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Proceedings: Board and system test track

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Bibliographische Detailangaben
Körperschaft:	International Test Conference Charlotte, NC (VerfasserIn)
Format:	Tagungsbericht Buch
Sprache:	English
Veröffentlicht:	Washington, D.C. International Test Conference 2003 Piscataway, N.J. IEEE
Schlagworte:	Integrated circuits > Testing > Congresses Automatic test equipment > Congresses Computer storage devices > Testing > Congresses Electronic digital computers > Circuits > Testing > Congresses Semiconductor storage devices > Congresses Integrierte Schaltung Computerunterstütztes Verfahren Telekommunikation Datenverarbeitungssystem Prüftechnik Bildverstehen VLSI Computersimulation Mikroelektronik Maschinelles Sehen Mustererkennung Medizin Elektronik Testen Entwurf Konferenzschrift
Online-Zugang:	Table of contents
Beschreibung:	Selection of papers from the proceedings of the conference. -- At head of title: ITC International Test Conference 2003 -- Conference number inferred. -- "IEEE Catalog Number 03CH37494"--T.p. verso. Includes bibliographical references and author index -- Also available via the World Wide Web.
Beschreibung:	II, 216 S. Ill. 29 cm
ISBN:	0780381068

Internformat

MARC


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Datensatz im Suchindex

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any_adam_object
author_corporate	International Test Conference Charlotte, NC
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author_facet	International Test Conference Charlotte, NC
author_sort	International Test Conference Charlotte, NC
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bvnumber	BV039714490
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ctrlnum	(OCoLC)54114985 (DE-599)BVBBV039714490
dewey-full	621.3815/48
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815/48
dewey-search	621.3815/48
dewey-sort	3621.3815 248
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
format	Conference Proceeding Book
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genre	(DE-588)1071861417 Konferenzschrift gnd-content
genre_facet	Konferenzschrift
id	DE-604.BV039714490
illustrated	Illustrated
indexdate	2024-07-10T00:09:33Z
institution	BVB
institution_GND	(DE-588)6084794-3 (DE-588)5146130-4
isbn	0780381068
language	English
lccn	2004298640
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-024562734
oclc_num	54114985
open_access_boolean
owner	DE-29T
owner_facet	DE-29T
physical	II, 216 S. Ill. 29 cm
publishDate	2003
publishDateSearch	2003
publishDateSort	2003
publisher	International Test Conference IEEE
record_format	marc
spelling	International Test Conference 2003 Charlotte, NC Verfasser (DE-588)6084794-3 aut Proceedings Board and system test track International Test Conference 2003 ; [30 September-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section] ITC International Test Conference 2003 Board and system test track Washington, D.C. International Test Conference 2003 Piscataway, N.J. IEEE II, 216 S. Ill. 29 cm txt rdacontent n rdamedia nc rdacarrier Selection of papers from the proceedings of the conference. -- At head of title: ITC International Test Conference 2003 -- Conference number inferred. -- "IEEE Catalog Number 03CH37494"--T.p. verso. Includes bibliographical references and author index -- Also available via the World Wide Web. Integrated circuits Testing Congresses Automatic test equipment Congresses Computer storage devices Testing Congresses Electronic digital computers Circuits Testing Congresses Semiconductor storage devices Congresses Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Mikroelektronik (DE-588)4039207-7 s 4\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 5\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 6\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 7\p DE-604 8\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 9\p DE-604 Mustererkennung (DE-588)4040936-3 s 10\p DE-604 Institute of Electrical and Electronics Engineers Philadelphia Section Sonstige (DE-588)5146130-4 oth http://www.loc.gov/catdir/toc/fy0601/2004298640.html Table of contents 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 9\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 10\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings Board and system test track Integrated circuits Testing Congresses Automatic test equipment Congresses Computer storage devices Testing Congresses Electronic digital computers Circuits Testing Congresses Semiconductor storage devices Congresses Integrierte Schaltung (DE-588)4027242-4 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Telekommunikation (DE-588)4059360-5 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Prüftechnik (DE-588)4047610-8 gnd Bildverstehen (DE-588)4202022-0 gnd VLSI (DE-588)4117388-0 gnd Computersimulation (DE-588)4148259-1 gnd Mikroelektronik (DE-588)4039207-7 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Mustererkennung (DE-588)4040936-3 gnd Medizin (DE-588)4038243-6 gnd Elektronik (DE-588)4014346-6 gnd Testen (DE-588)4367264-4 gnd Entwurf (DE-588)4121208-3 gnd
subject_GND	(DE-588)4027242-4 (DE-588)4139030-1 (DE-588)4059360-5 (DE-588)4125229-9 (DE-588)4047610-8 (DE-588)4202022-0 (DE-588)4117388-0 (DE-588)4148259-1 (DE-588)4039207-7 (DE-588)4129594-8 (DE-588)4040936-3 (DE-588)4038243-6 (DE-588)4014346-6 (DE-588)4367264-4 (DE-588)4121208-3 (DE-588)1071861417
title	Proceedings Board and system test track
title_alt	ITC International Test Conference 2003 Board and system test track
title_auth	Proceedings Board and system test track
title_exact_search	Proceedings Board and system test track
title_full	Proceedings Board and system test track International Test Conference 2003 ; [30 September-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section]
title_fullStr	Proceedings Board and system test track International Test Conference 2003 ; [30 September-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section]
title_full_unstemmed	Proceedings Board and system test track International Test Conference 2003 ; [30 September-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section]
title_short	Proceedings
title_sort	proceedings board and system test track
title_sub	Board and system test track
topic	Integrated circuits Testing Congresses Automatic test equipment Congresses Computer storage devices Testing Congresses Electronic digital computers Circuits Testing Congresses Semiconductor storage devices Congresses Integrierte Schaltung (DE-588)4027242-4 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Telekommunikation (DE-588)4059360-5 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Prüftechnik (DE-588)4047610-8 gnd Bildverstehen (DE-588)4202022-0 gnd VLSI (DE-588)4117388-0 gnd Computersimulation (DE-588)4148259-1 gnd Mikroelektronik (DE-588)4039207-7 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Mustererkennung (DE-588)4040936-3 gnd Medizin (DE-588)4038243-6 gnd Elektronik (DE-588)4014346-6 gnd Testen (DE-588)4367264-4 gnd Entwurf (DE-588)4121208-3 gnd
topic_facet	Integrated circuits Testing Congresses Automatic test equipment Congresses Computer storage devices Testing Congresses Electronic digital computers Circuits Testing Congresses Semiconductor storage devices Congresses Integrierte Schaltung Computerunterstütztes Verfahren Telekommunikation Datenverarbeitungssystem Prüftechnik Bildverstehen VLSI Computersimulation Mikroelektronik Maschinelles Sehen Mustererkennung Medizin Elektronik Testen Entwurf Konferenzschrift
url	http://www.loc.gov/catdir/toc/fy0601/2004298640.html
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