Digitale SAP-Massendatenanalyse: Risiken erkennen ; Prozesse optimieren
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Bibliographic Details
Main Authors: Bönner, Arno (Author), Riedl, Martin (Author), Wenig, Stefan (Author)
Format: Book
Language:German
Published: Berlin Schmidt 2011
Subjects:
Online Access:Inhaltstext
Inhaltsverzeichnis
Physical Description:265 S. Ill., graph. Darst.
ISBN:9783503116522
3503116524

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