIONS 188
7.3 NEUTRON DIFFRACTION 190
7.3.1 GENERAL COMMENTS 190
7.3.2 MONOCHROMATIC NEUTRONS 193
7.3.3 POLYCHROMATIC TIME-OF-FLIGHT (TOF) NEUTRONS 194 7.3.4 SPECIAL
TECHNIQUES 197
7.3.5 DATA ANALYSIS FOR TOF NEUTRONS 198
7.3.6 NEUTRON APPLICATIONS 202
7.3.6.1 GRAIN STATISTICS 202
7.3.6.2 POLYMINERALIC ROCKS 202
164 164 165
IMAGE 5
CONTENTS IX
7.3.6.3 IN SITU EXPERIMENTS A N D PHASE TRANSFORMATIONS 203
7.3.6.4 MAGNETIC TEXTURES 204
7.4 ELECTRON DIFFRACTION 204
7.4.1 TRANSMISSION ELECTRON MICROSCOPE 204 7.4.2 SCANNING ELECTRON
MICROSCOPE (SEM) 205 7.4.3 EBSD APPLICATIONS 209
7.4.3.1 MISORIENTATIONS 209
7.4.3.2 IN SITU HEATING 209
7.4.3.3 IN SITU DEFORMATION 210
7.4.3.4 3D MAPPING 211
7.4.3.5 RESIDUAL STRAIN ANALYSIS 211 7.5 COMPARISON O F METHODS 212
7.6 CONCLUSIONS 213
ACKNOWLEDGMENTS 214 REFERENCES 214
8 SURFACE-SENSITIVE X-RAY DIFFRACTION METHODS 221 ANDREAS STIERLE AND
ELIAS VLIEG 8.1 INTRODUCTION 221
8.1.1 STRUCTURE DETERMINATION BY X-RAY DIFFRACTION 223 8.2 X-RAY
REFLECTIVITY 224
8.3 BRAGG SCATTERING I N REDUCED DIMENSIONS (CRYSTAL TRUNCATION ROD
SCATTERING) 227 8.3.1 THIN-FILM DIFFRACTION 227
8.3.2 SURFACE DIFFRACTION F R O M HALF-INFINITE SYSTEMS 230 8.3.2.1
SURFACE RELAXATIONS 232
8.3.2.2 SURFACE RECONSTRUCTIONS A N D FOURIER METHODS 234 8.3.2.3
SURFACE ROUGHNESS 237
8.3.2.4 VICINAL SURFACES 239
8.3.2.5 TWO-LAYER ROUGHNESS MODEL FOR GROWTH STUDIES 240 8.3.2.6
INTERFACE DIFFRACTION 245
8.3.2.7 THE SPECULAR ROD 247
8.4 GRAZING INCIDENCE X-RAY DIFFRACTION 249
8.5 EXPERIMENTAL GEOMETRIES 252
8.6 TRENDS 254
ACKNOWLEDGMENTS 255 REFERENCES 255
9 THE MICRO- AND NANOSTRUCTURE O F IMPERFECT OXIDE EPITAXIAL FILMS 259
ALEXANDRE BOULLE, FLORINE CONCHON, AND RENE GUINEBRETIERE 9.1 THE
DIFFRACTED AMPLITUDE A N D INTENSITY 260
9.1.1 DIFFRACTED AMPLITUDE 260
9.1.2 DIFFRACTED INTENSITY 261
9.2 THE CORRELATION VOLUME 262
9.2.1 CRYSTALLITE SIZE A N D SHAPE 262
IMAGE 6
X I CONTENTS
9.2.2 CRYSTALLITE SIZE FLUCTUATIONS 265
9.2.3 CRYSTALLITE SHAPE FLUCTUATIONS 267
9.3 LATTICE STRAIN 269
9.3.1 STATISTICAL PROPERTIES 269
9.3.2 SPATIAL PROPERTIES 272
9.4 EXAMPLE 274
9.5 STRAIN GRADIENTS 277
9.5.1 BACKGROUND 277
9.5.2 STRAIN PROFILE RETRIEVAL 277
9.5.3 EXAMPLE 278
9.6 CONCLUSIONS 279
REFERENCES 281
PART III PHASE ANALYSIS AND PHASE TRANSFORMATIONS 283
10 QUANTITATIVE PHASE ANALYSIS USING T H E RIETVELD METHOD 285 IAN C.
MADSEN, NICOLA V.Y. SCARLETT, DANIEL P. RILEY, AND MARK D. RAVEN 10.1
INTRODUCTION 285
10.2 MATHEMATICAL BASIS 286
10.2.1 RIETVELD-BASED METHODS 286 10.2.2 IMPROVING ACCURACY 290
