Testing complex and embedded systems:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton, Fla [u.a.]
CRC Press, Taylor & Francis Group
2011
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | XXXI, 287 S. graph. Darst. |
| ISBN: | 9781439821404 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV037365697 | ||
| 003 | DE-604 | ||
| 005 | 20110520 | ||
| 007 | t | ||
| 008 | 110426s2011 xxud||| |||| 00||| eng d | ||
| 010 | |a 2010043713 | ||
| 020 | |a 9781439821404 |c hardback |9 978-1-439-82140-4 | ||
| 035 | |a (OCoLC)712434950 | ||
| 035 | |a (DE-599)BVBBV037365697 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-29T |a DE-83 | ||
| 050 | 0 | |a TK7895.E42 | |
| 082 | 0 | |a 004.16 | |
| 084 | |a ST 153 |0 (DE-625)143597: |2 rvk | ||
| 100 | 1 | |a Pries, Kim H. |d 1955- |e Verfasser |0 (DE-588)1011430959 |4 aut | |
| 245 | 1 | 0 | |a Testing complex and embedded systems |c Kim H. Pries ; Jon M. Quigley |
| 264 | 1 | |a Boca Raton, Fla [u.a.] |b CRC Press, Taylor & Francis Group |c 2011 | |
| 300 | |a XXXI, 287 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Embedded computer systems |x Testing | |
| 650 | 7 | |a COMPUTERS / Software Development & Engineering / General |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / General |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Engineering (General) |2 bisacsh | |
| 650 | 0 | 7 | |a Komplexes System |0 (DE-588)4114261-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Eingebettetes System |0 (DE-588)4396978-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Eingebettetes System |0 (DE-588)4396978-1 |D s |
| 689 | 0 | 1 | |a Komplexes System |0 (DE-588)4114261-5 |D s |
| 689 | 0 | 2 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Quigley, Jon M. |d 1961- |e Verfasser |0 (DE-588)1011430797 |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-022519152 | ||
Datensatz im Suchindex
| _version_ | 1804145644709871616 |
|---|---|
| any_adam_object | |
| author | Pries, Kim H. 1955- Quigley, Jon M. 1961- |
| author_GND | (DE-588)1011430959 (DE-588)1011430797 |
| author_facet | Pries, Kim H. 1955- Quigley, Jon M. 1961- |
| author_role | aut aut |
| author_sort | Pries, Kim H. 1955- |
| author_variant | k h p kh khp j m q jm jmq |
| building | Verbundindex |
| bvnumber | BV037365697 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.E42 |
| callnumber-search | TK7895.E42 |
| callnumber-sort | TK 47895 E42 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 153 |
| ctrlnum | (OCoLC)712434950 (DE-599)BVBBV037365697 |
| dewey-full | 004.16 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 004 - Computer science |
| dewey-raw | 004.16 |
| dewey-search | 004.16 |
| dewey-sort | 14.16 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Informatik |
| format | Book |
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| id | DE-604.BV037365697 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T23:22:44Z |
| institution | BVB |
| isbn | 9781439821404 |
| language | English |
| lccn | 2010043713 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022519152 |
| oclc_num | 712434950 |
| open_access_boolean | |
| owner | DE-29T DE-83 |
| owner_facet | DE-29T DE-83 |
| physical | XXXI, 287 S. graph. Darst. |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | CRC Press, Taylor & Francis Group |
| record_format | marc |
| spelling | Pries, Kim H. 1955- Verfasser (DE-588)1011430959 aut Testing complex and embedded systems Kim H. Pries ; Jon M. Quigley Boca Raton, Fla [u.a.] CRC Press, Taylor & Francis Group 2011 XXXI, 287 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Embedded computer systems Testing COMPUTERS / Software Development & Engineering / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / General bisacsh TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh Komplexes System (DE-588)4114261-5 gnd rswk-swf Eingebettetes System (DE-588)4396978-1 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Eingebettetes System (DE-588)4396978-1 s Komplexes System (DE-588)4114261-5 s Testen (DE-588)4367264-4 s DE-604 Quigley, Jon M. 1961- Verfasser (DE-588)1011430797 aut |
| spellingShingle | Pries, Kim H. 1955- Quigley, Jon M. 1961- Testing complex and embedded systems Embedded computer systems Testing COMPUTERS / Software Development & Engineering / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / General bisacsh TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh Komplexes System (DE-588)4114261-5 gnd Eingebettetes System (DE-588)4396978-1 gnd Testen (DE-588)4367264-4 gnd |
| subject_GND | (DE-588)4114261-5 (DE-588)4396978-1 (DE-588)4367264-4 |
| title | Testing complex and embedded systems |
| title_auth | Testing complex and embedded systems |
| title_exact_search | Testing complex and embedded systems |
| title_full | Testing complex and embedded systems Kim H. Pries ; Jon M. Quigley |
| title_fullStr | Testing complex and embedded systems Kim H. Pries ; Jon M. Quigley |
| title_full_unstemmed | Testing complex and embedded systems Kim H. Pries ; Jon M. Quigley |
| title_short | Testing complex and embedded systems |
| title_sort | testing complex and embedded systems |
| topic | Embedded computer systems Testing COMPUTERS / Software Development & Engineering / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / General bisacsh TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh Komplexes System (DE-588)4114261-5 gnd Eingebettetes System (DE-588)4396978-1 gnd Testen (DE-588)4367264-4 gnd |
| topic_facet | Embedded computer systems Testing COMPUTERS / Software Development & Engineering / General TECHNOLOGY & ENGINEERING / Electronics / General TECHNOLOGY & ENGINEERING / Engineering (General) Komplexes System Eingebettetes System Testen |
| work_keys_str_mv | AT prieskimh testingcomplexandembeddedsystems AT quigleyjonm testingcomplexandembeddedsystems |