Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
London
Institution of Engineering and Technology
2008
|
| Ausgabe: | 1. publ. |
| Schriftenreihe: | Circuits, devices and systems series
19 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xx, 389 p.) graph. Darst. 24 cm |
| ISBN: | 9781615833153 9780863417450 |
Internformat
MARC
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| 245 | 1 | 0 | |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits |b the system on chip approach |c ed. by Yichuang Sun |
| 250 | |a 1. publ. | ||
| 264 | 1 | |a London |b Institution of Engineering and Technology |c 2008 | |
| 300 | |a 1 Online-Ressource (xx, 389 p.) |b graph. Darst. |c 24 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Circuits, devices and systems series |v 19 | |
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Linear integrated circuits / Testing | |
| 650 | 4 | |a Mixed signal circuits / Testing | |
| 650 | 4 | |a Radio frequency integrated circuits / Testing | |
| 650 | 4 | |a Linear integrated circuits |x Testing | |
| 650 | 4 | |a Mixed signal circuits |x Testing | |
| 650 | 4 | |a Radio frequency integrated circuits |x Testing | |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Funktionstest |0 (DE-588)4155698-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hochfrequenzschaltung |0 (DE-588)4160147-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mixed-Signal-Schaltung |0 (DE-588)4756481-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Analoge integrierte Schaltung |0 (DE-588)4112519-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
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| 689 | 0 | 4 | |a Funktionstest |0 (DE-588)4155698-7 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Sun, Yichuang |e Sonstige |4 oth | |
| 830 | 0 | |a Circuits, devices and systems series |v 19 |w (DE-604)BV035311331 |9 19 | |
| 856 | 4 | 0 | |u http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=2984 |3 Volltext |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 912 | |a ZDB-10-ESC | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-022633033 | |
Datensatz im Suchindex
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | ZDB-10-ESC |
| ctrlnum | (OCoLC)862020192 (DE-599)BVBBV037481466 |
| dewey-full | 621.38150287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38150287 |
| dewey-search | 621.38150287 |
| dewey-sort | 3621.38150287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. publ. |
| format | Electronic eBook |
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| id | DE-604.BV037481466 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-31T01:10:26Z |
| institution | BVB |
| isbn | 9781615833153 9780863417450 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022633033 |
| oclc_num | 862020192 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (xx, 389 p.) graph. Darst. 24 cm |
| psigel | ZDB-10-ESC |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Institution of Engineering and Technology |
| record_format | marc |
| series | Circuits, devices and systems series |
| series2 | Circuits, devices and systems series |
| spelling | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun 1. publ. London Institution of Engineering and Technology 2008 1 Online-Ressource (xx, 389 p.) graph. Darst. 24 cm txt rdacontent c rdamedia cr rdacarrier Circuits, devices and systems series 19 Includes bibliographical references and index Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Funktionstest (DE-588)4155698-7 gnd rswk-swf Hochfrequenzschaltung (DE-588)4160147-6 gnd rswk-swf Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Analoge integrierte Schaltung (DE-588)4112519-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Analoge integrierte Schaltung (DE-588)4112519-8 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Hochfrequenzschaltung (DE-588)4160147-6 s Funktionstest (DE-588)4155698-7 s 1\p DE-604 Sun, Yichuang Sonstige oth Circuits, devices and systems series 19 (DE-604)BV035311331 19 http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=2984 Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach Circuits, devices and systems series Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4155698-7 (DE-588)4160147-6 (DE-588)4756481-7 (DE-588)4112519-8 |
| title | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_auth | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_exact_search | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_full | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
| title_fullStr | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
| title_full_unstemmed | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
| title_short | Test and diagnosis of analogue, mixed-signal and RF integrated circuits |
| title_sort | test and diagnosis of analogue mixed signal and rf integrated circuits the system on chip approach |
| title_sub | the system on chip approach |
| topic | Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd |
| topic_facet | Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung Funktionstest Hochfrequenzschaltung Mixed-Signal-Schaltung Analoge integrierte Schaltung |
| url | http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=2984 |
| volume_link | (DE-604)BV035311331 |
| work_keys_str_mv | AT sunyichuang testanddiagnosisofanaloguemixedsignalandrfintegratedcircuitsthesystemonchipapproach |