Advanced characterization techniques for thin film solar cells:
Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research meth...
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| Zusammenfassung: | Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film sol |
| Beschreibung: | Hier auch später erschienene, unveränderte Nachdrucke |
| Beschreibung: | XXXVI, 547 S. Ill., graph. Darst. |
| ISBN: | 9783527410033 |
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| 245 | 1 | 0 | |a Advanced characterization techniques for thin film solar cells |c ed. by Daniel Abou-Ras ... |
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| 300 | |a XXXVI, 547 S. |b Ill., graph. Darst. | ||
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| 500 | |a Hier auch später erschienene, unveränderte Nachdrucke | ||
| 520 | 1 | |a Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film sol | |
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IMAGE 1
CONTENTS
PREFACE XVII LIST OF CONTRIBUTORS XXI
ACKNOWLEDGMENTS XXVII
ABBREVIATIONS XXXI
PART ONE INTRODUCTION 1
1 INTRODUCTION TO THIN-FILM PHOTOVOLTAICS 3 THOMAS KIRCHARTZ AND UWE RAU
1.1 INTRODUCTION 3
1.2 THE PHOTOVOLTAIC PRINCIPLE 5
1.2.1 THE SHOCKLEY-QUEISSER THEORY 5 1.2.2 FROM THE IDEAL SOLAR CELL TO
REAL SOLAR CELLS 9 1.2.3 LIGHT ABSORPTION AND LIGHT TRAPPING 10 1.2.4
CHARGE EXTRACTION 12
1.2.5 NONRADIATIVE RECOMBINATION 16 1.3 FUNCTIONAL LAYERS IN THIN-FILM
SOLAR CELLS 18 1.4 COMPARISON OF VARIOUS THIN-FILM SOLAR-CELL TYPES 20
1.4.1 CU(IN,GA)SE 2 20
1.4.1.1 BASIC PROPERTIES AND TECHNOLOGY 20 1.4.1.2 LAYER-STACKING
SEQUENCE AND BAND DIAGRAM OF THE HETEROSTRUCTURE 22
1.4.2 CDTE 23
1.4.2.1 BASIC PROPERTIES AND TECHNOLOGY 23 1.4.2.2 LAYER-STACKING
SEQUENCE AND BAND DIAGRAM OF THE HETEROSTRUCTURE 24 1.4.3 THIN-FILM
SILICON SOLAR CELLS 25 1.4.3.1 HYDROGENATED AMORPHOUS SI (A-SI:H) 25
1.4.3.2 METASTABILITY IN A-SI:H: THE STAEBLER-WRONSKI EFFECT 27 1.4.3.3
HYDROGENATED MICROCRYSTALLINE SILICON (JXC-SI:H) 27
BIBLIOGRAFISCHE INFORMATIONEN HTTP://D-NB.INFO/1007027711
DIGITALISIERT DURCH
IMAGE 2
VI CONTENTS
1.4.3.4 MICROMORPH TANDEM SOLAR CELLS 27
1.5 CONCLUSIONS 28
REFERENCES 28
PART TWO DEVICE CHARACTERIZATION 33
2 FUNDAMENTAL ELECTRICAL CHARACTERIZATION OF THIN-FILM SOLAR CELLS 35
