Proceedings International Test Conference 2002:
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Washington, D.C.
International Test Conference
2002
Piscataway, New Jersey IEEE |
Schlagworte: | |
Beschreibung: | Conference number inferred. -- "IEEE Catalog Number 02CH37382"--verso of T.p. Includes bibliographic references and author index -- Also available via the World Wide Web. |
Beschreibung: | XVI, 1250 S. Ill. 29 cm |
ISBN: | 0780375424 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV039595871 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 110922s2002 xxua||| |||| 10||| eng d | ||
010 | |a 2003268803 | ||
020 | |a 0780375424 |9 0-7803-7542-4 | ||
035 | |a (OCoLC)756352900 | ||
035 | |a (DE-599)BVBBV039595871 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
044 | |a xxu |c US | ||
049 | |a DE-29T | ||
050 | 0 | |a TK7874 | |
111 | 2 | |a International Test Conference |n 33 |d 2002 |c Baltimore, Md. |j Verfasser |0 (DE-588)16182659-3 |4 aut | |
245 | 1 | 0 | |a Proceedings International Test Conference 2002 |
246 | 1 | 3 | |a ITC |
246 | 1 | 3 | |a ITC : International Test Conference 2000 |
264 | 1 | |a Washington, D.C. |b International Test Conference |c 2002 | |
264 | 1 | |a Piscataway, New Jersey |b IEEE | |
300 | |a XVI, 1250 S. |b Ill. |c 29 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Conference number inferred. -- "IEEE Catalog Number 02CH37382"--verso of T.p. | ||
500 | |a Includes bibliographic references and author index -- Also available via the World Wide Web. | ||
650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
650 | 4 | |a Electronic digital computers |x Circuits |x Testing |v Congresses | |
650 | 4 | |a Telecommunication |v Congresses | |
650 | 4 | |a Radio frequency |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
999 | |a oai:aleph.bib-bvb.de:BVB01-024446860 |
Datensatz im Suchindex
_version_ | 1804148433116725248 |
---|---|
any_adam_object | |
author_corporate | International Test Conference Baltimore, Md |
author_corporate_role | aut |
author_facet | International Test Conference Baltimore, Md |
author_sort | International Test Conference Baltimore, Md |
building | Verbundindex |
bvnumber | BV039595871 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
ctrlnum | (OCoLC)756352900 (DE-599)BVBBV039595871 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01471nam a2200409zc 4500</leader><controlfield tag="001">BV039595871</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">110922s2002 xxua||| |||| 10||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2003268803</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780375424</subfield><subfield code="9">0-7803-7542-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)756352900</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV039595871</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="n">33</subfield><subfield code="d">2002</subfield><subfield code="c">Baltimore, Md.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)16182659-3</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings International Test Conference 2002</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">ITC</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">ITC : International Test Conference 2000</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington, D.C.</subfield><subfield code="b">International Test Conference</subfield><subfield code="c">2002</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, New Jersey</subfield><subfield code="b">IEEE</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 1250 S.</subfield><subfield code="b">Ill.</subfield><subfield code="c">29 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Conference number inferred. -- "IEEE Catalog Number 02CH37382"--verso of T.p.</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographic references and author index -- Also available via the World Wide Web.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="x">Circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Telecommunication</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radio frequency</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-024446860</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV039595871 |
illustrated | Illustrated |
indexdate | 2024-07-10T00:07:03Z |
institution | BVB |
institution_GND | (DE-588)16182659-3 |
isbn | 0780375424 |
language | English |
lccn | 2003268803 |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024446860 |
oclc_num | 756352900 |
open_access_boolean | |
owner | DE-29T |
owner_facet | DE-29T |
physical | XVI, 1250 S. Ill. 29 cm |
publishDate | 2002 |
publishDateSearch | 2002 |
publishDateSort | 2002 |
publisher | International Test Conference IEEE |
record_format | marc |
spelling | International Test Conference 33 2002 Baltimore, Md. Verfasser (DE-588)16182659-3 aut Proceedings International Test Conference 2002 ITC ITC : International Test Conference 2000 Washington, D.C. International Test Conference 2002 Piscataway, New Jersey IEEE XVI, 1250 S. Ill. 29 cm txt rdacontent n rdamedia nc rdacarrier Conference number inferred. -- "IEEE Catalog Number 02CH37382"--verso of T.p. Includes bibliographic references and author index -- Also available via the World Wide Web. Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
spellingShingle | Proceedings International Test Conference 2002 Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses |
subject_GND | (DE-588)1071861417 |
title | Proceedings International Test Conference 2002 |
title_alt | ITC ITC : International Test Conference 2000 |
title_auth | Proceedings International Test Conference 2002 |
title_exact_search | Proceedings International Test Conference 2002 |
title_full | Proceedings International Test Conference 2002 |
title_fullStr | Proceedings International Test Conference 2002 |
title_full_unstemmed | Proceedings International Test Conference 2002 |
title_short | Proceedings International Test Conference 2002 |
title_sort | proceedings international test conference 2002 |
topic | Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses |
topic_facet | Integrated circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Telecommunication Congresses Radio frequency Congresses Konferenzschrift |
work_keys_str_mv | AT internationaltestconferencebaltimoremd proceedingsinternationaltestconference2002 AT internationaltestconferencebaltimoremd itc AT internationaltestconferencebaltimoremd itcinternationaltestconference2000 |