Advanced computing in electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Springer
2010
|
| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Beschreibung: | X, 289 S. Ill., graph. Darst. 235 mm x 155 mm |
| ISBN: | 9781441965325 |
Internformat
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Datensatz im Suchindex
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| author | Kirkland, Earl J. |
| author_facet | Kirkland, Earl J. |
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| building | Verbundindex |
| bvnumber | BV040292516 |
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| discipline | Physik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV040292516 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:20:56Z |
| institution | BVB |
| isbn | 9781441965325 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025147674 |
| oclc_num | 699837194 |
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| physical | X, 289 S. Ill., graph. Darst. 235 mm x 155 mm |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Springer |
| record_format | marc |
| spelling | Kirkland, Earl J. Verfasser aut Advanced computing in electron microscopy Earl J. Kirkland 2. ed. New York, NY [u.a.] Springer 2010 X, 289 S. Ill., graph. Darst. 235 mm x 155 mm txt rdacontent n rdamedia nc rdacarrier Text engl. Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s DE-604 |
| spellingShingle | Kirkland, Earl J. Advanced computing in electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Computersimulation (DE-588)4148259-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4148259-1 |
| title | Advanced computing in electron microscopy |
| title_auth | Advanced computing in electron microscopy |
| title_exact_search | Advanced computing in electron microscopy |
| title_full | Advanced computing in electron microscopy Earl J. Kirkland |
| title_fullStr | Advanced computing in electron microscopy Earl J. Kirkland |
| title_full_unstemmed | Advanced computing in electron microscopy Earl J. Kirkland |
| title_short | Advanced computing in electron microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Computersimulation (DE-588)4148259-1 gnd |
| topic_facet | Elektronenmikroskopie Computersimulation |
| work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |