Proceedings of the ISMTII 2009: 29 June - 2 July, 2009, Saint-Petersburg, Russia Vol. 1 Keynote papers : Sessions 1. General problems of measurements. 2. Micro-nano-measurements and metrology. 3. Optical and X-ray tomography and interferometry
Gespeichert in:
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| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Moskva
Optical Society, Russia
2009
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| Beschreibung: | LXXV, 345 S. zahlr. Ill. u. graph. Darst. 1 CD-ROM |
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| spelling | International Symposium on Measurement Technology and Intelligent Instruments 9 2009 Sankt Petersburg Verfasser (DE-588)16015409-1 aut Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia Vol. 1 Keynote papers : Sessions 1. General problems of measurements. 2. Micro-nano-measurements and metrology. 3. Optical and X-ray tomography and interferometry 9th International Symposium on Measurement Technology and Intelligent Instruments Moskva Optical Society, Russia 2009 LXXV, 345 S. zahlr. Ill. u. graph. Darst. 1 CD-ROM txt rdacontent n rdamedia nc rdacarrier (DE-604)BV035040593 1 |
| spellingShingle | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia |
| title | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia |
| title_auth | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia |
| title_exact_search | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia |
| title_full | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia Vol. 1 Keynote papers : Sessions 1. General problems of measurements. 2. Micro-nano-measurements and metrology. 3. Optical and X-ray tomography and interferometry 9th International Symposium on Measurement Technology and Intelligent Instruments |
| title_fullStr | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia Vol. 1 Keynote papers : Sessions 1. General problems of measurements. 2. Micro-nano-measurements and metrology. 3. Optical and X-ray tomography and interferometry 9th International Symposium on Measurement Technology and Intelligent Instruments |
| title_full_unstemmed | Proceedings of the ISMTII 2009 29 June - 2 July, 2009, Saint-Petersburg, Russia Vol. 1 Keynote papers : Sessions 1. General problems of measurements. 2. Micro-nano-measurements and metrology. 3. Optical and X-ray tomography and interferometry 9th International Symposium on Measurement Technology and Intelligent Instruments |
| title_short | Proceedings of the ISMTII 2009 |
| title_sort | proceedings of the ismtii 2009 29 june 2 july 2009 saint petersburg russia keynote papers sessions 1 general problems of measurements 2 micro nano measurements and metrology 3 optical and x ray tomography and interferometry |
| title_sub | 29 June - 2 July, 2009, Saint-Petersburg, Russia |
| volume_link | (DE-604)BV035040593 |
| work_keys_str_mv | AT internationalsymposiumonmeasurementtechnologyandintelligentinstrumentssanktpetersburg proceedingsoftheismtii200929june2july2009saintpetersburgrussiavol1 |