Microelectronics failure analysis: desk reference
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2011
|
| Ausgabe: | 6. ed. |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index. |
| Beschreibung: | 1 Online-Ressource (677 S.) ill. |
| ISBN: | 9781613447598 9781615037254 161503725X |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV040096562 | ||
| 003 | DE-604 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 120412s2011 xxu|||| o||u| ||||||eng d | ||
| 010 | |a 2012359075 | ||
| 020 | |a 9781613447598 |c online |9 978-1-61344-759-8 | ||
| 020 | |a 9781615037254 |9 978-1-615-03725-4 | ||
| 020 | |a 161503725X |9 1-615-03725-X | ||
| 035 | |a (OCoLC)873905783 | ||
| 035 | |a (DE-599)BVBBV040096562 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 050 | 0 | |a TK7871 | |
| 082 | 0 | |a 621.381 | |
| 245 | 1 | 0 | |a Microelectronics failure analysis |b desk reference |c ed. by Richard J. Ross |
| 250 | |a 6. ed. | ||
| 264 | 1 | |a Materials Park, Ohio |b ASM International |c 2011 | |
| 300 | |a 1 Online-Ressource (677 S.) |b ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index. | ||
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 700 | 1 | |a Ross, Richard J. |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=4859 |3 Volltext |
| 912 | |a ZDB-10-ESC |a ZDB-10-NNT | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-024953224 | |
Datensatz im Suchindex
| _version_ | 1806055217539579904 |
|---|---|
| adam_text | |
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV040096562 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871 |
| callnumber-search | TK7871 |
| callnumber-sort | TK 47871 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | ZDB-10-ESC ZDB-10-NNT |
| ctrlnum | (OCoLC)873905783 (DE-599)BVBBV040096562 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 6. ed. |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV040096562</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">120412s2011 xxu|||| o||u| ||||||eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2012359075</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781613447598</subfield><subfield code="c">online</subfield><subfield code="9">978-1-61344-759-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781615037254</subfield><subfield code="9">978-1-615-03725-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">161503725X</subfield><subfield code="9">1-615-03725-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)873905783</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV040096562</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microelectronics failure analysis</subfield><subfield code="b">desk reference</subfield><subfield code="c">ed. by Richard J. Ross</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">6. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, Ohio</subfield><subfield code="b">ASM International</subfield><subfield code="c">2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (677 S.)</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Defects</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ross, Richard J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=4859</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-ESC</subfield><subfield code="a">ZDB-10-NNT</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-024953224</subfield></datafield></record></collection> |
| id | DE-604.BV040096562 |
| illustrated | Illustrated |
| indexdate | 2024-07-31T01:14:34Z |
| institution | BVB |
| isbn | 9781613447598 9781615037254 161503725X |
| language | English |
| lccn | 2012359075 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024953224 |
| oclc_num | 873905783 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (677 S.) ill. |
| psigel | ZDB-10-ESC ZDB-10-NNT |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronics failure analysis desk reference ed. by Richard J. Ross 6. ed. Materials Park, Ohio ASM International 2011 1 Online-Ressource (677 S.) ill. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index. Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Ross, Richard J. Sonstige oth http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=4859 Volltext |
| spellingShingle | Microelectronics failure analysis desk reference Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronics failure analysis desk reference |
| title_auth | Microelectronics failure analysis desk reference |
| title_exact_search | Microelectronics failure analysis desk reference |
| title_full | Microelectronics failure analysis desk reference ed. by Richard J. Ross |
| title_fullStr | Microelectronics failure analysis desk reference ed. by Richard J. Ross |
| title_full_unstemmed | Microelectronics failure analysis desk reference ed. by Richard J. Ross |
| title_short | Microelectronics failure analysis |
| title_sort | microelectronics failure analysis desk reference |
| title_sub | desk reference |
| topic | Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| url | http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=4859 |
| work_keys_str_mv | AT rossrichardj microelectronicsfailureanalysisdeskreference |