Electromigration in thin films and electronic devices: materials and reliability
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Woodhead
2011
|
| Schriftenreihe: | Woodhead publishing in materials
|
| Schlagworte: | |
| Beschreibung: | XII, 340 S. Ill., graph. Darst. |
| ISBN: | 9781845699376 |
Internformat
MARC
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| 020 | |a 9781845699376 |9 978-1-84569-937-6 | ||
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Datensatz im Suchindex
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| id | DE-604.BV037391303 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T23:23:18Z |
| institution | BVB |
| isbn | 9781845699376 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022544187 |
| oclc_num | 713610407 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XII, 340 S. Ill., graph. Darst. |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Woodhead |
| record_format | marc |
| series2 | Woodhead publishing in materials |
| spelling | Electromigration in thin films and electronic devices materials and reliability ed. by Choong-Un Kim Oxford [u.a.] Woodhead 2011 XII, 340 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Woodhead publishing in materials Elektronenbeweglichkeit (DE-588)4151863-9 gnd rswk-swf Lückenschicht (DE-588)4342731-5 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Elektronenbeweglichkeit (DE-588)4151863-9 s Dünne Schicht (DE-588)4136925-7 s DE-604 Lückenschicht (DE-588)4342731-5 s Kim, Choong-Un Sonstige oth |
| spellingShingle | Electromigration in thin films and electronic devices materials and reliability Elektronenbeweglichkeit (DE-588)4151863-9 gnd Lückenschicht (DE-588)4342731-5 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4151863-9 (DE-588)4342731-5 (DE-588)4136925-7 |
| title | Electromigration in thin films and electronic devices materials and reliability |
| title_auth | Electromigration in thin films and electronic devices materials and reliability |
| title_exact_search | Electromigration in thin films and electronic devices materials and reliability |
| title_full | Electromigration in thin films and electronic devices materials and reliability ed. by Choong-Un Kim |
| title_fullStr | Electromigration in thin films and electronic devices materials and reliability ed. by Choong-Un Kim |
| title_full_unstemmed | Electromigration in thin films and electronic devices materials and reliability ed. by Choong-Un Kim |
| title_short | Electromigration in thin films and electronic devices |
| title_sort | electromigration in thin films and electronic devices materials and reliability |
| title_sub | materials and reliability |
| topic | Elektronenbeweglichkeit (DE-588)4151863-9 gnd Lückenschicht (DE-588)4342731-5 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | Elektronenbeweglichkeit Lückenschicht Dünne Schicht |
| work_keys_str_mv | AT kimchoongun electromigrationinthinfilmsandelectronicdevicesmaterialsandreliability |