Characterization of nanostructures:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton, Fla. [u.a.]
CRC Press
2013
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIX, 314 S. Ill., graph. Darst. |
| ISBN: | 9781439854150 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV040235223 | ||
| 003 | DE-604 | ||
| 005 | 20140702 | ||
| 007 | t | ||
| 008 | 120605s2013 ad|| |||| 00||| eng d | ||
| 010 | |a 2012001213 | ||
| 020 | |a 9781439854150 |c alk. paper |9 978-1-439-85415-0 | ||
| 035 | |a (OCoLC)796266566 | ||
| 035 | |a (DE-599)GBV687655455 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-20 |a DE-11 |a DE-29T |a DE-19 | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a VE 9850 |0 (DE-625)147163:253 |2 rvk | ||
| 084 | |a VG 8900 |0 (DE-625)147231:253 |2 rvk | ||
| 084 | |a ZN 3700 |0 (DE-625)157333: |2 rvk | ||
| 100 | 1 | |a Myhra, Sverre |d 1943- |e Verfasser |0 (DE-588)1044197781 |4 aut | |
| 245 | 1 | 0 | |a Characterization of nanostructures |c Sverre Myhra ; John C. Rivière |
| 264 | 1 | |a Boca Raton, Fla. [u.a.] |b CRC Press |c 2013 | |
| 300 | |a XIX, 314 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Nanostrukturiertes Material |0 (DE-588)4342626-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Nanostrukturiertes Material |0 (DE-588)4342626-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Rivière, John C. |e Verfasser |0 (DE-588)1044198737 |4 aut | |
| 856 | 4 | 2 | |m HBZ Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025091545&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-025091545 | ||
Datensatz im Suchindex
| _version_ | 1804149224502198272 |
|---|---|
| adam_text | CONTENTS
PREFACE....................................................................................................................XIII
ACKNOWLEDGEMENTS............................
XVII
THE
AUTHORS............................................................................................................XIX
CHAPTER
1
INTRODUCTION
TO
CHARACTERIZATION
OF
NANOSTRUCTURES............................1
1.1
NANOTECHNOLOGY*IN
THE
BEGINNING
THERE
WAS
THE
IDEA.........1
1.2
NANOTECHNOLOGY
AS
A
PRACTICAL
PROPOSITION...............................1
1.3
WHAT
IS
NANOTECHNOLOGY?.........................................................2
1.3.1
NANOTECHNOLOGY*TOP-DOWN.......................................3
1.3.2
NANOTECHNOLOGY*BOTTOM-UP.....................................4
1.3.3
NANOTECHNOLOGY*A
SOCIO-ECONOMIC
DEFINITION........6
1.4
MATERIALS
CHARACTERIZATION*WHAT
IS
IT?..................................7
1.4.1
STRATEGY
VERSUS
TACTICS
OF
MATERIALS
CHARACTERIZATION...........................................................8
1.4.1.1
MESO-VERSUS
NANO-SCALE..............................9
1.4.1.2
DIMENSIONALITY
AND
SIZE
REGIMES
OF
MESO/NANOSTRUCTURES....................................9
1.4.1.3
DIMENSIONALITY............................................10
1.4.2
MACRO-/MICRO-SCALE
VERSUS
NANO-SCALE
MATERIALS
CHARACTERIZATION.........................................11
1.5
CURRENT
STATE
OF
*BEST
PRACTICE*
AND
QA.................................12
REFERENCES
AND
USEFUL
READING.........................................................12
BIBILIOGRAPHY......................................................................................13
SECTION
I
TECHNIQUES
AND
METHODS
CHAPTER
2
ELECTRON-OPTICAL
IMAGING
OF
NANOSTRUCTURES
((HR)TEM,
STEM,
AND
SEM)...............................................................................17
2.1
INTRODUCTION.............................................................................17
2.2
TEM
OVERVIEW........................................................................18
2.2.1
MAGNETIC
LENSES
AND
ABERRATIONS..............................19
2.2.2
SPHERICAL
ABERRATION..................................................21
2.2.3
CHROMATIC
ABERRATION................................................21
2.2.4
RESOLUTION
IN
THE
PRESENCE
OF
ABERRATIONS.................21
2.3
INTERACTIONS
OF
ELECTRONS
WITH
MATTER......................................23
2.3.1
HIGH-RESOLUTION
IMAGE
FORMATION.............................23
2.4
ABERRATION
CORRECTION.............................................................27
V
VI
CONTENTS
2.5
SCANNING
TRANSMISSION
ELECTRON
MICROSCOPY
(STEM)...........27
2.5.1
TECHNICAL
IMPLEMENTATION
..........................................29
2.5.2
DIFFRACTION
INFORMATION
FROM
