Reliability of Microtechnology: Interconnects, Devices and Systems
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer New York
2011
|
| Ausgabe: | 1 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FAB01 FHA01 FHI01 FHN01 FHR01 FKE01 FWS01 FWS02 Volltext |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9781441957603 |
| DOI: | 10.1007/978-1-4419-5760-3 |
Internformat
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| id | DE-604.BV040124441 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T11:46:37Z |
| institution | BVB |
| isbn | 9781441957603 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024981727 |
| oclc_num | 873907367 |
| open_access_boolean | |
| owner | DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-634 DE-898 DE-BY-UBR DE-Aug4 DE-92 DE-1043 DE-859 DE-573 |
| owner_facet | DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-634 DE-898 DE-BY-UBR DE-Aug4 DE-92 DE-1043 DE-859 DE-573 |
| physical | 1 Online-Ressource |
| psigel | ZDB-2-ENG |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Springer New York |
| record_format | marc |
| spellingShingle | Reliability of Microtechnology Interconnects, Devices and Systems Ingenieurwissenschaften Engineering System safety Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Quality Control, Reliability, Safety and Risk Nanotechnology and Microengineering Zuverlässigkeit (DE-588)4059245-5 gnd Mikrosystemtechnik (DE-588)4221617-5 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4221617-5 |
| title | Reliability of Microtechnology Interconnects, Devices and Systems |
| title_auth | Reliability of Microtechnology Interconnects, Devices and Systems |
| title_exact_search | Reliability of Microtechnology Interconnects, Devices and Systems |
| title_full | Reliability of Microtechnology Interconnects, Devices and Systems by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson |
| title_fullStr | Reliability of Microtechnology Interconnects, Devices and Systems by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson |
| title_full_unstemmed | Reliability of Microtechnology Interconnects, Devices and Systems by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson |
| title_short | Reliability of Microtechnology |
| title_sort | reliability of microtechnology interconnects devices and systems |
| title_sub | Interconnects, Devices and Systems |
| topic | Ingenieurwissenschaften Engineering System safety Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Quality Control, Reliability, Safety and Risk Nanotechnology and Microengineering Zuverlässigkeit (DE-588)4059245-5 gnd Mikrosystemtechnik (DE-588)4221617-5 gnd |
| topic_facet | Ingenieurwissenschaften Engineering System safety Electronics Optical materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Quality Control, Reliability, Safety and Risk Nanotechnology and Microengineering Zuverlässigkeit Mikrosystemtechnik |
| url | https://doi.org/10.1007/978-1-4419-5760-3 |
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