Handbook of surface and nanometrology:
Gespeichert in:
1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Boca Raton, FL [u.a.]
CRC Press
2011
|
Ausgabe: | 2. ed. |
Schlagworte: | |
Beschreibung: | XXIII, 975 S. Ill., graph. Darst. |
ISBN: | 9781420082012 |
Internformat
MARC
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035 | |a (OCoLC)730023349 | ||
035 | |a (DE-599)BVBBV037393974 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-29T |a DE-11 |a DE-91G |a DE-862 | ||
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084 | |a 11 |2 ssgn | ||
084 | |a PHY 160b |2 stub | ||
100 | 1 | |a Whitehouse, David J. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Handbook of surface and nanometrology |c David J. Whitehouse |
250 | |a 2. ed. | ||
264 | 1 | |a Boca Raton, FL [u.a.] |b CRC Press |c 2011 | |
300 | |a XXIII, 975 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Surfaces (Technology) |x Measurement | |
650 | 0 | 7 | |a Nanometerbereich |0 (DE-588)4327473-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Oberflächenmessung |0 (DE-588)4172249-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
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689 | 1 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-022546806 |
Datensatz im Suchindex
DE-BY-862_location | 2000 |
---|---|
DE-BY-FWS_call_number | 2000/ZM 7605 W593(2) |
DE-BY-FWS_katkey | 519191 |
DE-BY-FWS_media_number | 083000510466 083000510465 |
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any_adam_object | |
author | Whitehouse, David J. |
author_facet | Whitehouse, David J. |
author_role | aut |
author_sort | Whitehouse, David J. |
author_variant | d j w dj djw |
building | Verbundindex |
bvnumber | BV037393974 |
callnumber-first | T - Technology |
callnumber-label | TA418 |
callnumber-raw | TA418.7 |
callnumber-search | TA418.7 |
callnumber-sort | TA 3418.7 |
callnumber-subject | TA - General and Civil Engineering |
classification_rvk | UP 7500 ZM 7605 |
classification_tum | MSR 010b PHY 160b |
ctrlnum | (OCoLC)730023349 (DE-599)BVBBV037393974 |
dewey-full | 620.110287 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.110287 |
dewey-search | 620.110287 |
dewey-sort | 3620.110287 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik |
edition | 2. ed. |
format | Book |
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id | DE-604.BV037393974 |
illustrated | Illustrated |
indexdate | 2024-12-06T04:01:14Z |
institution | BVB |
isbn | 9781420082012 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022546806 |
oclc_num | 730023349 |
open_access_boolean | |
owner | DE-29T DE-11 DE-91G DE-BY-TUM DE-862 DE-BY-FWS |
owner_facet | DE-29T DE-11 DE-91G DE-BY-TUM DE-862 DE-BY-FWS |
physical | XXIII, 975 S. Ill., graph. Darst. |
publishDate | 2011 |
publishDateSearch | 2011 |
publishDateSort | 2011 |
publisher | CRC Press |
record_format | marc |
spellingShingle | Whitehouse, David J. Handbook of surface and nanometrology Surfaces (Technology) Measurement Nanometerbereich (DE-588)4327473-0 gnd Oberflächenmessung (DE-588)4172249-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
subject_GND | (DE-588)4327473-0 (DE-588)4172249-8 (DE-588)4172243-7 |
title | Handbook of surface and nanometrology |
title_auth | Handbook of surface and nanometrology |
title_exact_search | Handbook of surface and nanometrology |
title_full | Handbook of surface and nanometrology David J. Whitehouse |
title_fullStr | Handbook of surface and nanometrology David J. Whitehouse |
title_full_unstemmed | Handbook of surface and nanometrology David J. Whitehouse |
title_short | Handbook of surface and nanometrology |
title_sort | handbook of surface and nanometrology |
topic | Surfaces (Technology) Measurement Nanometerbereich (DE-588)4327473-0 gnd Oberflächenmessung (DE-588)4172249-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
topic_facet | Surfaces (Technology) Measurement Nanometerbereich Oberflächenmessung Oberflächenanalyse |
work_keys_str_mv | AT whitehousedavidj handbookofsurfaceandnanometrology |