STEM.........................30
2.6
THE
ISSUE
OF
RADIATION
DAMAGE
DURING
IMAGING
AND
ANALYSIS............................................................................31
2.7
SEM.........................................................................................32
2.7.1
TECHNICAL
OVERVIEW....................................................32
2.7.2
COLD-CATHODE
FIELD
EMISSION....................................32
2.7.3
POINT-TO-POINT
RESOLUTION...........................................33
2.7.4
DEPTH
OF
FIELD.............................................................34
2.7.5
IMAGING
MODES...........................................................35
2.7.5.1
SECONDARY
ELECTRON
IMAGING......................35
2.8
EXAMPLES
OF
SEM
PERFORMANCE...........................................36
2.9
OPTIMIZATION
OF
IMAGE
QUALITY...............................................37
2.9.1
INSULATING
MATERIALS...................................................37
ACKNOWLEDGEMENTS............................................................................37
APPENDIX:
DEFINITIONS
OF
ACRONYMS
USED
WIDELY
FOR
DESCRIPTION
OF
ELECTRON
MICROSCOPY
(IN
ALPHABETICAL
ORDER).................................................................39
REFERENCES..........................................................................................39
CHAPTER
3
ELECTRON-OPTICAL
ANALYTICAL
TECHNIQUES............................................41
3.1
INTRODUCTION.............................................................................41
3.2
LOSS
PROCESSES.........................................................................41
3.2.1
EDS
SPECTRAL
NOTATION...............................................42
3.2.2
EDS
SPECTRA...............................................................43
3.2.2.1
FLUORESCENCE
YIELD
(CO)...............................45
3.3
EELS.......................................................................................45
3.3.1
EELS
SPECTRAL
FEATURES.............................................45
3.4
TECHNICAL
IMPLEMENTATION
AND
METHODS.................................47
3.4.1
EDS............................................................................47
3.4.1.1
QUANTIFICATION
OF
EDS
SPECTRA...................49
3.4.2
EELS..........................................................................50
3.5
COMPLEMENTARITY
OF
EDS
AND
EELS:
A
CASE
STUDY...............51
ACKNOWLEDGEMENTS............................................................................60
REFERENCES..........................................................................................60
CHAPTER
4
PHOTON-OPTICAL
SPECTROSCOPY*RAMAN
AND
FLUORESCENCE................61
4.1
INTRODUCTION.............................................................................61
4.2
RAMAN
SPECTROSCOPY...............................................................61
4.2.1
PHYSICAL
PRINCIPLES.....................................................61
4.2.2
A
FORMAL
CLASSICAL
DESCRIPTION
OF
THE
RAMAN
PROCESS...........................................................63
CONTENTS
VII
4.2.3
SERS*
SURFACE
ENHANCED
RAMAN
SPECTROSCOPY......64
4.2.4
TERS*TIP
ENHANCED
RAMAN
SPECTROSCOPY............65
4.2.5
TECHNICAL
IMPLEMENTATION
AND
ANALYTICAL
METHODS......................................................................65
4.3
FLUORESCENCE
SPECTROSCOPY.....................................................66
4.3.1
TECHNICAL
IMPLEMENTATION
AND
OPERATIONAL
MODES.........................................................................67
4.3.2
FLUORESCENCE
SPECTROSCOPY*BIOMOLECULAR
APPLICATIONS................................................................69
4.3.3
SPECTROSCOPIC
ANALYSIS
OF
QUANTUM
DOTS.................70
4.3.4
CARBON-BASED
NANOSTRUCTURES
AND
RAMAN
SPECTROSCOPY..............................................................70
ACKNOWLEDGEMENTS............................................................................74
REFERENCES..........................................................................................74
CHAPTER
5
SCANNING
PROBE
TECHNIQUES
AND
METHODS.........................................77
5.1
INTRODUCTION.............................................................................77
5.1.1
ESSENTIAL
ELEMENTS
OF
SPM........................................77
5.1.1.1
COST-EFFECTIVENESS......................................78
5.1.1.2
PLATFORM
FLEXIBILITY.....................................78
