Test and Diagnosis for Small-Delay Defects:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer New York
2012
|
| Schlagworte: | |
| Online-Zugang: | BTU01 FAB01 FHA01 FHI01 FHN01 FKE01 FWS01 FWS02 Volltext |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9781441982971 |
| DOI: | 10.1007/978-1-4419-8297-1 |
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| illustrated | Not Illustrated |
| indexdate | 2024-08-01T11:46:55Z |
| institution | BVB |
| isbn | 9781441982971 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024981809 |
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| publishDate | 2012 |
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| publisher | Springer New York |
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| spellingShingle | Test and Diagnosis for Small-Delay Defects Ingenieurwissenschaften Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Nanotechnology and Microengineering |
| title | Test and Diagnosis for Small-Delay Defects |
| title_auth | Test and Diagnosis for Small-Delay Defects |
| title_exact_search | Test and Diagnosis for Small-Delay Defects |
| title_full | Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty |
| title_fullStr | Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty |
| title_full_unstemmed | Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty |
| title_short | Test and Diagnosis for Small-Delay Defects |
| title_sort | test and diagnosis for small delay defects |
| topic | Ingenieurwissenschaften Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Nanotechnology and Microengineering |
| topic_facet | Ingenieurwissenschaften Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Nanotechnology and Microengineering |
| url | https://doi.org/10.1007/978-1-4419-8297-1 |
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