Atom probe microscopy:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Springer
2012
|
| Schriftenreihe: | Springer series in materials science
160 |
| Schlagworte: | |
| Beschreibung: | XXIII, 396 S. Ill., graph. Darst. |
| ISBN: | 9781461434351 1461434351 |
Internformat
MARC
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| 020 | |a 9781461434351 |9 978-1-4614-3435-1 | ||
| 020 | |a 1461434351 |9 1-4614-3435-1 | ||
| 035 | |a (OCoLC)807591876 | ||
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| 300 | |a XXIII, 396 S. |b Ill., graph. Darst. | ||
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-025127747 | ||
Datensatz im Suchindex
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| building | Verbundindex |
| bvnumber | BV040272189 |
| classification_rvk | UH 6330 UQ 1100 |
| ctrlnum | (OCoLC)807591876 (DE-599)HBZHT017256652 |
| dewey-full | 502.82 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.82 |
| dewey-search | 502.82 |
| dewey-sort | 3502.82 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
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| id | DE-604.BV040272189 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:20:28Z |
| institution | BVB |
| isbn | 9781461434351 1461434351 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025127747 |
| oclc_num | 807591876 |
| open_access_boolean | |
| owner | DE-11 DE-29T |
| owner_facet | DE-11 DE-29T |
| physical | XXIII, 396 S. Ill., graph. Darst. |
| publishDate | 2012 |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in materials science |
| series2 | Springer series in materials science |
| spelling | Atom probe microscopy Baptiste Gault ... New York, NY [u.a.] Springer 2012 XXIII, 396 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in materials science 160 Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 s DE-604 Gault, Baptiste Sonstige oth Springer series in materials science 160 (DE-604)BV000683335 160 |
| spellingShingle | Atom probe microscopy Springer series in materials science Feldionenmikroskopie (DE-588)4153929-1 gnd |
| subject_GND | (DE-588)4153929-1 |
| title | Atom probe microscopy |
| title_auth | Atom probe microscopy |
| title_exact_search | Atom probe microscopy |
| title_full | Atom probe microscopy Baptiste Gault ... |
| title_fullStr | Atom probe microscopy Baptiste Gault ... |
| title_full_unstemmed | Atom probe microscopy Baptiste Gault ... |
| title_short | Atom probe microscopy |
| title_sort | atom probe microscopy |
| topic | Feldionenmikroskopie (DE-588)4153929-1 gnd |
| topic_facet | Feldionenmikroskopie |
| volume_link | (DE-604)BV000683335 |
| work_keys_str_mv | AT gaultbaptiste atomprobemicroscopy |