10.2.3 CORRELATION WITH THERMAL PARAMETERS 292 10.3 APPLICATIONS IN
MINERALS A N D MATERIALS RESEARCH 295 10.3.1 CRYSTALLIZATION FROM
HYDROTHERMAL SOLUTIONS 295 10.3.2 ENERGY-DISPERSIVE DIFFRACTION 298
10.3.2.1 APPLICATION O F EDD TO THE STUDY O F INERT ANODES FOR LIGHT
METAL PRODUCTION 301 10.3.3 QUANTITATIVE PHASE ANALYSIS IN MINERAL
EXPLORATION 304 10.3.3.1 PARTICLE STATISTICS 306
10.3.3.2 PREFERRED ORIENTATION 306 10.3.3.3 MICROABSORPTION 306 10.3.3.4
IDENTIFICATION O F MINERAL TYPES A N D POLYTYPES 307 10.3.3.5 ELEMENT
SUBSTITUTION A N D SOLID SOLUTION 307 10.3.3.6 SEVERE PEAK OVERLAP 308
10.3.3.7 POORLY CRYSTALLINE COMPONENTS 309 10.3.3.8 CLAY A N D
DISORDERED STRUCTURES 309 10.3.4 THE REYNOLDS CUP 310
10.3.5 USE O F QPA-DERIVED KINETICS I N THE DESIGN O F NOVEL MATERIALS
312 10.3.5.1 METHODOLOGIES FOR SYNTHESIS OPTIMIZATION USING QPA 312
10.3.5.2 DESIGN A N D SYNTHESIS OPTIMIZATION O F NOVEL MATERIALS: M
+1AX
PHASES 312
10.3.5.3 IN SITU DIFFERENTIAL THERMAL ANALYSIS (DTA) USING QPA 316 10.4
SUMMARY 318
IMAGE 7
CONTENTS | XI
ACKNOWLEDGMENTS 318
REFERENCES 318
11 KINETICS O F PHASE TRANSFORMATIONS AND O F OTHER TIME-DEPENDENT
PROCESSES IN SOLIDS ANALYZED BY POWDER DIFFRACTION 321 ANDREAS
LEINEWEBER AND ERIC J. MITTEMEIJER 11.1 INTRODUCTION 321
11.2 KINETIC CONCEPTS 323
11.2.1 PROCESS RATES 323
11.2.2 THE TEMPERATURE DEPENDENCE O F THE PROCESS RATE 327 11.2.2.1
ARRHENIUS-TYPE TEMPERATURE DEPENDENCE O F THE RATE CONSTANT K(T) 327
11.2.2.2 NON-ARRHENIUS-TYPE PROCESS KINETICS 328 11.2.3 RATE LAWS FOR
ISOTHERMALLY CONDUCTED PROCESSES 330 11.2.3.1 MTH-ORDER KINETICS O F
HOMOGENEOUS PROCESSES 330 11.2.3.2 JOHNSON-MEHL-AVRAMI-KOLMOGOROV
KINETICS O F HETEROGENEOUS PHASE
TRANSFORMATIONS 331 11.2.3.3 GRAIN GROWTH A N D OSTWALD RIPENING 332
11.2.3.4 VOLUME-DIFFUSION-CONTROLLED PROCESSES 333 11.2.3.5
ORDER-DISORDER-RELATED PROCESSES 333 11.2.4 RATE LAWS FOR
NONISOTHERMALLY CONDUCTED PROCESSES 336
11.3 TRACING THE PROCESS KINETICS BY POWDER DIFFRACTION 337 11.4 MODE O
F MEASUREMENT: IN SITU VERSUS EX SITU METHODS 339
11.5 TYPES O F KINETIC PROCESSES A N D EXAMPLES 342
11.5.1 LOCAL COMPOSITION IN SOLID IS RETAINED 342 11.5.1.1
RECONSTRUCTIVE, POLYMORPHIC TRANSFORMATIONS A - * FT 342 11.5.1.2
POLYMORPHIC TRANSFORMATIONS O F ORDER-DISORDER CHARACTER A N D RELATED
PROCESSES 346
11.5.1.3 POLYMORPHIC TRANSFORMATIONS O F POLYTYPIC CHARACTER 347
11.5.1.4 GRAIN GROWTH 349
11.5.2 LOCAL CONCENTRATION VARIATIONS WITHIN ISOLATED SOLID SYSTEMS 350