THOMAS KIRCHARTZ, KAINING DING, AND UWE RAU 2.1 INTRODUCTION 35
2.2 CURRENT/VOLTAGE CURVES 36
2.2.1 SHAPE OF CURRENT/VOLTAGE CURVES AND THEIR DESCRIPTION WITH
EQUIVALENT CIRCUIT MODELS 36 2.2.2 MEASUREMENT OF CURRENT/VOLTAGE CURVES
41 2.2.3 DETERMINATION OF IDEALITY FACTORS AND SERIES RESISTANCES 42
2.2.4 TEMPERATURE-DEPENDENT CURRENT/VOLTAGE MEASUREMENTS 44 2.3 QUANTUM
EFFICIENCY MEASUREMENTS 47 2.3.1 DEFINITION 47
2.3.2 MEASUREMENT PRINCIPLE AND CALIBRATION 49 2.3.3 QUANTUM EFFICIENCY
MEASUREMENTS OF TANDEM SOLAR CELLS 51 2.3.4 DIFFERENTIAL SPECTRAL
RESPONSE (DSR) MEASUREMENTS 52 2.3.5 INTERPRETATION OF QUANTUM
EFFICIENCY MEASUREMENTS IN THIN-FILM
SILICON SOLAR CELLS 53 REFERENCES 58
3 ELECTROLUMINESCENCE ANALYSIS OF SOLAR CELLS AND SOLAR MODULES 61
THOMAS KIRCHARTZ, ANKE HEIBIG, BART E. PIETERS, AND UWE RAU 3.1
INTRODUCTION 61
3.2 BASICS 62
3.3 SPECTRALLY RESOLVED ELECTROLUMINESCENCE 65 3.4 SPATIALLY RESOLVED
ELECTROLUMINESCENCE OF C-SI SOLAR CELLS 68 3.5 ELECTROLUMINESCENCE
IMAGING OF CU(IN,GA)SE 2 THIN-FILM MODULES 71
3.6 MODELING OF SPATIALLY RESOLVED ELECTROLUMINESCENCE 75 REFERENCES 77
4 CAPACITANCE SPECTROSCOPY OF THIN-FILM SOLAR CELLS 81 JENNIFER HEATH
AND PAWEL ZABIEROWSKI 4.1 INTRODUCTION 81
4.2 ADMITTANCE BASICS 82
4.3 SAMPLE REQUIREMENTS 83
4.4 INSTRUMENTATION 84
4.5 CAPACITANCE-VOLTAGE PROFILING AND THE DEPLETION APPROXIMATION 85 4.6
ADMITTANCE RESPONSE OF DEEP STATES 86 4.7 THE INFLUENCE OF DEEP STATES
ON CV PROFILES 90
4.8 DLTS 91
IMAGE 3
CONTENTS VII
4.8.1 DLTS OF THIN-FILM PV DEVICES 94
4.9 ADMITTANCE SPECTROSCOPY 95
4.10 DRIVE LEVEL CAPACITANCE PROFILING 97 4.11 PHOTOCAPACITANCE 98
4.12 THE MEYER-NELDEL RULE 99
4.13 SPATIAL INHOMOGENEITIES AND INTERFACE STATES 100 4.14 METASTABILITY
102
REFERENCES 102
PART THREE MATERIALS CHARACTERIZATION 107
5 CHARACTERIZING THE LIGHT-TRAPPING PROPERTIES OF TEXTURED SURFACES WITH
SCANNING NEAR-FIELD OPTICAL MICROSCOPY 109 KARSTEN BITTKAU
5.1 INTRODUCTION 109
5.2 HOW DOES A SCANNING NEAR-FIELD OPTICAL MICROSCOPE WORK? 110 5.3
LIGHT SCATTERING IN THE WAVE PICTURE 112 5.4 THE ROLE OF EVANESCENT
MODES FOR LIGHT TRAPPING 113 5.5 ANALYSIS OF SCANNING NEAR-FIELD OPTICAL
MICROSCOPY IMAGES BY FAST
FOURIER TRANSFORMATION 116 5.6 HOW TO EXTRACT FAR-FIELD SCATTERING
