Electromigration in ULSI interconnections:
Gespeichert in:
1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New Jersey [u.a.]
World Scientific
2010
|
Schriftenreihe: | International series on advances in solid state electronics and technology
|
Beschreibung: | The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf Literaturangaben |
Beschreibung: | XIX, 291 S. Ill., graph. Darst. |
ISBN: | 9789814273329 9814273325 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV039599830 | ||
003 | DE-604 | ||
005 | 20111026 | ||
007 | t | ||
008 | 110926s2010 ad|| |||| 00||| eng d | ||
010 | |a 2011280775 | ||
020 | |a 9789814273329 |9 978-981-427332-9 | ||
020 | |a 9814273325 |9 981-427332-5 | ||
035 | |a (OCoLC)311763141 | ||
035 | |a (DE-599)BVBBV036102442 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-83 | ||
082 | 0 | |a 621.3815 |2 22 | |
084 | |a ZN 4952 |0 (DE-625)157425: |2 rvk | ||
100 | 1 | |a Tan, Cher Ming |e Verfasser |4 aut | |
245 | 1 | 0 | |a Electromigration in ULSI interconnections |c Cher Ming Tan |
264 | 1 | |a New Jersey [u.a.] |b World Scientific |c 2010 | |
300 | |a XIX, 291 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a International series on advances in solid state electronics and technology | |
500 | |a The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf | ||
500 | |a Literaturangaben | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-024450738 |
Datensatz im Suchindex
_version_ | 1804148438754918400 |
---|---|
any_adam_object | |
author | Tan, Cher Ming |
author_facet | Tan, Cher Ming |
author_role | aut |
author_sort | Tan, Cher Ming |
author_variant | c m t cm cmt |
building | Verbundindex |
bvnumber | BV039599830 |
classification_rvk | ZN 4952 |
ctrlnum | (OCoLC)311763141 (DE-599)BVBBV036102442 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01150nam a2200337 c 4500</leader><controlfield tag="001">BV039599830</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20111026 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">110926s2010 ad|| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2011280775</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814273329</subfield><subfield code="9">978-981-427332-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814273325</subfield><subfield code="9">981-427332-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)311763141</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV036102442</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4952</subfield><subfield code="0">(DE-625)157425:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Tan, Cher Ming</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electromigration in ULSI interconnections</subfield><subfield code="c">Cher Ming Tan</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New Jersey [u.a.]</subfield><subfield code="b">World Scientific</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIX, 291 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">International series on advances in solid state electronics and technology</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-024450738</subfield></datafield></record></collection> |
id | DE-604.BV039599830 |
illustrated | Illustrated |
indexdate | 2024-07-10T00:07:08Z |
institution | BVB |
isbn | 9789814273329 9814273325 |
language | English |
lccn | 2011280775 |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024450738 |
oclc_num | 311763141 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | XIX, 291 S. Ill., graph. Darst. |
publishDate | 2010 |
publishDateSearch | 2010 |
publishDateSort | 2010 |
publisher | World Scientific |
record_format | marc |
series2 | International series on advances in solid state electronics and technology |
spelling | Tan, Cher Ming Verfasser aut Electromigration in ULSI interconnections Cher Ming Tan New Jersey [u.a.] World Scientific 2010 XIX, 291 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier International series on advances in solid state electronics and technology The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf Literaturangaben |
spellingShingle | Tan, Cher Ming Electromigration in ULSI interconnections |
title | Electromigration in ULSI interconnections |
title_auth | Electromigration in ULSI interconnections |
title_exact_search | Electromigration in ULSI interconnections |
title_full | Electromigration in ULSI interconnections Cher Ming Tan |
title_fullStr | Electromigration in ULSI interconnections Cher Ming Tan |
title_full_unstemmed | Electromigration in ULSI interconnections Cher Ming Tan |
title_short | Electromigration in ULSI interconnections |
title_sort | electromigration in ulsi interconnections |
work_keys_str_mv | AT tancherming electromigrationinulsiinterconnections |