5.1.1.3
AMBIENT
TOLERANCE......................................80
5.1.1.4
USER-FRIENDLINESS........................................80
5.1.1.5
EASE
OF
INTERPRETATION.................................80
5.1.1.6
UNIQUE
CAPABILITIES.....................................81
5.2
TECHNICAL
IMPLEMENTATION.......................................................81
5.2.1
SPATIAL
POSITIONING
AND
CONTROL..................................81
5.2.2
THE
FEEDBACK
CONTROL
ELECTRONICS.............................83
5.2.3
THE
PROBE...................................................................86
5.2.3.1
STM............................................................86
5.2.3.2
SFM............................................................87
5.2.3.3
SFM
PROBE
CALIBRATION...............................88
5.3
STM/STS.................................................................................90
5.3.1
PHYSICAL
PRINCIPLES*BRIEF
THEORY............................90
5.3.2
OPERATIONAL
MODES*STM........................................94
5.3.2.1
IMAGING
AT
CONSTANT
TUNNEL
CURRENT..........94
5.3.2.2
IMAGING
AT
CONSTANT
HEIGHT........................94
5.3.2.3
ERROR
SIGNAL
MAPPING.................................94
5.3.2.4
I-V
SPECTROSCOPY.........................................94
5.4
SFM.........................................................................................95
5.4.1
PHYSICAL
PRINCIPLES.....................................................96
5.4.2
SFM
OPERATIONAL
MODES............................................97
5.4.2.1
AC
MODES*NON-CONTACT
AND
INTERMITTENT
CONTACT
(TAPPING)...................97
5.4.2.2
LFM
AND
FRICTION
LOOP
ANALYSIS.............100
5.4.2.3
F-D
ANALYSIS..............................................101
VIII
CONTENTS
5.5
SCM.......................................................................................110
5.5.1
PRINCIPLES
AND
IMPLEMENTATION.................................110
5.5.2
CAPACITANCE
MAPPING...............................................110
5.5.3
MAPPING
DIFFERENTIAL
CAPACITANCE...........................112
5.6
SNOM....................................................................................113
5.6.1
PHYSICAL
PRINCIPLES...................................................113
5.6.2
TECHNICAL
DETAILS......................................................115
5.6.2.1
SHEAR-FORCE
DETECTION..............................115
5.6.2.2
OPTICAL
FIBRE
PROBE...................................115
5.6.3
OPERATIONAL
MODES...................................................115
5.6.3.1
TRANSMISSION
IMAGING..............................117
5.6.3.2
FLUORESCENCE.............................................117
5.6.3.3
NEAR-FIELD
RAMAN
SPECTROSCOPY
AND
MAPPING....................................................118
5.6.4
TIP-ENHANCED
RAMAN
SPECTROSCOPY
(TERS)
..........118
5.6.4.1
TECHNICAL
IMPLEMENTATION
OF
TERS
.........119
5.7
SECM....................................................................................119
5.7.1
PHYSICAL
PRINCIPLES...................................................120
5.7.2
TECHNICAL
DETAILS
AND
APPLICATIONS.........................120
5.8
SCANNING
KELVIN
PROBE
(SKP)...............................................122
5.8.1
EFFECTS
OF
ELECTROSTATIC
INTERACTION...........................122
5.9
SCANNING
ION
CURRENT
MICROSCOPY
(SICM)...........................126
5.10
FUTURE
PROSPECTS....................................................................127
5.10.1
INCREASED
SPATIAL
RESOLUTION
FOR
SFM......................127
5.10.2
SINGLE
ATOM
CHEMICAL
IDENTIFICATION
BY
AFM........128
5.10.3
FASTER
SCAN
RATES.....................................................130
5.10.4
GREATER
INTEGRATION
AND
SPECIALISATION.....................130
APPENDIX:
METHODS
FOR
CALIBRATION
OF
NORMAL
FORCE
CONSTANT,
K
N
...........................................................................131
REFERENCES........................................................................................132
CHAPTER
6
TECHNIQUES
AND
METHODS
FOR
NANOSCALE
ANALYSIS
OF
SINGLE
PARTICLES
AND
ENSEMBLES
OF
PARTICLES................................................135
6.1
INTRODUCTION...........................................................................135
6.1.1
PARTICLE
SIZE..............................................................136
6.2
PHOTON-CORRELATION
SPECTROSCOPY
(PCS)
OR
DYNAMIC
LIGHT
SCATTERING
(DLS)..................................
