Proceedings: 16 - 19 November 2003, Xi'an, China
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Society
2003
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| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXI, 517 S. Ill., graph. Darst. |
| ISBN: | 0769519512 |
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Datensatz im Suchindex
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| isbn | 0769519512 |
| language | English |
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| spelling | Asian Test Symposium 12 2003 Xi'an Verfasser (DE-588)6082954-0 aut Proceedings 16 - 19 November 2003, Xi'an, China 12th Asian Test Symposium, ATS 2003 ; sponsored by Test Technology Technical Council of IEEE Computer Society. In cooperation with Technical Committee on Fault Tolerant Computing of CCF ... Los Alamitos, Calif. [u.a.] IEEE Computer Society 2003 XXI, 517 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2003 Xi'an gnd-content Integrierte Schaltung (DE-588)4027242-4 s Testen (DE-588)4367264-4 s Schaltungsentwurf (DE-588)4179389-4 s DE-604 IEEE Computer Society Test Technology Technical Council Sonstige (DE-588)16030549-4 oth Zhong guo ji suan ji xue hui Technical Committee on Fault Tolerant Computing Sonstige (DE-588)6054098-9 oth DE-601 pdf/application http://www.gbv.de/dms/bowker/toc/9780769519517.pdf Inhaltsverzeichnis |
| spellingShingle | Proceedings 16 - 19 November 2003, Xi'an, China Schaltungsentwurf (DE-588)4179389-4 gnd Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| subject_GND | (DE-588)4179389-4 (DE-588)4367264-4 (DE-588)4027242-4 (DE-588)1071861417 |
| title | Proceedings 16 - 19 November 2003, Xi'an, China |
| title_auth | Proceedings 16 - 19 November 2003, Xi'an, China |
| title_exact_search | Proceedings 16 - 19 November 2003, Xi'an, China |
| title_full | Proceedings 16 - 19 November 2003, Xi'an, China 12th Asian Test Symposium, ATS 2003 ; sponsored by Test Technology Technical Council of IEEE Computer Society. In cooperation with Technical Committee on Fault Tolerant Computing of CCF ... |
| title_fullStr | Proceedings 16 - 19 November 2003, Xi'an, China 12th Asian Test Symposium, ATS 2003 ; sponsored by Test Technology Technical Council of IEEE Computer Society. In cooperation with Technical Committee on Fault Tolerant Computing of CCF ... |
| title_full_unstemmed | Proceedings 16 - 19 November 2003, Xi'an, China 12th Asian Test Symposium, ATS 2003 ; sponsored by Test Technology Technical Council of IEEE Computer Society. In cooperation with Technical Committee on Fault Tolerant Computing of CCF ... |
| title_short | Proceedings |
| title_sort | proceedings 16 19 november 2003 xi an china |
| title_sub | 16 - 19 November 2003, Xi'an, China |
| topic | Schaltungsentwurf (DE-588)4179389-4 gnd Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| topic_facet | Schaltungsentwurf Testen Integrierte Schaltung Konferenzschrift 2003 Xi'an |
| url | http://www.gbv.de/dms/bowker/toc/9780769519517.pdf |
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