5th International Conference on Spectroscopic Ellipsometry (ICSE-V): [... held in Albany NY, USA from May 23 to May 29, 2010]
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Bibliographic Details
Corporate Author: International Conference on Spectroscopic Ellipsometry Albany, NY (Author)
Format: Conference Proceeding Book
Language:English
Published: Amsterdam Elsevier 2011
Series:Thin solid films 519,9
Subjects:
Item Description:Einzelaufnahme eines Zs.-Heftes
Physical Description:VII S., S. 2569 - 3005 Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!