Extended defects in semiconductors: electronic properties, device effects and structures
Gespeichert in:
Hauptverfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Cambridge [u.a.]
Cambridge University Press
2007
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Ausgabe: | 1. publ. |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | 1 Online-Ressource (XI, 631 S.) Ill., graph. Darst. |
ISBN: | 9780511276880 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV037438460 | ||
003 | DE-604 | ||
005 | 20131112 | ||
007 | cr|uuu---uuuuu | ||
008 | 110606s2007 xxu|||| o||u| ||||||eng d | ||
020 | |a 9780511276880 |9 978-0-511-27688-0 | ||
020 | |a 9780511276880 |c Online |9 978-0-511-27688-0 | ||
035 | |a (OCoLC)890536995 | ||
035 | |a (DE-599)BVBBV037438460 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
044 | |a xxu |c US | ||
050 | 0 | |a TK7871.852 | |
082 | 0 | |a 621.3815/2 | |
084 | |a UP 2100 |0 (DE-625)146354: |2 rvk | ||
084 | |a UQ 2400 |0 (DE-625)146493: |2 rvk | ||
084 | |a PHY 685f |2 stub | ||
100 | 1 | |a Holt, David B. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Extended defects in semiconductors |b electronic properties, device effects and structures |c D. B. Holt ; B. G. Yacobi |
250 | |a 1. publ. | ||
264 | 1 | |a Cambridge [u.a.] |b Cambridge University Press |c 2007 | |
300 | |a 1 Online-Ressource (XI, 631 S.) |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
650 | 4 | |a Semiconducteurs - Défauts | |
650 | 4 | |a Semiconductors |x Defects | |
650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Yacobi, B. G. |e Verfasser |4 aut | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 978-0-521-81934-3 |
856 | 4 | 0 | |u http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=3540 |3 Volltext |
912 | |a ZDB-10-ESC | ||
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-022590443 |
Datensatz im Suchindex
_version_ | 1806054956905529344 |
---|---|
adam_text | |
any_adam_object | |
author | Holt, David B. Yacobi, B. G. |
author_facet | Holt, David B. Yacobi, B. G. |
author_role | aut aut |
author_sort | Holt, David B. |
author_variant | d b h db dbh b g y bg bgy |
building | Verbundindex |
bvnumber | BV037438460 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871.852 |
callnumber-search | TK7871.852 |
callnumber-sort | TK 47871.852 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | UP 2100 UQ 2400 |
classification_tum | PHY 685f |
collection | ZDB-10-ESC |
ctrlnum | (OCoLC)890536995 (DE-599)BVBBV037438460 |
dewey-full | 621.3815/2 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/2 |
dewey-search | 621.3815/2 |
dewey-sort | 3621.3815 12 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 1. publ. |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV037438460</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20131112</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">110606s2007 xxu|||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511276880</subfield><subfield code="9">978-0-511-27688-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511276880</subfield><subfield code="c">Online</subfield><subfield code="9">978-0-511-27688-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)890536995</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV037438460</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.852</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2100</subfield><subfield code="0">(DE-625)146354:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 2400</subfield><subfield code="0">(DE-625)146493:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 685f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Holt, David B.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Extended defects in semiconductors</subfield><subfield code="b">electronic properties, device effects and structures</subfield><subfield code="c">D. B. Holt ; B. G. Yacobi</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. publ.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge [u.a.]</subfield><subfield code="b">Cambridge University Press</subfield><subfield code="c">2007</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XI, 631 S.)</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconducteurs - Défauts</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yacobi, B. G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-0-521-81934-3</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=3540</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-ESC</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-022590443</subfield></datafield></record></collection> |
id | DE-604.BV037438460 |
illustrated | Illustrated |
indexdate | 2024-07-31T01:10:26Z |
institution | BVB |
isbn | 9780511276880 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022590443 |
oclc_num | 890536995 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource (XI, 631 S.) Ill., graph. Darst. |
psigel | ZDB-10-ESC |
publishDate | 2007 |
publishDateSearch | 2007 |
publishDateSort | 2007 |
publisher | Cambridge University Press |
record_format | marc |
spelling | Holt, David B. Verfasser aut Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi 1. publ. Cambridge [u.a.] Cambridge University Press 2007 1 Online-Ressource (XI, 631 S.) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Semiconducteurs - Défauts Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Yacobi, B. G. Verfasser aut Erscheint auch als Druck-Ausgabe, Hardcover 978-0-521-81934-3 http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=3540 Volltext |
spellingShingle | Holt, David B. Yacobi, B. G. Extended defects in semiconductors electronic properties, device effects and structures Semiconducteurs - Défauts Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
subject_GND | (DE-588)4022993-2 (DE-588)4125030-8 |
title | Extended defects in semiconductors electronic properties, device effects and structures |
title_auth | Extended defects in semiconductors electronic properties, device effects and structures |
title_exact_search | Extended defects in semiconductors electronic properties, device effects and structures |
title_full | Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi |
title_fullStr | Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi |
title_full_unstemmed | Extended defects in semiconductors electronic properties, device effects and structures D. B. Holt ; B. G. Yacobi |
title_short | Extended defects in semiconductors |
title_sort | extended defects in semiconductors electronic properties device effects and structures |
title_sub | electronic properties, device effects and structures |
topic | Semiconducteurs - Défauts Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
topic_facet | Semiconducteurs - Défauts Semiconductors Defects Halbleiter Gitterbaufehler |
url | http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=3540 |
work_keys_str_mv | AT holtdavidb extendeddefectsinsemiconductorselectronicpropertiesdeviceeffectsandstructures AT yacobibg extendeddefectsinsemiconductorselectronicpropertiesdeviceeffectsandstructures |