In-situ electron microscopy: applications in physics, chemistry and materials science
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| Format: | Buch |
| Sprache: | English |
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Weinheim
Wiley-VCH
2012
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| Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
| Beschreibung: | XVIII, 383 S. Ill., graph. Darst. |
| ISBN: | 9783527319732 9783527652167 |
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| 245 | 1 | 0 | |a In-situ electron microscopy |b applications in physics, chemistry and materials science |c ed. by Gerhard Dehm ... |
| 264 | 1 | |a Weinheim |b Wiley-VCH |c 2012 | |
| 300 | |a XVIII, 383 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 700 | 1 | |a Dehm, Gerhard |4 edt | |
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| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-025198697 | |
Datensatz im Suchindex
| _version_ | 1807953286128467968 |
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IMAGE 1
CONTENTS
LIST O F CONTRIBUTORS X I I I PREFACE X V I I
PART I BASICS AND METHODS 1
1 INTRODUCTION TO SCANNING ELECTRON MICROSCOPY 3
CHRISTINA SCHEU AND WAYNE D. KAPLAN 1.1 COMPONENTS O F THE SCANNING
ELECTRON MICROSCOPE 4
1.1.1 ELECTRON GUNS 6
1.1.2 ELECTROMAGNETIC LENSES 9 1.1.3 DEFLECTION SYSTEM 13
1.1.4 ELECTRON DETECTORS 13
1.1.4.1 EVERHART-THORNLEY DETECTOR 13 1.1.4.2 SCINTILLATOR DETECTOR 15
1.1.4.3 SOLID-STATE DETECTOR 16 1.1.4.4 IN-LENS OR THROUGH-THE-LENS
DETECTORS 16
1.2 ELECTRON-MATTER INTERACTION 16
1.2.1 BACKSCATTERED ELECTRONS (BSES) 20 1.2.2 SECONDARY ELECTRONS (SES)
22 1.2.3 AUGER ELECTRONS (AES) 25
1.2.4 EMISSION O F PHOTONS 25
1.2.4.1 EMISSION O F X-RAYS 25 1.2.4.2 EMISSION O F VISIBLE LIGHT 26
1.2.5 INTERACTION VOLUME AND RESOLUTION 26
1.2.5.1 SECONDARY ELECTRONS 27 1.2.5.2 BACKSCATTERED ELECTRONS 27
1.2.5.3 X-RAYS 27
1.3 CONTRAST MECHANISMS 28
1.3.1 TOPOGRAPHIC CONTRAST 28
1.3.2 COMPOSITION CONTRAST 31
1.3.3 CHANNELING CONTRAST 31
HTTP://D-NB.INFO/101777482X
IMAGE 2
.4
.5 .6 .7
. 1
. 1 . 1
.1.2
.1.3
.2 .3 .4
.5 .6 .6.1
.7 .7.1 .7.2 .8
.9
.1
.2
.2.1
.2.2
.2.3 .2.4 .3 .3.1 .3.2 .4 .5 .5.1 .5.2 .6 .6.1
.6.2
.6.3
ELECTRON BACKSCATTERED DIFFRACTION (EBSD) 31 DISPERSIVE X-RAY
SPECTROSCOPY 34 OTHER SIGNALS 36 SUMMARY 36
REFERENCES 37
CONVENTIONAL AND ADVANCED ELECTRON TRANSMISSION MICROSCOPY 39 CHRISTOPH
KOCH INTRODUCTION 39
INTRODUCTORY REMARKS 39 INSTRUMENTATION AND BASIC ELECTRON OPTICS 40
THEORY O F ELECTRON-SPECIMEN INTERACTION 42 HIGH-RESOLUTION TRANSMISSION
ELECTRON MICROSCOPY 48
CONVENTIONAL TEM O F DEFECTS IN CRYSTALS 54 LORENTZ MICROSCOPY 55
OFF-AXIS AND INLINE ELECTRON HOLOGRAPHY 57 ELECTRON DIFFRACTION
TECHNIQUES 59
FUNDAMENTALS O F ELECTRON DIFFRACTION 59 CONVERGENT BEAM ELECTRON
DIFFRACTION 61 LARGE-ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION 63
CHARACTERIZATION O F AMORPHOUS STRUCTURES BY DIFFRACTION 63
SCANNING TRANSMISSION ELECTRON MICROSCOPY AND Z-CONTRAST 63 ANALYTICAL
TEM 66 REFERENCES 67
DYNAMIC TRANSMISSION ELECTRON MICROSCOPY 71 THOMAS LACRANGE, BRYAN W.
