Failure analysis: a practical guide for manufacturers of electronic components and systems
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester
Wiley
2011
|
| Ausgabe: | 1. publ. |
| Schriftenreihe: | Wiley series in quality & reliability engineering
|
| Schlagworte: | |
| Beschreibung: | XXII, 317 S. Ill., graph. Darst. |
| ISBN: | 9780470748244 9781119990093 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV039108640 | ||
| 003 | DE-604 | ||
| 005 | 20161222 | ||
| 007 | t | ||
| 008 | 110629s2011 xxuad|| |||| 00||| eng d | ||
| 010 | |a 2010046383 | ||
| 020 | |a 9780470748244 |c hardback |9 978-0-470-74824-4 | ||
| 020 | |a 9781119990093 |c Obook |9 978-1-119-99009-3 | ||
| 035 | |a (OCoLC)723524023 | ||
| 035 | |a (DE-599)BVBBV039108640 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-1050 |a DE-83 |a DE-634 |a DE-862 | ||
| 050 | 0 | |a TK7870.23 | |
| 082 | 0 | |a 621.381 | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 100 | 1 | |a Bâzu, Marius I. |d 1948- |e Verfasser |0 (DE-588)120876159 |4 aut | |
| 245 | 1 | 0 | |a Failure analysis |b a practical guide for manufacturers of electronic components and systems |c Marius Bâzu ; Titu Bâjenescu |
| 250 | |a 1. publ. | ||
| 264 | 1 | |a Chichester |b Wiley |c 2011 | |
| 300 | |a XXII, 317 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Wiley series in quality & reliability engineering | |
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability | |
| 650 | 4 | |a Electronic systems |x Testing | |
| 650 | 4 | |a System failures (Engineering) |x Prevention | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Quality Control |2 bisacsh | |
| 700 | 1 | |a Băjenescu, Titu I. |d 1938- |e Verfasser |0 (DE-588)120876124 |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, EPUB |z 978-1-119-99000-0 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, PDF |z 978-1-119-99010-9 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-022652406 | ||
Datensatz im Suchindex
| DE-BY-862_location | 2000 |
|---|---|
| DE-BY-FWS_call_number | 2000/ZN 4040 B364 |
| DE-BY-FWS_katkey | 415442 |
| DE-BY-FWS_media_number | 083000504315 |
| _version_ | 1806176174769963008 |
| any_adam_object | |
| author | Bâzu, Marius I. 1948- Băjenescu, Titu I. 1938- |
| author_GND | (DE-588)120876159 (DE-588)120876124 |
| author_facet | Bâzu, Marius I. 1948- Băjenescu, Titu I. 1938- |
| author_role | aut aut |
| author_sort | Bâzu, Marius I. 1948- |
| author_variant | m i b mi mib t i b ti tib |
| building | Verbundindex |
| bvnumber | BV039108640 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870.23 |
| callnumber-search | TK7870.23 |
| callnumber-sort | TK 47870.23 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)723524023 (DE-599)BVBBV039108640 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. publ. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01603nam a2200433zc 4500</leader><controlfield tag="001">BV039108640</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20161222 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">110629s2011 xxuad|| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2010046383</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780470748244</subfield><subfield code="c">hardback</subfield><subfield code="9">978-0-470-74824-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119990093</subfield><subfield code="c">Obook</subfield><subfield code="9">978-1-119-99009-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)723524023</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV039108640</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1050</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-862</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870.23</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bâzu, Marius I.</subfield><subfield code="d">1948-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)120876159</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Failure analysis</subfield><subfield code="b">a practical guide for manufacturers of electronic components and systems</subfield><subfield code="c">Marius Bâzu ; Titu Bâjenescu</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. publ.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chichester</subfield><subfield code="b">Wiley</subfield><subfield code="c">2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXII, 317 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Wiley series in quality & reliability engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic systems</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">System failures (Engineering)</subfield><subfield code="x">Prevention</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Quality Control</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Băjenescu, Titu I.</subfield><subfield code="d">1938-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)120876124</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe, EPUB</subfield><subfield code="z">978-1-119-99000-0</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe, PDF</subfield><subfield code="z">978-1-119-99010-9</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-022652406</subfield></datafield></record></collection> |
| id | DE-604.BV039108640 |
| illustrated | Illustrated |
| indexdate | 2024-08-01T11:17:08Z |
| institution | BVB |
| isbn | 9780470748244 9781119990093 |
| language | English |
| lccn | 2010046383 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022652406 |
| oclc_num | 723524023 |
| open_access_boolean | |
| owner | DE-1050 DE-83 DE-634 DE-862 DE-BY-FWS |
| owner_facet | DE-1050 DE-83 DE-634 DE-862 DE-BY-FWS |
| physical | XXII, 317 S. Ill., graph. Darst. |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley series in quality & reliability engineering |
| spellingShingle | Bâzu, Marius I. 1948- Băjenescu, Titu I. 1938- Failure analysis a practical guide for manufacturers of electronic components and systems Electronic apparatus and appliances Reliability Electronic systems Testing System failures (Engineering) Prevention TECHNOLOGY & ENGINEERING / Quality Control bisacsh |
| title | Failure analysis a practical guide for manufacturers of electronic components and systems |
| title_auth | Failure analysis a practical guide for manufacturers of electronic components and systems |
| title_exact_search | Failure analysis a practical guide for manufacturers of electronic components and systems |
| title_full | Failure analysis a practical guide for manufacturers of electronic components and systems Marius Bâzu ; Titu Bâjenescu |
| title_fullStr | Failure analysis a practical guide for manufacturers of electronic components and systems Marius Bâzu ; Titu Bâjenescu |
| title_full_unstemmed | Failure analysis a practical guide for manufacturers of electronic components and systems Marius Bâzu ; Titu Bâjenescu |
| title_short | Failure analysis |
| title_sort | failure analysis a practical guide for manufacturers of electronic components and systems |
| title_sub | a practical guide for manufacturers of electronic components and systems |
| topic | Electronic apparatus and appliances Reliability Electronic systems Testing System failures (Engineering) Prevention TECHNOLOGY & ENGINEERING / Quality Control bisacsh |
| topic_facet | Electronic apparatus and appliances Reliability Electronic systems Testing System failures (Engineering) Prevention TECHNOLOGY & ENGINEERING / Quality Control |
| work_keys_str_mv | AT bazumariusi failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems AT bajenescutitui failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems |
THWS Schweinfurt Zentralbibliothek Lesesaal
| Signatur: |
2000 ZN 4040 B364 |
|---|---|
| Exemplar 1 | ausleihbar Verfügbar Bestellen |