PROPERTIES BY SCANNING NEAR-FIELD OPTICAL MICROSCOPY? 120 5.7 CONCLUSION
122
REFERENCES 122
6 SPECTROSCOPIC ELLIPSOMETRY 125 SYLVAIN MARSILLAC, MICHELLE N. SESTAK,
JIAN LI, AND ROBERT W. COLLINS 6.1 INTRODUCTION 125
6.2 THEORY 127
6.2.1 POLARIZED LIGHT 127
6.2.2 REFLECTION FROM A SINGLE INTERFACE 128 6.3 ELLIPSOMETRY
INSTRUMENTATION 129 6.3.1 ROTATING ANALYZER SE FOR EX-SITU APPLICATIONS
130 6.3.2 ROTATING COMPENSATOR SE FOR REAL-TIME APPLICATIONS 131 6.4
DATA ANALYSIS 133
6.4.1 EXACT NUMERICAL INVERSION 133 6.4.2 LEAST-SQUARES REGRESSION 134
6.4.3 VIRTUAL INTERFACE ANALYSIS 134 6.5 RTSE OF THIN FILM PHOTOVOLTAICS
134
6.5.1 THIN SI:H 135
6.5.2 CDTE 139
6.5.3 CUINSE 2 141
6.6 SUMMARY AND FUTURE 145
6.7 DEFINITION OF VARIABLES 145
REFERENCES 146
IMAGE 4
VIII CONTENTS
7 PHOTOLUMINESCENCE ANALYSIS OF THIN-FILM SOLAR CELLS 151
THOMAS UNOLD AND LEVENT GUETAY 7.1 INTRODUCTION 151
7.2 EXPERIMENTAL ISSUES 154
7.2.1 DESIGN OF THE OPTICAL SYSTEM 154 7.2.2 CALIBRATION 356
7.2.3 CRYOSTAT 156
7.3 BASIC TRANSITIONS 157
7.3.1 EXCITONS 158
7.3.2 FREE-BOUND TRANSITIONS 159 7.3.3 DONOR-ACCEPTOR PAIR RECOMBINATION
160 7.3.4 POTENTIAL FLUCTUATIONS 162 7.3.5 BAND-BAND TRANSITIONS 163
7.4 CASE STUDIES 164
7A.I LOW-TEMPERATURE PHOTOLUMINESCENCE ANALYSIS 164 7.4.2
ROOM-TEMPERATURE MEASUREMENTS: ESTIMATION OF V OC FROM PL YIELD 168
7.4.3 SPATIALLY RESOLVED PHOTOLUMINESCENCE: ABSORBER
INHOMOGENEITIES 170 REFERENCES 173
8 STEADY-STATE PHOTOCARRIER CRATING METHOD 177 RUDOLF BRUEGGEMANN 8.1
INTRODUCTION 177
8.2 BASIC ANALYSIS OF SSPG AND PHOTOCURRENT RESPONSE 178 8.2.1 OPTICAL
MODEL 178
8.2.2 SEMICONDUCTOR EQUATIONS 180 8.2.3 DIFFUSION LENGTH:
RITTER-ZELDOV-WEISER ANALYSIS 181 8.2.3.1 EVALUATION SCHEMES 183 8.2.4
MORE DETAILED ANALYSES 184 8.2.4.1 INFLUENCE OF THE DARK CONDUCTIVITY
184 8.2.4.2 INFLUENCE OF TRAPS 184 8.2.4.3 MINORITY-CARRIER AND
MAJORITY-CARRIER MOBILITY-LIFETIME
PRODUCTS 186
8.3 EXPERIMENTAL SETUP 187
8.4 DATA ANALYSIS 189
8.5 RESULTS 192
8.5.1 HYDROGENATED AMORPHOUS SILICON 192 8.5.1.1 TEMPERATURE AND
GENERATION RATE DEPENDENCE 192 8.5.1.2 SURFACE RECOMBINATION 193 8.5.1.3
ELECTRIC-FIELD INFLUENCE 193 8.5.1.4 FERMI-LEVEL POSITION 194
8.5.1.5 DEFECTS AND LIGHT-INDUCED DEGRADATION 194 8.5.1.6 THIN-FILM