REED, WAYNE E. KING,
JUDY S. KIM, AND GEOFFREY H. CAMPBELL
INTRODUCTION 71
HOW DOES SINGLE-SHOT DTEM WORK? 72 CURRENT PERFORMANCE 74 ELECTRON
SOURCES AND OPTICS 75 ARBITRARY WAVEFORM GENERATION LASER SYSTEM 80
ACQUIRING HIGH TIME RESOLUTION MOVIES 81 EXPERIMENTAL APPLICATIONS O F
DTEM 82 DIFFUSIONLESS FIRST-ORDER PHASE TRANSFORMATIONS 82 OBSERVING
TRANSIENT PHENOMENA IN REACTIVE MULTILAYER FOILS 85
CRYSTALLIZATION UNDER FAR-FROM-EQUILIBRIUM CONDITIONS 88 SPACE CHARGE
EFFECTS IN SINGLE-SHOT DTEM 90 GLOBAL SPACE CHARGE 90 STOCHASTIC
BLURRING 91
NEXT-GENERATION DTEM 91 NOVEL ELECTRON SOURCES 91 RELATIVISTIC BEAMS 92
PULSE COMPRESSION 93
IMAGE 3
3.6.4 ABERRATION CORRECTION 93
3.7 CONCLUSIONS 94
REFERENCES 95
4 FORMATION O F SURFACE PATTERNS OBSERVED WITH REFLECTION ELECTRON
MICROSCOPY 99 ALEXANDER V. LATYSHEV
4.1 INTRODUCTION 99
4.2 REFLECTION ELECTRON MICROSCOPY 102
4.3 SILICON SUBSTRATE PREPARATION 107
4.4 MONATOMIC STEPS 109
4.5 STEP BUNCHING 111
4.6 SURFACE RECONSTRUCTIONS 114
4.7 EPITAXIAL GROWTH 115
4.8 THERMAL OXYGEN ETCHING 116
4.9 CONCLUSIONS 119
REFERENCES 119
PART II GROWTH AND INTERACTIONS 123
5 ELECTRON AND ION IRRADIATION 125
FLORIAN BANHART
5.1 INTRODUCTION 125
5.2 THE PHYSICS O F IRRADIATION 126
5.2.1 SCATTERING O F ENERGETIC PARTICLES IN SOLIDS 126 5.2.2 SCATTERING
O F ELECTRONS 128 5.2.3 SCATTERING O F IONS 129
5.3 RADIATION DEFECTS I N SOLIDS 129
5.3.1 THE FORMATION O F DEFECTS 129
5.3.2 THE MIGRATION O F DEFECTS 130
5.4 THE SETUP I N THE ELECTRON MICROSCOPE 131
5.4.1 ELECTRON IRRADIATION 131
5.4.2 ION IRRADIATION 132
5.5 EXPERIMENTS 132
5.5.1 ELECTRON IRRADIATION 133
5.5.2 ION IRRADIATION 140
5.6 OUTLOOK 141
REFERENCES 142
6 OBSERVING CHEMICAL REACTIONS USING TRANSMISSION ELECTRON MICROSCOPY
145 RENU SHARMA
6.1 INTRODUCTION 145
6.2 INSTRUMENTATION 146
6.3 TYPES O F CHEMICAL REACTION SUITABLE FOR TEM OBSERVATION 150
IMAGE 4
6.3.1 OXIDATION AND REDUCTION (REDOX) REACTIONS 150
6.3.2 PHASE TRANSFORMATIONS 151 6.3.3 POLYMERIZATION 151
6.3.4 NITRIDATION 152
6.3.5 HYDROXYLATION AND DEHYDROXYLATION 152 6.3.6 NUCLEATION AND GROWTH
O F NANOSTRUCTURES 153 6.4 EXPERIMENTAL SETUP 154
6.4.1 REACTION O F AMBIENT ENVIRONMENT WITH VARIOUS TEM COMPONENTS 154
6.4.2 REACTION O F GRID/SUPPORT MATERIALS WITH THE SAMPLE OR W I T H
EACH OTHER 154 6.4.3 TEMPERATURE AND PRESSURE CONSIDERATIONS 155 6.4.4
SELECTING APPROPRIATE CHARACTERIZATION TECHNIQUE(S) 156
6.4.5 RECORDING MEDIA 156
6.4.6 INDEPENDENT VERIFICATION O F THE RESULTS, AND THE EFFECTS O F THE
ELECTRON BEAM 157 6.5 AVAILABLE INFORMATION UNDER REACTION CONDITIONS
157 6.5.1 STRUCTURAL MODIFICATION 158
6.5.1.1 ELECTRON DIFFRACTION 158 6.5.1.2 HIGH-RESOLUTION IMAGING 158
6.5.2 CHEMICAL CHANGES 161
6.5.3 REACTION RATES (KINETICS) 164 6.6 LIMITATIONS AND FUTURE
DEVELOPMENTS 164 REFERENCES 165
7 IN-SITU TEM STUDIES O F VAPOR- AND LIQUID-PHASE CRYSTAL GROWTH 171
FRANCES M. ROSS 7.1 INTRODUCTION 171
7.2 EXPERIMENTAL CONSIDERATIONS 172 7.2.1 WHAT CRYSTAL GROWTH
EXPERIMENTS ARE POSSIBLE? 172 7.2.2 H O W CAN THESE EXPERIMENTS BE MADE
