Atomic force microscopy based nanorobotics: modelling, simulation, setup building and experiments
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Heidelberg
Springer
2011
|
| Schriftenreihe: | Springer tracts in advanced robotics
71 |
| Schlagworte: | |
| Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XIV, 342 S. Ill., graph. Darst. 24 cm |
| ISBN: | 9783642203282 3642203280 |
Internformat
MARC
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Datensatz im Suchindex
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|---|---|
| adam_text |
IMAGE 1
CONTENTS
INTRODUCTION 1
REFERENCES 8
1 DESCRIPTIONS AND CHALLENGES OF AFM BASED NANOROBOTIC SYSTEMS . . 13 1
.1 DESCRIPTIONS 14
1.1.1 THE AFM AS A NANOROBOT-BEYOND IMAGING 14
1.1.2 AFM-BASED NANOMANIPULATION 16
1.1.3 AFM/SEM HYBRID NANOROBOTIC SYSTEMS 18
1.2 CHALLENGES AND OPPORTUNITIES 19
1.2.1 TWO-DIMENSIONAL APPLICATIONS 19
1.2.2 MANIPULATION EFFICIENCY 21
1.2.3 AUTOMATION 24
1.3 CONCLUSION 26
REFERENCES 26
2 INSTRUMENTATION ISSUES OF AN AFM BASED NANOROBOTIC SYSTEM 31 2. 1
FORCE CALIBRATION ISSUES IN AFM (NORMAL FORCE AND LATERAL FORCE
CALIBRATION) 31
2.1.1 NORMAL FORCE CALIBRATION 32
2.1.2 LATERAL FORCE CALIBRATION 34
2.1.3 OPTICAL LEVER CALIBRATION IN ATOMIC FORCE MICROSCOPE WITH A
MECHANICAL LEVER 43
2.1.4 ENHANCED ACCURACY OF FORCE APPLICATION USING NONLINEAR CALIBRATION
OF OPTICAL LEVERS 49
2.2 CROSS-TALK COMPENSATION IN ATOMIC FORCE MICROSCOPY 54 2.2.1
CROSS-TALK COMPENSATION PROCEDURE 57
2.2.2 A CASE STUDY FOR THE CROSS-TALK COMPENSATION 64 2.3 THERMAL DRIFT
COMPENSATION IN AFM BASED NANOMANIPULATION 66 2.3.1 DRIFT TRACKING WITH
BAYESIAN FILTERING 68
2.3.2 EXPERIMENTAL RESULTS 77
2.4 CONCLUSION 83
REFERENCES 84
BIBLIOGRAFISCHE INFORMATIONEN HTTP://D-NB.INFO/101047877X
DIGITALISIERT DURCH
IMAGE 2
XII CONTENTS
3 NANOMECHANICS OF AFM BASED NANOMANIPULATION 87
3.1 THE PHYSICS OF THE MICRO/NANOWORLD 88
3.1.1 VAN DER WAALS FORCES 89
3.1.2 CAPILLARY FORCES 91
3.1.3 ELECTROSTATIC FORCES 94
3.1.4 ELASTIC CONTACT MECHANICS 97
3.2 NANOMECHANICS OF CONTACT PUSHING OR PULLING USING ONE PROBE . . 99
3.2.1 PROBLEM DEFINITION 100
3.2.2 METHODS 102
3.2.3 AUTOMATIC PUSHING SCHEME 106
3.2.4 EXPERIMENTS 107
3.3 NANOMECHANICS OF PICK-AND-PLACE MANIPULATION USING TWO PROBES 110
3.3.1 PROBLEM DEFINITION 110
3.3.2 CONTACT MECHANICS OF NANOSCALE GRASPING 112
3.3.3 NANOSCALE GRASPING WITH DIFFERENT GRIPPERS 118 3.3.4 NANOTIP
GRIPPER IMPLEMENTATION EXPERIMENTS 124 3.3.5 LIST OF SELECTED SYMBOLS
131
3.3.6 DEFLECTIONS ON THE CANTILEVER 132
3.4 CONCLUSION 133
REFERENCES 133
4 TELEOPERATION BASED AFM MANIPULATION CONTROL 145
4.1 INTRODUCTION 145
4.2 BILATERAL SCALED TELEOPERATION CONTROL USING AN AFM 147 4.2.1
ARCHITECTURE OF A TELEOPERATION SYSTEM 147
4.2.2 PERFORMANCE MEASUREMENT 148
4.2.3 DIRECT FORCE FEEDBACK 155
4.2.4 FORCE-POSITION CONTROL 158
4.2.5 PASSIVITY BASED BILATERAL CONTROL 165
4.2.6 CONCLUSION 167
4.3 EXPERIMENTAL PLATFORMS 167
4.3.1 AFM FORCE MEASUREMENT 167
4.3.2 MATERIAL FOR EXPERIMENTS 171
4.4 1-D TELEOPERATED TOUCH FEEDBACK USING AFM 173
4.4.1 APPROACH RETRACT EXPERIMENT USING DIRECT FORCE FEEDBACK CONTROL
174
4.4.2 APPROACH RETRACT EXPERIMENT USING FORCE-POSITION CONTROL 176
4.4.3 APPROACH RETRACT EXPERIMENT USING PASSIVITY CONTROL 179 4.4.4
CONCLUSION 189
4.5 2-D MICRO TELEOPERATION WITH FORCE FEEDBACK 191
4.5.1 HAPTIC FEEDBACK DETERMINATION 191
4.5.2 EXPERIMENTAL RESULTS 194
4.5.3 CONCLUSION 197
IMAGE 3
CONTENTS XIII
4.6 3-D TELEOPERATED TOUCH FEEDBACK USING AFM 197
4.6.1 THREE-DIMENSIONAL FORCE DECOUPLING 198
4.6.2 ADAPTIVE FRICTION MODEL 202
4.6.3 EXPERIMENTAL RESULTS 203
4.6.4 CONCLUSION 211
4.7 HAPTIC TELEOPERATION FOR 3D MICROASSEMBLY OF SPHERICAL OBJECTS .211
4.7.1 EXPERIMENTAL SETUP 212
4.7.2 3D MICROASSEMBLY PROTOCOL 214
4.7.3 ASSISTED GRIPPER ALIGNMENT 215
4.7.4 PICK-AND-PLACE WITH HAPTIC FEEDBACK 224
