Electromigration in ULSI interconnections:
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Bibliographic Details
Main Author: Tan, Cher Ming (Author)
Format: Book
Language:English
Published: New Jersey [u.a.] World Scientific 2010
Series:International series on advances in solid state electronics and technology
Item Description:The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf
Literaturangaben
Physical Description:XIX, 291 S. Ill., graph. Darst.
ISBN:9789814273329
9814273325

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