QUANTITATIVE? 173 7.2.3 H O W RELEVANT CAN THESE EXPERIMENTS BE? 175
7.3 VAPOR-PHASE GROWTH PROCESSES 175 7.3.1 QUANTUM DOT GROWTH KINETICS
176 7.3.2 VAPOR-LIQUID-SOLID GROWTH O F NANOWIRES 177 7.3.3 NUCLEATION
KINETICS I N NANOSTRUCTURES 180 7.4 LIQUID-PHASE GROWTH PROCESSES 183
7.4.1 OBSERVING LIQUID SAMPLES USING TEM 183 7.4.2 ELECTROCHEMICAL
NUCLEATION AND GROWTH I N THE TEM SYSTEM 184 7.5 SUMMARY 187
REFERENCES 188
8 IN-SITU TEM STUDIES O F OXIDATION 191
CUANGWEN ZHOU AND JUDITH C. YANG 8.1 INTRODUCTION 191
8.2 EXPERIMENTAL APPROACH 192
IMAGE 5
8.2.1 ENVIRONMENTAL CELLS 192
8.2.2 SURFACE AND ENVIRONMENTAL CONDITIONS 193 8.2.3 GAS-HANDLING SYSTEM
394 8.2.4 LIMITATIONS 195
8.3 OXIDATION PHENOMENA 196
8.3.1 SURFACE RECONSTRUCTION 196 8.3.2 NUCLEATION AND INITIAL OXIDE
GROWTH 197 8.3.3 ROLE O F SURFACE DEFECTS ON SURFACE OXIDATION 198 8.3.4
SHAPE TRANSITION DURING OXIDE GROWTH I N ALLOY OXIDATION J99
8.3.5 EFFECT O F OXYGEN PRESSURE ON THE ORIENTATIONS O F OXIDE NUCLEI
202 8.3.6 OXIDATION PATHWAYS REVEALED BY HIGH-RESOLUTION TEM STUDIES
O F OXIDATION 203
8.4 FUTURE DEVELOPMENTS 205
8.5 SUMMARY 206
REFERENCES 206
PART III MECHANICAL PROPERTIES 209
9 MECHANICAL TESTING WITH THE SCANNING ELECTRON MICROSCOPE 211
CHRISTIAN MOTZ
9.1 INTRODUCTION 211
9.2 TECHNICAL REQUIREMENTS AND SPECIMEN PREPARATION 212 9.3 IN-SITU
LOADING O F MACROSCOPIC SAMPLES 214 9.3.1 STATIC LOADING I N TENSION,
COMPRESSION, AND BENDING 214 9.3.2 DYNAMIC LOADING I N TENSION,
COMPRESSION, AND BENDING 216
9.3.3 APPLICATIONS O F IN-SITU TESTING 216 9.4 IN-SITU LOADING O F
MICRON-SIZED SAMPLES 217 9.4.1 STATIC LOADING O F MICRON-SIZED SAMPLES I
N TENSION, COMPRESSION,
AND BENDING 218
9.4.2 APPLICATIONS O F IN-SITU TESTING O F SMALL-SCALE SAMPLES 220 9.4.3
IN-SITU MICROINDENTATION AND NANOINDENTATION 222 9.5 SUMMARY AND OUTLOOK
223
REFERENCES 223
10 IN-SITU TEM STRAINING EXPERIMENTS: RECENT PROGRESS IN STAGES
AND SMALL-SCALE MECHANICS 227 GERHARD DEHM, MARC LEGROS, AND DANIEL
KIENER
10.1 INTRODUCTION 227
10.2 AVAILABLE STRAINING TECHNIQUES 228 10.2.1 THERMAL STRAINING 228
10.2.2 MECHANICAL STRAINING 229 10.2.3 INSTRUMENTED STAGES AND MEMS/NEMS
DEVICES 230 10.3 DISLOCATION MECHANISMS I N THERMALLY STRAINED METALLIC
FILMS 233
10.3.1 BASIC CONCEPTS 233 10.3.2 DISLOCATION MOTION I N SINGLE
CRYSTALLINE FILMS AND NEAR INTERFACES 235
IMAGE 6
10.3.3 DISLOCATION NUCLEATION AND MULTIPLICATION I N THIN FILMS 236
10.3.4 DIFFUSION-INDUCED DISLOCATION PLASTICITY I N POLYCRYSTALLINE CU
FILMS 239
10.4 SIZE-DEPENDENT DISLOCATION PLASTICITY I N METALS 239 10.4.1
PLASTICITY I N GEOMETRICALLY CONFINED SINGLE CRYSTAL FEE METALS 241
10.4.2 SIZE-DEPENDENT TRANSITIONS I N DISLOCATION PLASTICITY 243 10.4.3
PLASTICITY BY MOTION O F GRAIN BOUNDARIES 244 10.4.4 INFLUENCE O F GRAIN
SIZE HETEROGENEITIES 245 10.5 CONCLUSIONS AND FUTURE DIRECTIONS 247
REFERENCES 248
11 IN-SITU NANOINDENTATION IN THE TRANSMISSION ELECTRON MICROSCOPE 255
ANDREW M. MINOR 11.1 INTRODUCTION 255
11.1.1 THE EVOLUTION O F LN-SITU MECHANICAL PROBING IN A TEM 255 11.1.2
