Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin
Mensch & Buch
2011
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| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Erscheint: Juli 2011 |
| Beschreibung: | 142 S. |
| ISBN: | 9783863870027 |
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| 245 | 1 | 0 | |a Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB |c Manuel Tobias Koch |
| 264 | 1 | |a Berlin |b Mensch & Buch |c 2011 | |
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Datensatz im Suchindex
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| adam_text | IMAGE 1
CONTENTS
1 INTRODUCTION 1
2 DEPFET SENSORS 5
2.1 DEPFET OPERATION 5 2.1.1 CHARGE COLLECTION 6
2.1.2 READOUT 7
2.1.3 CLEAR PROCESS 10
2.2 DETAILS 12
2.2.1 EQUIVALENT CIRCUIT 12 2.2.2 OPTIMAL OPERATING REGION 12 2.2.3
READOUT SEQUENCE 14
2.2.4 SPECTRAL PERFORMANCE AND ELECTRONIC NOISE 15 3 A DEPFET MODULE FOR
THE BELLE II DETECTOR 19 3.1 INTRODUCTION 19
3.2 THE DEPFET PIXEL DETECTOR 21 3.3 MODULE LAYOUT 21
3.4 DEPFET PIXELS FOR BELLE II 24 3.5 READOUT CONCEPT 25
3.5.1 READOUT ELECTRONICS 26 4 THE DCD2 READOUT ASIC 29
4.1 ANALOG INPUT PATH 30
4.2 REGULATED CASCODE 30 4.3 CURRENT MEMORY CELLS 32
4.4 CURRENT DIGITIZATION ADC 33 4.4.1 REALIZATION OF THE CYCLIC ADC 34
4.4.2 CONVERSION ALGORITHM 36 4.4.3 REDUNDANT BINARY REPRESENTATION 37
4.5 ADC PERFORMANCE SPECIFICATION 39 4.6 BIASING PARAMETERS 41 4.7 THE
NEXT GENERATION DCD-B READOUT CHIP 43 5 TEST SYSTEM DEVELOPMENT 47
5.1 DEVELOPMENT OF A FPGA READOUT SYSTEM 47 5.1.1 DESIGN OVERVIEW AND
FEATURES 50 5.1.2 OUTLOOK AND ALTERNATIVE USES 53
5.2 DEVELOPMENT OFA HYBRID FOR THE DEPFET SENSOR 53 5.2.1 DESIGN
OVERVIEW 53
5.3 TEST SYSTEM ASSEMBLY 56 5.3.1 CHIP ASSEMBLY 57
BIBLIOGRAFISCHE INFORMATIONEN HTTP://D-NB.INFO/1014627788
DIGITALISIERT DURCH
IMAGE 2
CONTENTS
5.3.2 SOFTWARE/FIRMWARE DEVELOPMENT 57 5.3.3 POWERING SCHEME 59 6 DCD2
MEASUREMENTS 63 6.1 STATIC MEASUREMENTS 63
6.1.1 GAIN, RANGE AND OFFSET 65 6.1.2 DNL 67 6.1.3 INL 72
6.1.4 STATIC ADC NOISE 72 6.1.5 EFFECTIVE ADC ERROR 75 6.1.6 REGULATED
CASCODE NOISE WITH INPUT CAPACITANCE 77 6.2 DYNAMIC MEASUREMENTS 79
6.2.1 TIME RESOLVED MEASUREMENTS WITH THE DCD 80 6.2.2 REGULATED CASCODE
PERFORMANCE 81 7 DEPFET PERFORMANCE MEASUREMENTS 85 7.1 DEPFET READOUT
TIMING 85
7.1.1 MEASUREMENT PROCEDURE 86 7.1.2 RESULTS 87
7.1.3 CONSEQUENCES 93 7.2 PIXEL NOISE 95 7.3 CAPACITIVE CHARGE INJECTION
96 7.3.1 MEASUREMENT PROCEDURE 97
7.3.2 CLEAR STROBE CHARGE INJECTION 98 7.3.3 GATE STROBE CHARGE
INJECTION 98 7.3.4 RESULTS AND CONSEQUENCES 100 7.4 PEDESTAL CURRENT
SPREAD 101 7.5 RADIOACTIVE SOURCE MEASUREMENTS 102 7.6 DIGITAL
RESOLUTION LIMITS OF THE READOUT CHAIN 106 7.6.1 DYNAMIC RANGE OF THE
DEPFET 107 7.6.2 DYNAMIC RANGE AND ERROR SOURCES OF THE READOUT
CHIPS 109
7.6.3 SUMMARY 115 8 SUMMARY 117
A DIRECT DEPFET I D MEASUREMENT 121
BIBLIOGRAPHY 123
|
| any_adam_object | 1 |
| author | Koch, Manuel Tobias |
| author_facet | Koch, Manuel Tobias |
| author_role | aut |
| author_sort | Koch, Manuel Tobias |
| author_variant | m t k mt mtk |
| building | Verbundindex |
| bvnumber | BV039811808 |
| ctrlnum | (OCoLC)775093792 (DE-599)DNB1014627788 |
| dewey-full | 539.77 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
| dewey-raw | 539.77 |
| dewey-search | 539.77 |
| dewey-sort | 3539.77 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Thesis Book |
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| indexdate | 2024-07-10T00:11:58Z |
| institution | BVB |
| isbn | 9783863870027 |
| language | English |
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| physical | 142 S. |
| publishDate | 2011 |
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| publisher | Mensch & Buch |
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| spelling | Koch, Manuel Tobias Verfasser aut Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB Manuel Tobias Koch Berlin Mensch & Buch 2011 142 S. txt rdacontent n rdamedia nc rdacarrier Erscheint: Juli 2011 Zugl.: Rheinische Friedrich-Wilhelms-Universität Bonn, Diss., 2011 Belle-II-Detektor (DE-588)7854417-8 gnd rswk-swf Pixeldetektor (DE-588)4746359-4 gnd rswk-swf DePFET (DE-588)7844938-8 gnd rswk-swf Ausleseverfahren Sensortechnik (DE-588)4330259-2 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Belle-II-Detektor (DE-588)7854417-8 s Pixeldetektor (DE-588)4746359-4 s DePFET (DE-588)7844938-8 s Ausleseverfahren Sensortechnik (DE-588)4330259-2 s DE-604 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=024672100&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Koch, Manuel Tobias Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB Belle-II-Detektor (DE-588)7854417-8 gnd Pixeldetektor (DE-588)4746359-4 gnd DePFET (DE-588)7844938-8 gnd Ausleseverfahren Sensortechnik (DE-588)4330259-2 gnd |
| subject_GND | (DE-588)7854417-8 (DE-588)4746359-4 (DE-588)7844938-8 (DE-588)4330259-2 (DE-588)4113937-9 |
| title | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB |
| title_auth | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB |
| title_exact_search | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB |
| title_full | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB Manuel Tobias Koch |
| title_fullStr | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB Manuel Tobias Koch |
| title_full_unstemmed | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB Manuel Tobias Koch |
| title_short | Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB |
| title_sort | development of a test environment for the characterization of the current digitizer chip dcd2 and the depfet pixel system for the belle ii experiment at superkekb |
| topic | Belle-II-Detektor (DE-588)7854417-8 gnd Pixeldetektor (DE-588)4746359-4 gnd DePFET (DE-588)7844938-8 gnd Ausleseverfahren Sensortechnik (DE-588)4330259-2 gnd |
| topic_facet | Belle-II-Detektor Pixeldetektor DePFET Ausleseverfahren Sensortechnik Hochschulschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=024672100&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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