138
6.2.1
THEORY......................................................................139
6.2.3
MIE
THEORY
OF
SCATTERING.........................................144
6.2.4
DLS
INSTRUMENTATION................................................145
6.3
DIFFERENTIAL
CENTRIFUGAL
SEDIMENTATION
(DCS).....................147
6.3.1
THE
BASICS
OF
DIFFERENTIAL
SEDIMENTATION................147
6.3.2
DCS
INSTRUMENT
DESIGN...........................................148
6.4
ZETA
POTENTIAL.........................................................................151
6.5
DIFFERENTIAL
MOBILITY
SPECTROMETRY
(DMS)..........................152
CONTENTS
IX
6.6
SURFACE
AREA
DETERMINATION.................................................152
6.6.1
ADSORPTION
AND
DESORPTION
AT
SURFACES...................154
6.6.2
SURFACE
AREA
MEASUREMENT
BY
THE
BET
METHOD.....158
6.6.3
BET
PARTICLE
ANALYSIS
AND
THE
EQUIVALENT
SPHERE.......................................................................161
6.7
SURFACE
AND
BULK
CHEMISTRY.................................................161
6.7.1
SINGLE
PARTICLE
ANALYSIS............................................161
6.7.2
SURFACE
CHEMISTRY
OF
PARTICLE
ENSEMBLES................162
6.7.3
WETTABILITY................................................................163
6.8
OVERVIEW*CHOICE
OF
TECHNIQUE(S)......................................164
ACKNOWLEDGEMENTS..........................................................................165
REFERENCES........................................................................................166
SECTION
II
APPLICATIONS
CHAPTER
7
C
60
AND
OTHER
CAGE
STRUCTURES.........................................................171
7.1
INTRODUCTION...........................................................................171
7.1.1
EULER*S
THEOREM.......................................................171
7.1.2
THE
FULLERENE
FAMILY...............................................172
7.2
CHARACTERIZATION
OF
FULLERENES
AND
FULLERENE
COMPOUNDS............................................................................174
7.2.1
CHARACTERIZATION
OF
NON-INTERACTING
C
60
AND
OF
C
W60
MOLECULES....................................................174
7.3
ENDOHEDRAL
FULLERENES...........................................................176
7.4
FULLERITES................................................................................181
7.5
PEAPOD*FULLERENES
IN
CNT.................................................185
REFERENCES........................................................................................189
CHAPTER
8
QUANTUM
DOTS
AND
RELATED
STRUCTURES.............................................191
8.1
INTRODUCTION...........................................................................191
8.2
PARTICLES
IN
2-D
AND
3-D
CONFINEMENT..................................192
8.3
SYNTHESIS
ROUTES
FOR
QUANTUM
DOTS......................................197
8.3.1
COLLOIDAL
NUCLEATION
AND
GROWTH.............................199
8.3.2
QUANTUM
DOTS*LITHOGRAPHIC
METHODS..................200
8.3.3
SELF-ASSEMBLED
QUANTUM
DOTS
ON
A
PLANAR
SUBSTRATE...................................................................200
8.4
CHARACTERIZATION
OF
QUANTUM
DOTS.......................................200
8.4.1
STRUCTURE,
TOPOGRAPHY,
AND
ANALYTICAL
INFORMATION...............................................................200
8.4.2
X-RAY
DIFFRACTION
AND
SCATTERING
METHODS
FOR
ENSEMBLES*XRD,
SAXS,
AND
WAXS....................202
8.4.2.1
CHARACTERIZATION
BY
XRD.........................202
K
CONTENTS
8.4.2.2
SMALL-ANGLE
X-RAY
SCATTERING
(SAXS)
OF
QUANTUM
DOTS.........................203
8.5
ABSORPTION
AND
PHOTOLUMINESCENCE
SPECTROSCOPY
OF
QUANTUM
DOTS.......................................................................205
8.5.1
PHOTOLUMINESCENCE
OF
SINGLE
QUANTUM
DOTS...........208
REFERENCES........................................................................................213
CHAPTER
9
CARBON
NANOTUBES
AND
OTHER
TBBE
STRUCTURES................................215
9.1
INTRODUCTION...........................................................................215
9.2
DESCRIPTION
OF
CNT
STRUCTURE...............................................215
9.3
SYNTHESIS
ROUTES....................................................................218
9.3.1
ARC-DISCHARGE
AND
LASER
ABLATION..*.....................218
9.3.2
CHEMICAL
VAPOUR
DEPOSITION
(CVD).......................218
9.3.2
PURIFICATION
OF
RAW
PRODUCT
FROM
SYNTHESIS
ROUTES.......................................................219
9.4
ELECTRONIC
STRUCTURE
OF
GRAPHENE
AND
SWCNT....................219
9.4.1
ELECTRONIC
BAND
STRUCTURE
OF
GRAPHENE...................220
9.4.2
ELECTRONIC
STRUCTURE
OF
SWCNTS.............................221
9.5
GENERAL
CHARACTERISTICS
OF
CNTS...........................................223
9.6
OTHER
TUBE