INTRODUCTION TO NANOINDENTATION 256 11.2 EXPERIMENTAL METHODOLOGY 260
11.3 EXAMPLE STUDIES 263
11.3.1 IN-SITU TEM NANOINDENTATION O F SILICON 263 11.3.2 IN-SITU TEM
NANOINDENTATION O F A1 T H I N FILMS 269 11.4 CONCLUSIONS 272
REFERENCES 274
PART IV PHYSICAL PROPERTIES 279
12 CURRENT-INDUCED TRANSPORT: ELECTROMIGRATION 281 RALPH SPOLENAK 12.1
PRINCIPLES 281
12.2 TRANSMISSION ELECTRON MICROSCOPY 283 12.2.1 IMAGING 283
12.2.2 DIFFRACTION 288
12.2.3 CONVERGENT BEAM ELECTRON DIFFRACTION (CBED): MEASUREMENTS O F
ELASTIC STRAIN 288 12.3 SECONDARY ELECTRON MICROSCOPY 289 12.3.1 IMAGING
289
12.3.2 ELEMENTAL ANALYSIS 291
12.3.3 ELECTRON BACKSCATTER DIFFRACTION (EBSD) 292 12.4 X-RADIOGRAPHY
STUDIES 292
12.4.1 MICROSCOPY AND TOMOGRAPHY 292 12.4.2 SPECTROSCOPY 293 12.4.3
TOPOGRAPHY 294
12.4.4 MICRODIFFRACTION 294
12.5 SPECIALIZED TECHNIQUES 295 12.5.1 FOCUSED ION BEAMS 295
IMAGE 7
12.5.2 REFLECTIVE HIGH-ENERGY ELECTRON DIFFRACTION (RHEED) 296
12.5.3 SCANNING PROBE METHODS 296 12.6 COMPARISON O F IN-SITU METHODS
297
REFERENCES 299
13 CATHODOLUMINESCENCE IN SCANNING AND TRANSMISSION ELECTRON
MICROSCOPIES 303 YUTAKA OHNO AND SEIJI TAKEDA 13.1 INTRODUCTION 303
13.2 PRINCIPLES O F CATHODOLUMINSECENCE 304 13.2.1 THE GENERATION AND
RECOMBINATION O F ELECTRON-HOLE PAIRS 304 13.2.2 CHARACTERISTIC O F CL
SPECTROSCOPY 305 13.2.3 CL IMAGING AND CONTRAST ANALYSIS 306
13.2.4 SPATIAL RESOLUTION O F CL IMAGING AND SPECTROSCOPY 306 13.2.5 CL
DETECTION SYSTEMS 307 13.3 APPLICATIONS O F CL I N SCANNING AND
TRANSMISSION ELECTRON
MICROSCOPIES 307
13.3.1 ASSESSMENTS O F GROUP III-V COMPOUNDS 308 13.3.1.1 NITRIDES 308
13.3.1.2 111-V COMPOUNDS EXCEPT NITRIDES 309
13.3.2 GROUP II-VI COMPOUNDS AND RELATED MATERIALS 310 13.3.2.1 OXIDES
310 13.3.2.2 GROUP I I - V I COMPOUNDS, EXCEPT OXIDES 312 13.3.3 GROUP
IV AND RELATED MATERIALS 313
13.4 CONCLUDING REMARKS 313
REFERENCES 313
14 IN-SITU TEM WITH ELECTRICAL BIAS ON FERROELECTRIC OXIDES 321 XIAOLI
TAN 14.1 INTRODUCTION 321
14.2 EXPERIMENTAL DETAILS 323
14.3 DOMAIN POLARIZATION SWITCHING 324 14.4 GRAIN BOUNDARY CAVITATION
326
14.5 DOMAIN WALL FRACTURE 331
14.6 ANTIFERROELECTRIC-TO-FERROELECTRIC PHASE TRANSITION 335 14.7
RELAXOR-TO-FERROELECTRIC PHASE TRANSITION 341 REFERENCES 345
15 LORENTZ MICROSCOPY 347
JOSEF ZWECK
15.1 INTRODUCTION 347
15.2 THE IN-SITU CREATION O F MAGNETIC FIELDS 350 15.2.1 COMBINING THE
OBJECTIVE LENS FIELD WITH SPECIMEN TILT 351 15.2.2 MAGNETIZING STAGES
USING COILS AND POLE-PIECES 352 15.2.3 MAGNETIZING STAGES WITHOUT COILS
356
IMAGE 8
I
15.2.3.1 OERSTED FIELDS 356
15.2.3.2 SPIN TORQUE APPLICATIONS 358 15.2.3.3 SELF-DRIVEN DEVICES 361
15.3 EXAMPLES 362
15.3.1 DEMAGNETIZATION AND MAGNETIZATION O F RING STRUCTURES 362
15.3.2 DETERMINATION O F WALL VELOCITIES 364 15.3.3 DETERMINATION O F
STRAY FIELDS 365 15.4 PROBLEMS 366
15.5 CONCLUSIONS 367
REFERENCES 367
INDEX 371 |
| any_adam_object | 1 |
| author2 | Dehm, Gerhard |
| author2_role | edt |
| author2_variant | g d gd |
| author_facet | Dehm, Gerhard |
| building | Verbundindex |
