Proceedings International Test Conference 2003: [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Washington, D.C.
International Test Conference
2003
Piscataway, N.J. IEEE |
Schlagworte: | |
Beschreibung: | At head of title: ITC International Test Conference 2003 -- Conference number inferred. -- "IEEE Catalog Number 03CH37494"--T.p. verso. Includes bibliographical references and author index -- Also available via the World Wide Web. |
Beschreibung: | XVI, 1334 S. Ill. 29 cm |
ISBN: | 0780381068 |
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650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
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isbn | 0780381068 |
language | English |
lccn | 2004298641 |
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physical | XVI, 1334 S. Ill. 29 cm |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | International Test Conference IEEE |
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spelling | International Test Conference 2003 Charlotte, NC Verfasser (DE-588)6084794-3 aut Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section] ITC International Test Conference 2003 Washington, D.C. International Test Conference 2003 Piscataway, N.J. IEEE XVI, 1334 S. Ill. 29 cm txt rdacontent n rdamedia nc rdacarrier At head of title: ITC International Test Conference 2003 -- Conference number inferred. -- "IEEE Catalog Number 03CH37494"--T.p. verso. Includes bibliographical references and author index -- Also available via the World Wide Web. Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
spellingShingle | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses |
subject_GND | (DE-588)1071861417 |
title | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] |
title_alt | ITC International Test Conference 2003 |
title_auth | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] |
title_exact_search | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] |
title_full | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section] |
title_fullStr | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section] |
title_full_unstemmed | Proceedings International Test Conference 2003 [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section] |
title_short | Proceedings International Test Conference 2003 |
title_sort | proceedings international test conference 2003 september 30 october 2 2003 charlotte convention center charlotte nc usa |
title_sub | [September 30 - October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] |
topic | Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses |
topic_facet | Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses Konferenzschrift |
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