STRUCTURES............................................................223
9.7
CHARACTERIZATION
OF
NANOTUBES..............................................225
9.7.1
TOPOGRAPHICAL
AND
STRUCTURAL
CHARACTERIZATION.......226
9.7.1.1
CNT..........................................................226
9.7.1.2
OTHER
TUBE
STRUCTURES...............................231
9.7.2
ANALYSIS
OF
NANOTUBES
BY
SPM................................234
9.7.3
RAMAN
SPECTROSCOPY
OF
CNTS.................................238
9.7.4
CHARACTERIZATION
OF
ELECTRONIC
STRUCTURE.................245
9.7.4.1
EELS.........................................................245
9.7.4.2
LUMINESCENCE
SPECTROSCOPY....................245
REFERENCES........................................................................................250
CHAPTER
10
NANOWIRES.........................................................................................253
10.1
INTRODUCTION...........................................................................253
10.2
SYNTHESIS
ROUTES....................................................................253
10.2.1
OVERVIEW
OF
THE
VLS
PROCESS..................................253
10.2.2
THE
TEMPLATE
PROCESS...............................................256
10.3
CHARACTERIZATION
OF
NANOWIRES
BY
SEM
AND
TEM...............258
10.4
CHARACTERIZATION
OF
NANOWIRE
HETEROSTRUCTURES....................259
10.5
CHARACTERIZATION
RELATED
TO
POTENTIAL
APPLICATIONS..............259
REFERENCES........................................................................................269
CHAPTER
11
GRAPHENE
AND
OTHER
MONOLAYER
STRUCTURES......................................271
11.1
INTRODUCTION...........................................................................271
11.2
GRAPHENE
STRUCTURE................................................................271
CONTENTS
XI
11.3
SUMMARY
OF
ELECTRONIC
STRUCTURE.........................................273
11.4
OTHER
2-D
STRUCTURES
(NANOSHEETS).......................................273
11.5
OVERVIEW
OF
SYNTHESIS
ROUTES...............................................275
11.5.1
MECHANICAL
EXFOLIATION............................................275
11.5.2
LIQUID
PHASE
EXFOLIATION..........................................275
11.5.3
EPITAXIAL
GROWTH......................................................276
11.5.4
NUCLEATION
AND
GROWTH
OF
GRAPHENE
ON
SIC............276
11.5.5
CATALYST
PROMOTED
NUCLEATION
AND
GROWTH
OF
GRAPHENE..................................................................276
11.6
STRUCTURAL
CHARACTERIZATION...................................................277
11.7
RAMAN
SPECTROSCOPIC
CHARACTERIZATION................................281
11.8
CHARACTERIZATION
OF
ELECTRONIC
STRUCTURE...............................282
REFERENCES........................................................................................286
CHAPTER
12
NANOSTRUCTURES*STRATEGIC
AND
TACTICAL
ISSUES................................289
12.1
THINKING
ABOUT
STRATEGY........................................................289
12.2
THINKING
ABOUT
TACTICS..........................................................289
12.3
STRATEGIC
ISSUES......................................................................290
12.3.1
OTHER
NANOSTRUCTURES...............................................290
12.3.2
CHARACTERIZATION
OF
NANOSTRUCTURE
ENSEMBLES.........291
12.4
PREPARATION
OF
SPECIMENS
FOR
CHARACTERIZATION
OF
NANOSTRUCTURES.......................................................................292
12.5
ENSEMBLE
AVERAGES:
LIMITATIONS...........................................295
12.6
*SOFT*
MATERIALS*SPECIMEN
PREPARATION..............................295
12.7
CLEANLINESS............................................................................295
12.8
USER-FRIENDLINESS....................................................................296
12.9
COST-EFFECTIVENESS.................................................................297
ACKNOWLEDGEMENTS..........................................................................298
APPENDIX
A:
PREPARATION
OF
CROSS-SECTIONAL
SPECIMENS
BY
THE
FOCUSSED
ION
BEAM
(FIB)
METHOD.........................................299
GENERAL
DESCRIPTION...............................................................299
TYPICAL
INSTRUMENT.................................................................299
SPECIMEN
PREPARATION
BY
FIB
METHODS.................................299
ADVANTAGES...............................................................299
DISADVANTAGES...........................................................301
DETAILS
OF
FIB
METHODS............................................302
APPENDIX
B:
(CRYO)MICROTOMY
AND
OTHER
METHODS
FOR
SPECIMEN
PREPARATION
OF
SOFT
MATERIALS
(E.G.,
POLYMERS
AND
BIOMATERIALS)....................................................................................303
GENERAL
