Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
London
Springer London
2012
|
| Schriftenreihe: | Microsystems
|
| Schlagworte: | |
| Online-Zugang: | DE-634 DE-1043 DE-Aug4 DE-573 DE-92 DE-859 DE-863 DE-862 Volltext |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9781447124702 |
| DOI: | 10.1007/978-1-4471-2470-2 |
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| id | DE-604.BV040124632 |
| illustrated | Not Illustrated |
| indexdate | 2025-03-07T04:01:21Z |
| institution | BVB |
| isbn | 9781447124702 |
| language | English |
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| series2 | Microsystems |
| spellingShingle | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach Ingenieurwissenschaften Engineering Optical materials Surfaces (Physics) Nanotechnology and Microengineering Surfaces and Interfaces, Thin Films Optical and Electronic Materials |
| title | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach |
| title_auth | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach |
| title_exact_search | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach |
| title_full | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti |
| title_fullStr | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti |
| title_full_unstemmed | Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti |
| title_short | Interfacial Compatibility in Microelectronics |
| title_sort | interfacial compatibility in microelectronics moving away from the trial and error approach |
| title_sub | Moving Away from the Trial and Error Approach |
| topic | Ingenieurwissenschaften Engineering Optical materials Surfaces (Physics) Nanotechnology and Microengineering Surfaces and Interfaces, Thin Films Optical and Electronic Materials |
| topic_facet | Ingenieurwissenschaften Engineering Optical materials Surfaces (Physics) Nanotechnology and Microengineering Surfaces and Interfaces, Thin Films Optical and Electronic Materials |
| url | https://doi.org/10.1007/978-1-4471-2470-2 |
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