Wafer-level testing and test during burn-in for integrated circuits:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston [u.a.]
Artech House
2010
|
| Schriftenreihe: | Artech House integrated microsystems series
|
| Beschreibung: | XI, 198 S. Ill., graph. Darst. |
| ISBN: | 9781596939899 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV039733537 | ||
| 003 | DE-604 | ||
| 005 | 20120116 | ||
| 007 | t | ||
| 008 | 111130s2010 ad|| |||| 00||| eng d | ||
| 020 | |a 9781596939899 |9 978-1-59693-989-9 | ||
| 035 | |a (OCoLC)449516460 | ||
| 035 | |a (DE-599)BVBBV039733537 | ||
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| 041 | 0 | |a eng | |
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| 082 | 0 | |a 621.381 | |
| 084 | |a ZN 4900 |0 (DE-625)157417: |2 rvk | ||
| 100 | 1 | |a Bahukudumbi, Sudarshan |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Wafer-level testing and test during burn-in for integrated circuits |c Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| 264 | 1 | |a Boston [u.a.] |b Artech House |c 2010 | |
| 300 | |a XI, 198 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Artech House integrated microsystems series | |
| 700 | 1 | |a Chakrabarty, Krishnendu |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-024581371 | ||
Datensatz im Suchindex
| _version_ | 1804148617216262144 |
|---|---|
| any_adam_object | |
| author | Bahukudumbi, Sudarshan Chakrabarty, Krishnendu |
| author_facet | Bahukudumbi, Sudarshan Chakrabarty, Krishnendu |
| author_role | aut aut |
| author_sort | Bahukudumbi, Sudarshan |
| author_variant | s b sb k c kc |
| building | Verbundindex |
| bvnumber | BV039733537 |
| classification_rvk | ZN 4900 |
| ctrlnum | (OCoLC)449516460 (DE-599)BVBBV039733537 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV039733537 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:09:59Z |
| institution | BVB |
| isbn | 9781596939899 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024581371 |
| oclc_num | 449516460 |
| open_access_boolean | |
| owner | DE-898 DE-BY-UBR |
| owner_facet | DE-898 DE-BY-UBR |
| physical | XI, 198 S. Ill., graph. Darst. |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House integrated microsystems series |
| spelling | Bahukudumbi, Sudarshan Verfasser aut Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty Boston [u.a.] Artech House 2010 XI, 198 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Artech House integrated microsystems series Chakrabarty, Krishnendu Verfasser aut |
| spellingShingle | Bahukudumbi, Sudarshan Chakrabarty, Krishnendu Wafer-level testing and test during burn-in for integrated circuits |
| title | Wafer-level testing and test during burn-in for integrated circuits |
| title_auth | Wafer-level testing and test during burn-in for integrated circuits |
| title_exact_search | Wafer-level testing and test during burn-in for integrated circuits |
| title_full | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| title_fullStr | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| title_full_unstemmed | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi; Krishnendu Chakrabarty |
| title_short | Wafer-level testing and test during burn-in for integrated circuits |
| title_sort | wafer level testing and test during burn in for integrated circuits |
| work_keys_str_mv | AT bahukudumbisudarshan waferleveltestingandtestduringburninforintegratedcircuits AT chakrabartykrishnendu waferleveltestingandtestduringburninforintegratedcircuits |