OVERVIEW..................................................................303
TYPICAL
INSTRUMENT.................................................................304
REFERENCES........................................................................................305
INDEX
307
|
| any_adam_object | 1 |
| author | Myhra, Sverre 1943- Rivière, John C. |
| author_GND | (DE-588)1044197781 (DE-588)1044198737 |
| author_facet | Myhra, Sverre 1943- Rivière, John C. |
| author_role | aut aut |
| author_sort | Myhra, Sverre 1943- |
| author_variant | s m sm j c r jc jcr |
| building | Verbundindex |
| bvnumber | BV040235223 |
| classification_rvk | UH 6300 VE 9850 VG 8900 ZN 3700 |
| ctrlnum | (OCoLC)796266566 (DE-599)GBV687655455 |
| discipline | Chemie / Pharmazie Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01500nam a2200373 c 4500</leader><controlfield tag="001">BV040235223</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20140702 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">120605s2013 ad|| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2012001213</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781439854150</subfield><subfield code="c">alk. paper</subfield><subfield code="9">978-1-439-85415-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)796266566</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBV687655455</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-20</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VE 9850</subfield><subfield code="0">(DE-625)147163:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 8900</subfield><subfield code="0">(DE-625)147231:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 3700</subfield><subfield code="0">(DE-625)157333:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Myhra, Sverre</subfield><subfield code="d">1943-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1044197781</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Characterization of nanostructures</subfield><subfield code="c">Sverre Myhra ; John C. Rivière</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton, Fla. [u.a.]</subfield><subfield code="b">CRC Press</subfield><subfield code="c">2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIX, 314 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanostrukturiertes Material</subfield><subfield code="0">(DE-588)4342626-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Nanostrukturiertes Material</subfield><subfield code="0">(DE-588)4342626-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rivière, John C.</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1044198737</subfield><subfield code="4">aut</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HBZ Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025091545&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-025091545</subfield></datafield></record></collection> |
| id | DE-604.BV040235223 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:19:38Z |
| institution | BVB |
| isbn | 9781439854150 |
| language | English |
| lccn | 2012001213 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025091545 |
| oclc_num | 796266566 |
| open_access_boolean | |
| owner | DE-20 DE-11 DE-29T DE-19 DE-BY-UBM |
| owner_facet | DE-20 DE-11 DE-29T DE-19 DE-BY-UBM |
| physical | XIX, 314 S. Ill., graph. Darst. |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | CRC Press |
| record_format | marc |
| spelling | Myhra, Sverre 1943- Verfasser (DE-588)1044197781 aut Characterization of nanostructures Sverre Myhra ; John C. Rivière Boca Raton, Fla. [u.a.] CRC Press 2013 XIX, 314 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf Nanostrukturiertes Material (DE-588)4342626-8 s DE-604 Rivière, John C. Verfasser (DE-588)1044198737 aut HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025091545&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Myhra, Sverre 1943- Rivière, John C. Characterization of nanostructures Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| subject_GND | (DE-588)4342626-8 |
| title | Characterization of nanostructures |
| title_auth | Characterization of nanostructures |
| title_exact_search | Characterization of nanostructures |
| title_full | Characterization of nanostructures Sverre Myhra ; John C. Rivière |
| title_fullStr | Characterization of nanostructures Sverre Myhra ; John C. Rivière |
| title_full_unstemmed | Characterization of nanostructures Sverre Myhra ; John C. Rivière |
| title_short | Characterization of nanostructures |
| title_sort | characterization of nanostructures |
| topic | Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| topic_facet | Nanostrukturiertes Material |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025091545&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT myhrasverre characterizationofnanostructures AT rivierejohnc characterizationofnanostructures |