APA (7th ed.) Citation

(2011). Electromigration in thin films and electronic devices: Materials and reliability. Woodhead.

Chicago Style (17th ed.) Citation

Electromigration in Thin Films and Electronic Devices: Materials and Reliability. Oxford [u.a.]: Woodhead, 2011.

MLA (9th ed.) Citation

Electromigration in Thin Films and Electronic Devices: Materials and Reliability. Woodhead, 2011.

Warning: These citations may not always be 100% accurate.