11.5.2.1 PRECIPITATION PROCESSES 350 11.5.2.2 SOLID-STATE REACTION
BETWEEN DIFFERENT PHASES 351 11.5.3 COMPOSITION CHANGES IN SOLIDS BY
REACTION WITH FLUID MATTER 352
11.6 CONCLUDING REMARKS 354
REFERENCES 354
PART IV DIFFRACTION METHODS AND INSTRUMENTATION 359
12 LABORATORY INSTRUMENTATION FOR X-RAY POWDER DIFFRACTION: DEVELOPMENTS
AND EXAMPLES 361 UDO WELZEL AND ERIC J. MITTEMEIJER 12.1 INTRODUCTION:
HISTORICAL SKETCH 361
12.2 LABORATORY X-RAY POWDER DIFFRACTION: INSTRUMENTATION 365 12.2.1
OVERVIEW 365
IMAGE 8
X I I I CONTENTS
12.2.2 LABORATORY X-RAY SOURCES; MONOCHROMATIZATION 365
12.2.2.1 X-RAY SOURCES 365 12.2.2.2 MONOCHROMATIZATION/FILTERING 368
12.2.3 DEBYE-SCHERRER (-HULL) GEOMETRY 370 12.2.4 MONOCHROMATIC PINHOLE
TECHNIQUES 371 12.2.5 (PARA-)FOCUSING GEOMETRIES 371
12.2.5.1 S E E M A N N - B O H L I N GEOMETRY 372 12.2.5.2
BRAGG-BRENTANO GEOMETRY 373 12.2.6 INSTRUMENTAL ABERRATIONS O F
(PARA-)FOCUSING GEOMETRIES 376 12.2.7 PARALLEL-BEAM GEOMETRY 377
12.2.7.1 POLYCAPILLARY COLLIMATORS 378 12.2.7.2 X-RAY MIRRORS 379
12.2.7.3 X-RAY MIRRORS VERSUS X-RAY LENSES; COMPARATIVE DISCUSSION 381
12.2.7.4 INSTRUMENTAL ABERRATIONS O F PARALLEL-BEAM GEOMETRY 383 12.2.8
FURTHER, RECENT DEVELOPMENTS 384 12.2.8.1 TWO-DIMENSIONAL DETECTORS 384
12.2.8.2 MICRODIFFRACTION 387 12.2.8.3 ENERGY-DISPERSIVE DIFFRACTION 388
12.3 EXAMPLES 388
12.3.1 PARALLEL-BEAM DIFFRACTION METHODS 388 12.3.1.1 H I G H
BRILLIANCE, PARALLEL-BEAM LABORATORY X-RAY SOURCE 388 12.3.1.2
APPLICATIONS 389
12.3.2 TWO-DIMENSIONAL DIFFRACTION METHODS 391 ACKNOWLEDGMENTS 394
REFERENCES 394
13 THE CALIBRATION O F LABORATORY X-RAY DIFFRACTION EQUIPMENT USING NIST
STANDARD REFERENCE MATERIALS 399 JAMES P. CLINE, DAVID BLACK, DONALD
WINDOVER, AND ALBERT HENINS 13.1 INTRODUCTION 399
13.2 T H E INSTRUMENT PROFILE FUNCTION 400
13.3 SRMS, INSTRUMENTATION, A N D DATA COLLECTION PROCEDURES 411 13.4
DATA ANALYSIS METHODS 418
13.5 INSTRUMENT QUALIFICATION A N D VALIDATION 423
13.6 CONCLUSIONS 436
REFERENCES 437
14 SYNCHROTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES
439 GENE E. ICE 14.1 INTRODUCTION 439
14.2 THE UNDERLYING PHYSICS O F SYNCHROTRON SOURCES 441 14.2.1 STORAGE
RING SOURCES 441
14.2.2 FREE-ELECTRON LASERS A N D OTHER EMERGING X-RAY SOURCES 445 14.3
DIFFRACTION APPLICATIONS EXPLOITING HIGH SOURCE BRILLIANCE 445
IMAGE 9
CONTENTS | XIII
14.3.1 MICRODIFFRACTION 446
14.3.1.1 MICRODIFFRACTION EXAMPLE 1: STRESS-DRIVEN SN WHISKER GROWTH 449
14.3.1.2 MICRODIFFRACTION EXAMPLE 2: DAMAGE I N ION-IMPLANTED SI 451