| bvnumber | BV040344514 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)890998601 (DE-599)DNB101777482X |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
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| id | DE-604.BV040344514 |
| illustrated | Illustrated |
| indexdate | 2024-08-21T00:03:33Z |
| institution | BVB |
| isbn | 9783527319732 9783527652167 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025198697 |
| oclc_num | 890998601 |
| open_access_boolean | |
| owner | DE-703 DE-29T DE-83 DE-20 DE-19 DE-BY-UBM |
| owner_facet | DE-703 DE-29T DE-83 DE-20 DE-19 DE-BY-UBM |
| physical | XVIII, 383 S. Ill., graph. Darst. |
| publishDate | 2012 |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| publisher | Wiley-VCH |
| record_format | marc |
| spelling | In-situ electron microscopy applications in physics, chemistry and materials science ed. by Gerhard Dehm ... Weinheim Wiley-VCH 2012 XVIII, 383 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf In situ (DE-588)4293230-0 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s In situ (DE-588)4293230-0 s DE-604 Dehm, Gerhard edt Erscheint auch als Online-Ausgabe, EPUB 978-3-527-65218-1 Erscheint auch als Online-Ausgabe, MOBI 978-3-527-65217-4 Erscheint auch als Online-Ausgabe, PDF 978-3-527-65219-8 X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=3932604&prov=M&dok_var=1&dok_ext=htm Inhaltstext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025198697&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | In-situ electron microscopy applications in physics, chemistry and materials science Elektronenmikroskopie (DE-588)4014327-2 gnd In situ (DE-588)4293230-0 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4293230-0 |
| title | In-situ electron microscopy applications in physics, chemistry and materials science |
| title_auth | In-situ electron microscopy applications in physics, chemistry and materials science |
| title_exact_search | In-situ electron microscopy applications in physics, chemistry and materials science |
| title_full | In-situ electron microscopy applications in physics, chemistry and materials science ed. by Gerhard Dehm ... |
| title_fullStr | In-situ electron microscopy applications in physics, chemistry and materials science ed. by Gerhard Dehm ... |
| title_full_unstemmed | In-situ electron microscopy applications in physics, chemistry and materials science ed. by Gerhard Dehm ... |
| title_short | In-situ electron microscopy |
| title_sort | in situ electron microscopy applications in physics chemistry and materials science |
| title_sub | applications in physics, chemistry and materials science |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd In situ (DE-588)4293230-0 gnd |
| topic_facet | Elektronenmikroskopie In situ |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=3932604&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025198697&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT dehmgerhard insituelectronmicroscopyapplicationsinphysicschemistryandmaterialsscience |