4.7.5 CONSTRUCTION OF A TWO-LAYER PYRAMID 229
4.7.6 REMARKS 231
4.8 CONCLUSION 232
4.9 NOMENCLATURE 233
REFERENCES 233
5 AUTOMATED CONTROL OF AFM BASED NANOMANIPULATION 237 5.1 AUTOMATED
TWO-DIMENSIONAL MICROMANIPULATION 238 5.1.1 PROBLEM DEFINITION 239
5.1.2 IMAGE PROCESSING 240
5.1.3 PARAMETER ESTIMATION 241
5.1.4 CONTROLLED PUSHING AND PULLING 244
5.1.5 TRAJECTORY PLANNING FOR PATTERN FORMATION 251
5.1.6 ASSEMBLY 252
5.2 THREE-DIMENSIONAL AUTOMATED MICROMANIPULATION USING A NANOTIP
GRIPPER WITH MULTI-FEEDBACK 254
5.2.1 SYSTEM CONFIGURATION 255
5.2.2 MANIPULATION SCHEMES 256
5.2.3 PROTOCOL FOR AUTOMATED PICK-AND-PLACE 258
5.2.4 TASK PLANNING 259
5.2.5 GRASPING POINT SEARCHING AND CONTACT DETECTION 260 5.2.6
EXPERIMENTAL RESULTS AND DISCUSSION 264
5.3 ATOMIC FORCE MICROSCOPY BASED THREE-DIMENSIONAL NANOMANIPULATION 266
5.3.1 SYSTEM CONFIGURATION 267
5.3.2 MANIPULATION PROTOCOL 268
5.3.3 PICK-AND-PLACE NANOMANIPULATION 273
5.4 PARALLEL IMAGING/MANIPULATION FORCE MICROSCOPY 278 5.5
HIGH-EFFICIENCY AUTOMATED NANOMANIPULATION WITH PARALLEL
IMAGING/MANIPULATION FORCE MICROSCOPY 282
5.5.1 SYSTEM SET-UP OF THE PIMM 283
5.5.2 STRATEGIES FOR AUTOMATED PARALLEL MANIPULATION 286 5.5.3 AUTOMATED
CONTROL OF THE PARALLEL NANOMANIPULATION 293 5.5.4 EXPERIMENTAL RESULTS
299
5.6 CONCLUSION 303
REFERENCES 304
IMAGE 4
XIV CONTENTS
6 APPLICATIONS OF AFM BASED NANOROBOTIC SYSTEMS 313
6.1 FLEXIBLE ROBOTIC SYSTEM 313
6.1.1 AFM-BASED FLEXIBLE ROBOTIC SYSTEM 314
6.1.2 AFM-FRS SETUP 314
6.1.3 THE CONFIGURATION OF 3-D MICROMANIPULATION 319 6.1.4 THE
CONFIGURATION OF 3-D NANOMANIPULATION 321 6.1.5 THE CONFIGURATION FOR
PARALLEL NANOMANIPULATION 325 6.1.6 EXPERIMENTAL RESULTS 327
6.2 IN SITU NANOSCALE PEELING OF ONE DIMENSIONAL STRUCTURE 332 6.2.1
METHODS 333
6.2.2 RESULTS AND DISCUSSION 337
6.3 CONCLUSION 339
REFERENCES 339 |
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| spelling | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments Hui Xie ... Berlin ; Heidelberg Springer 2011 XIV, 342 S. Ill., graph. Darst. 24 cm txt rdacontent n rdamedia nc rdacarrier Springer tracts in advanced robotics 71 Literaturangaben Nanotechnologie (DE-588)4327470-5 gnd rswk-swf Mikromanipulator (DE-588)4169834-4 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s Nanotechnologie (DE-588)4327470-5 s Mikromanipulator (DE-588)4169834-4 s DE-604 Xie, Hui Sonstige oth Erscheint auch als Online-Ausgabe Atomic Force Microscopy Based Nanorobotics X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=3683336&prov=M&dok_var=1&dok_ext=htm Inhaltstext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=024585614&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments Nanotechnologie (DE-588)4327470-5 gnd Mikromanipulator (DE-588)4169834-4 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4327470-5 (DE-588)4169834-4 (DE-588)4274473-8 |
| title | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments |
| title_auth | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments |
| title_exact_search | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments |
| title_full | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments Hui Xie ... |
| title_fullStr | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments Hui Xie ... |
| title_full_unstemmed | Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments Hui Xie ... |
| title_short | Atomic force microscopy based nanorobotics |
| title_sort | atomic force microscopy based nanorobotics modelling simulation setup building and experiments |
| title_sub | modelling, simulation, setup building and experiments |
| topic | Nanotechnologie (DE-588)4327470-5 gnd Mikromanipulator (DE-588)4169834-4 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Nanotechnologie Mikromanipulator Rasterkraftmikroskopie |
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