CHARACTERIZATION AND DEPOSITION METHODS 195 8.5.2 HYDROGENATED AMORPHOUS
SILICON ALLOYS 196
IMAGE 5
CONTENTS IX
8.5.3 HYDROGENATED MICROCRYSTALLINE SILICON 196
8.5.4 HYDROGENATED MICROCRYSTALLINE GERMANIUM 197 8.5.5 OTHER THIN-FILM
SEMICONDUCTORS 197 8.6 DENSITY-OF-STATES DETERMINATION 198 8.7 SUMMARY
198
REFERENCES 198
9 TIME-OF-FLIGHT ANALYSIS 203
TORSTEN BRONGER
9.1 INTRODUCTION 203
9.2 FUNDAMENTALS OF TO F MEASUREMENTS 204 9.2.1 ANOMALOUS DISPERSION 205
9.2.2 BASIC ELECTRONIC PROPERTIES OF THIN-FILM SEMICONDUCTORS 207 9.3
EXPERIMENTAL DETAILS 208
9.3.1 ACCOMPANYING MEASUREMENTS 210 9.3.1.1 CAPACITANCE 210 9.3.1.2
COLLECTION 212
9.3.1.3 BUILT-IN FIELD 212 9.3.2 CURRENT DECAY 212
9.3.3 CHARGE TRANSIENT 215
9.3.4 POSSIBLE PROBLEMS 217
9.3.4.1 DIELECTRIC RELAXATION 227 9.3.5 INHOMOGENEOUS FIELD 218 9.4
ANALYSIS OF TOF RESULTS 219
9.4.1 MULTIPLE TRAPPING 229 9.4.1.1 OVERVIEW OF THE PROCESSES 229
9.4.1.2 ENERGETIC DISTRIBUTION OF CARRIERS 220 9.4.1.3 TIME DEPENDENCE
OF ELECTRICAL CURRENT 223 9.4.2 SPATIAL CHARGE DISTRIBUTION 223 9.4.2.1
TEMPERATURE DEPENDENCE 223 9.4.3 DENSITY OF STATES 225
9.4.3.1 WIDTHS OF BAND TAILS 225 9.4.3.2 PROBING OF DEEP STATES 226
REFERENCES 228
10 ELECTRON-SPIN RESONANCE (ESR) IN HYDROGENATED AMORPHOUS SILICON
(A-SI:H) 232 KLAUS LIPS, MATTHIAS FEHR, AND JAN BEHRENDS 10.1
INTRODUCTION 231
10.2 BASICS OF ESR 232
10.3 HOW TO MEASURE ESR 235
10.3.1 ESR SETUP AND MEASUREMENT PROCEDURE 235 10.3.2 PULSE ESR 238
10.3.3 SAMPLE PREPARATION 239 10.4 THE G TENSOR AND HYPERFINE
INTERACTION IN DISORDERED SOLIDS 240
IMAGE 6
X CONTENTS
10.4.1 ZEEMAN ENERGY AND G TENSOR 240
10.4.2 HYPERFME INTERACTION 243 10.4.3 LINE-BROADENING MECHANISMS 245
10.5 DISCUSSION OF SELECTED RESULTS 248 10.5.1 ESR ON UNDOPED A-SI:H 248
10.5.2 LESR ON UNDOPED A-SI:H 252
10.5.3 ESR ON DOPED A-SI:H 253 10.5.4 LIGHT-INDUCED DEGRADATION IN
A-SI:H 257 10.5.4.1 EXCESS CHARGE-CARRIER RECOMBINATION AND WEAK SI-SI
BOND BREAKING 258
10.5.4.2 SI-H BOND DISSOCIATION AND HYDROGEN COLLISION MODEL 260
10.5.4.3 TRANSFORMATION OF EXISTING NONPARAMAGNETIC CHARGED
DANGLING-BOND DEFECTS 260 10.6 ALTERNATIVE ESR DETECTION 263
10.6.1 HISTORY OF EDMR 264 10.6.2 EDMR ON A-SI:H SOLAR CELLS 265 10.7
CONCLUDING REMARKS 268
REFERENCES 269
11 SCANNING PROBE MICROSCOPY ON INORGANIC THIN FILMS FOR SOLAR CELLS 275