14.3.1.3 OTHER MICRODIFFRACTION APPLICATIONS 452
14.3.2 SURFACE A N D INTERFACE DIFFRACTION 452 14.3.2.1 SURFACE
DIFFRACTION EXAMPLE 1: TRUNCATION ROD SCATTERING (TRS) 453 14.3.2.2
SURFACE DIFFRACTION EXAMPLE 2: SURFACE STUDIES O F PHASE TRANSFORMATIONS
IN LANGMUIR-BLODGETT FILMS 455
14.4 HIGH Q-RESOLUTION MEASUREMENTS 456
14.5 APPLICATIONS O F TUNABILITY: RESONANT SCATTERING 456 14.5.1
RESONANT SCATTERING EXAMPLE 1: MULTIPLE ANOMALOUS DIFFRACTION, MAD 458
14.5.2 RESONANT SCATTERING EXAMPLE 2: 3A. DETERMINATION O F LOCAL
SHORT-RANGE CORRELATION I N BINARY ALLOYS 461 14.5.3 RESONANT SCATTERING
EXAMPLE 3: DETERMINATION O F MAGNETIC STRUCTURE AND CORRELATION LENGTHS
464
14.6 FUTURE: ULTRAFAST SCIENCE A N D COHERENCE 465
14.6.1 COHERENT DIFFRACTION 466
14.6.2 ULTRAFAST DIFFRACTION 466
REFERENCES 467
15 HIGH-ENERGY ELECTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND
EXAMPLES 469 CHRISTOPH T. KOCH 15.1 INTRODUCTION 469
15.2 INSTRUMENTATION 470
15.2.1 FUNDAMENTALS 470
15.2.2 DIFFRACTION MODES I N A TEM 472
15.2.3 FEMTOSECOND ELECTRON DIFFRACTION 474 15.3 ELECTRON DIFFRACTION
METHODS IN THE TEM 474
15.3.1 PRECESSION ELECTRON DIFFRACTION (PED) 474 15.3.2 QUANTITATIVE
CONVERGENT-BEAM ELECTRON DIFFRACTION (QCBED) 476 15.3.3 LARGE-ANGLE
CONVERGENT-BEAM ELECTRON DIFFRACTION (LACBED) 477 15.3.4 LARGE-ANGLE
ROCKING-BEAM ELECTRON DIFFRACTION (LARBED) 478 15.3.5 DIFFRACTION
TOMOGRAPHY 482
15.3.6 REAL-SPACE CRYSTALLOGRAPHY 482 15.3.7 COHERENT DIFFRACTIVE
IMAGING (CDI) WITH ELECTRONS 483 15.3.8 MAPPING STRAIN BY ELECTRON
DIFFRACTION 485 15.4 SUMMARY A N D OUTLOOK 486
ACKNOWLEDGMENT 486 REFERENCES 486
IMAGE 10
X I V | CONTENTS
16 IN SITU DIFFRACTION MEASUREMENTS: CHALLENGES, INSTRUMENTATION, AND
EXAMPLES 491 HELMUT EHRENBERG, ANATOLIY SENYSHYN, MANUEL HINTERSTEIN,
AND HARTMUT FUESS 16.1 INTRODUCTION 491
16.2 INSTRUMENTATION AND EXPERIMENTAL CHALLENGES 492
16.2.1 GENERAL CONSIDERATIONS 492
16.2.2 ABSORPTION 493
16.2.3 DETECTION CHALLENGES 494
16.3 EXAMPLES 497
16.3.1 ELECTROCHEMICAL IN SITU STUDIES O F ELECTRODE MATERIALS A N D IN
OPERANDO INVESTIGATIONS O F LI-ION BATTERIES 4 9 7 16.3.2 IN SITU
STUDIES O F PIEZOCERAMICS I N ELECTRIC FIELDS 502 ACKNOWLEDGMENT 515
REFERENCES 515
INDEX 519
|
| any_adam_object | 1 |
| author2 | Mittemeijer, Eric J. 1950- |
| author2_role | edt |
| author2_variant | e j m ej ejm |
| author_GND | (DE-588)144008998 |
| author_facet | Mittemeijer, Eric J. 1950- |
| building | Verbundindex |
| bvnumber | BV040506674 |
