Advanced test methods for SRAMs: effective solutions for dynamic fault detection in nanoscaled technologies
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York
Springer
2010
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | XV, 171 S. graph. Darst. 24 cm |
| ISBN: | 1441909370 9781441909374 |
Internformat
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Datensatz im Suchindex
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| id | DE-604.BV039975495 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:15:22Z |
| institution | BVB |
| isbn | 1441909370 9781441909374 |
| language | English |
| lccn | 2009935341 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024832925 |
| oclc_num | 729964682 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XV, 171 S. graph. Darst. 24 cm |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Springer |
| record_format | marc |
| spelling | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies by Alberto Bosio ... New York Springer 2010 XV, 171 S. graph. Darst. 24 cm txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Random access memory Testing Bosio, Alberto Sonstige oth Erscheint auch als Online-Ausgabe 1-441-90938-9 Erscheint auch als Online-Ausgabe 978-1-441-90938-1 |
| spellingShingle | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies Random access memory Testing |
| title | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies |
| title_auth | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies |
| title_exact_search | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies |
| title_full | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies by Alberto Bosio ... |
| title_fullStr | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies by Alberto Bosio ... |
| title_full_unstemmed | Advanced test methods for SRAMs effective solutions for dynamic fault detection in nanoscaled technologies by Alberto Bosio ... |
| title_short | Advanced test methods for SRAMs |
| title_sort | advanced test methods for srams effective solutions for dynamic fault detection in nanoscaled technologies |
| title_sub | effective solutions for dynamic fault detection in nanoscaled technologies |
| topic | Random access memory Testing |
| topic_facet | Random access memory Testing |
| work_keys_str_mv | AT bosioalberto advancedtestmethodsforsramseffectivesolutionsfordynamicfaultdetectioninnanoscaledtechnologies |