ETS 2007: 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif.
IEEE Computer Society
2007
|
| Schlagworte: | |
| Beschreibung: | XV, 217 S. Ill., graph. Darst. 28 cm |
| ISBN: | 0769528279 9780769528274 |
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| isbn | 0769528279 9780769528274 |
| language | English |
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| spelling | European Test Symposium 12 2007 Freiburg im Breisgau Verfasser (DE-588)16332652-6 aut ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany Los Alamitos, Calif. IEEE Computer Society 2007 XV, 217 S. Ill., graph. Darst. 28 cm txt rdacontent n rdamedia nc rdacarrier Integrated circuits Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany Integrated circuits Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| title_auth | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| title_exact_search | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| title_full | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| title_fullStr | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| title_full_unstemmed | ETS 2007 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| title_short | ETS 2007 |
| title_sort | ets 2007 12th ieee european test symposium proceedings 20 24 may 2007 freiburg germany |
| title_sub | 12th IEEE European Test Symposium : proceedings : 20 - 24 May, 2007, Freiburg, Germany |
| topic | Integrated circuits Testing Congresses |
| topic_facet | Integrated circuits Testing Congresses Konferenzschrift |
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