| classification_rvk | UQ 5000 VE 9350 ZM 6000 |
| classification_tum | PHY 605f |
| ctrlnum | (OCoLC)819425367 (DE-599)BSZ324438583 |
| dewey-full | 548.83 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548.83 |
| dewey-search | 548.83 |
| dewey-sort | 3548.83 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV040506674 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:25:19Z |
| institution | BVB |
| isbn | 9783527649884 9783527322794 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025353297 |
| oclc_num | 819425367 |
| open_access_boolean | |
| owner | DE-11 DE-19 DE-BY-UBM DE-703 DE-92 DE-91G DE-BY-TUM DE-355 DE-BY-UBR |
| owner_facet | DE-11 DE-19 DE-BY-UBM DE-703 DE-92 DE-91G DE-BY-TUM DE-355 DE-BY-UBR |
| physical | XXVI, 528 S. Ill., graph. Darst. |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Wiley-VCH |
| record_format | marc |
| spelling | Modern diffraction methods ed. by Eric J. Mittemeijer ... Weinheim Wiley-VCH 2013 XXVI, 528 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Kristallstrukturanalyse (DE-588)4137204-9 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Kristallstrukturanalyse (DE-588)4137204-9 s Beugung (DE-588)4145094-2 s DE-604 Mittemeijer, Eric J. 1950- (DE-588)144008998 edt Erscheint auch als Online-Ausgabe, EPUB 978-3-527-64990-7 Erscheint auch als Online-Ausgabe, MOBI 978-3-527-64989-1 Erscheint auch als Online-Ausgabe, PDF 978-3-527-64991-4 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025353297&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Modern diffraction methods Kristallstrukturanalyse (DE-588)4137204-9 gnd Beugung (DE-588)4145094-2 gnd |
| subject_GND | (DE-588)4137204-9 (DE-588)4145094-2 (DE-588)4143413-4 |
| title | Modern diffraction methods |
| title_auth | Modern diffraction methods |
| title_exact_search | Modern diffraction methods |
| title_full | Modern diffraction methods ed. by Eric J. Mittemeijer ... |
| title_fullStr | Modern diffraction methods ed. by Eric J. Mittemeijer ... |
| title_full_unstemmed | Modern diffraction methods ed. by Eric J. Mittemeijer ... |
| title_short | Modern diffraction methods |
| title_sort | modern diffraction methods |
| topic | Kristallstrukturanalyse (DE-588)4137204-9 gnd Beugung (DE-588)4145094-2 gnd |
| topic_facet | Kristallstrukturanalyse Beugung Aufsatzsammlung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025353297&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT mittemeijerericj moderndiffractionmethods |