Mikroskopische phasenmessende Deflektometrie:
Saved in:
Bibliographic Details
Main Author: Richter, Claus 1978- (Author)
Format: Thesis Book
Language:German
Published: Erlangen-Nürnberg Erlangen Scientific Press 2011
Series:Progress in modern optics 40
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:80 S. Ill., graph. Darst.
ISBN:9783941741157

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Indexes