SASCHA SADEWASSER AND IRIS VISOLY-FISHER 11.1 INTRODUCTION 275
11.2 EXPERIMENTAL BACKGROUND 276 11.2.1 ATOMIC FORCE MICROSCOPY 276
11.2.1.1 CONTACT MODE 277 11.2.1.2 NONCONTACT MODE 278 11.2.2 CONDUCTIVE
ATOMIC FORCE MICROSCOPY 279
11.2.3 SCANNING CAPACITANCE MICROSCOPY 280 11.2.4 KELVIN PROBE FORCE
MICROSCOPY 282 11.2.5 SCANNING TUNNELING MICROSCOPY 284 11.2.6 ISSUES OF
SAMPLE PREPARATION 285 11.3 SELECTED APPLICATIONS 286 11.3.1 SURFACE
HOMOGENEITY 286 11.3.2 GRAIN BOUNDARIES 288 11.3.3 CROSS-SECTIONAL
STUDIES 291
11.4 SUMMARY 294
REFERENCES 294
12 ELECTRON MICROSCOPY ON THIN FILMS FOR SOLAR CELLS 299 DANIEL
ABOU-RAS, MELANIE NICHTERWITZ, MANUELJ. ROMERO, AND SEBASTIAN S. SCHMIDT
12.1 INTRODUCTION 299
12.2 SCANNING ELECTRON MICROSCOPY 299 12.2.1 IMAGING TECHNIQUES 301
12.2.2 ELECTRON BACKSCATTER DIFFRACTION 302
IMAGE 7
CONTENTS XI
12.2.3 ENERGY-DISPERSIVE AND WAVELENGTH-DISPERSIVE X-RAY
SPECTROMETRY 305
12.2.4 ELECTRON-BEAM-INDUCED CURRENT MEASUREMENTS 307 12.2.4.1
ELECTRON-BEAM GENERATION 308 12.2.4.2 CHARGE-CARRIER COLLECTION IN A
SOLAR CELL 309 12.2.4.3 EXPERIMENTAL SETUPS 320 12.2.4.4 CRITICAL ISSUES
312 12.2.5 CATHODOLUMINESCENCE 322 12.2.5.1 EXAMPLE: SPECTRUM IMAGING OF
CDTE THIN FILMS 315 12.2.6 SCANNING PROBE AND S CANNING-PROBE MICROSCOPY
INTEGRATED PLATFORM 328 12.2.7 COMBINATION OF VARIOUS SCANNING ELECTRON
MICROSCOPY TECHNIQUES 322 12.3 TRANSMISSION ELECTRON MICROSCOPY 323
12.3.1 IMAGING TECHNIQUES 324 12.3.1.1 BRIGHT-FIELD AND DARK-FIELD
IMAGING IN THE CONVENTIONAL
MODE 324
12.3.1.2 HIGH-RESOLUTION IMAGING IN THE CONVENTIONAL MODE 325 12.3.1.3
IMAGING IN THE SCANNING MODE USING AN ANNULAR DARK-FIELD DETECTOR 327
12.3.2 ELECTRON DIFFRACTION 327 12.3.2.1 SELECTED-AREA ELECTRON
DIFFRACTION IN THE CONVENTIONAL MODE 327
12.3.2.2 CONVERGENT-BEAM ELECTRON DIFFRACTION IN THE SCANNING MODE 328
12.3.3 ELECTRON ENERGY-LOSS SPECTROMETRY AND ENERGY-FILTERED
TRANSMISSION ELECTRON MICROSCOPY 329 12.3.3.1 SCATTERING THEORY 329
12.3.3.2 EXPERIMENT AND SETUP 330 12.3.3.3 THE ENERGY-LOSS SPECTRUM 331
12.3.3.4 APPLICATIONS AND COMPARISON WITH EDX SPECTROSCOPY 334 12.3.4
OFF-AXIS AND IN-LINE ELECTRON HOLOGRAPHY 335 12.4 SAMPLE PREPARATION
TECHNIQUES 338 12.4.1 PREPARATION FOR SCANNING ELECTRON MICROSCOPY 338
