APA (7th ed.) Citation

(2011). Reliability of Microtechnology: Interconnects, Devices and Systems (1.). Springer New York. https://doi.org/10.1007/978-1-4419-5760-3

Chicago Style (17th ed.) Citation

Reliability of Microtechnology: Interconnects, Devices and Systems. 1. New York, NY: Springer New York, 2011. https://doi.org/10.1007/978-1-4419-5760-3.

MLA (9th ed.) Citation

Reliability of Microtechnology: Interconnects, Devices and Systems. 1. Springer New York, 2011. https://doi.org/10.1007/978-1-4419-5760-3.