12.4.2 PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY 339
REFERENCES 342
13 X-RAY AND NEUTRON DIFFRACTION ON MATERIALS FOR THIN-FILM SOLAR CELLS
347 SUSAN SCHORR, CHRISTIANE STEPHAN, TOBIAS TOERNDAHL, AND ROLAND MAINZ
13.1 INTRODUCTION 347
13.2 DIFFRACTION OF X-RAYS AND NEUTRON BY MATTER 347 13.3 NEUTRON POWDER
DIFFRACTION OF ABSORBER MATERIALS FOR THIN-FILM SOLAR CELLS 351 13.3.1
EXAMPLE: INVESTIGATION OF INTRINSIC POINT DEFECTS
IN NONSTOICHIOMETRIC CUINSE 2 BY NEUTRON DIFFRACTION 351 13.4 GRAZING
INCIDENCE X-RAY DIFFRACTION (GIXRD) 354
IMAGE 8
XII CONTENTS
13.5 ENERGY DISPERSIVE X-RAY DIFFRACTION (EDXRD) 357
REFERENCES 362
14 RAMAN SPECTROSCOPY ON THIN FILMS FOR SOLAR CELLS 365 JACOBO
ALVAREZ-GARCIA, VICTOR IZQUIERDO-ROCA, AND ALEJANDRO PEREZ-RODRIGUEZ
14.1 INTRODUCTION 365
14.2 FUNDAMENTALS OF RAMAN SPECTROSCOPY 366 14.3 VIBRATIONAL MODES IN
CRYSTALLINE MATERIALS 368 14.4 EXPERIMENTAL CONSIDERATIONS 370 14.4.1
LASER SOURCE 370
14.4.2 LIGHT COLLECTION AND FOCUSING OPTICS 372 14.4.3 SPECTROSCOPIC
MODULE 372 14.5 CHARACTERIZATION OF THIN-FILM PHOTOVOLTAIC MATERIALS 373
14.5.1 IDENTIFICATION OF CRYSTALLINE STRUCTURES 373
14.5.2 EVALUATION OF FILM CRYSTALLINITY 377 14.5.3 CHEMICAL ANALYSIS OF
SEMICONDUCTING ALLOYS 378 14.5.4 NANOCRYSTALLINE AND AMORPHOUS MATERIALS
380 14.5.5 EVALUATION OF STRESS 382
14.6 CONCLUSIONS 383
REFERENCES 384
15 SOFT X-RAY AND ELECTRON SPECTROSCOPY: A UNIQUE "TOOL CHEST" TO
CHARACTERIZE THE CHEMICAL AND ELECTRONIC PROPERTIES OF SURFACES AND
INTERFACES 387 MARCUS BAER, LOTHAR WEINHARDT, AND CLEMENS HESKE 15.1
INTRODUCTION 387
15.2 CHARACTERIZATION TECHNIQUES 388 15.3 PROBING THE CHEMICAL SURFACE
STRUCTURE: IMPACT OF WET CHEMICAL TREATMENTS ON THIN-FILM SOLAR CELL
ABSORBERS 394
15.4 PROBING THE ELECTRONIC SURFACE AND INTERFACE STRUCTURE: BAND
ALIGNMENT IN THIN-FILM SOLAR CELLS 399 15.5 SUMMARY 405
REFERENCES 405
16 ELEMENTAL DISTRIBUTION PROFILING OF THIN FILMS FOR SOLAR CELLS 412
VOLKER HOFFMANN, DENIS KLEMM, VARVARA EFIMOVA, CORNEL VENZAGO, ANGUS A.
ROCKETT, THOMAS WIRTH, TIM NUNNEY, CHRISTIAN A KAUFMANN, AND RAQUEL
CABALLERO
16.1 INTRODUCTION 411
16.2 GLOW DISCHARGE-OPTICAL EMISSION (GD-OES) AND GLOW DISCHARGE-MASS
SPECTROSCOPY (GD-MS) 413 16.2.1 PRINCIPLES 413
16.2.2 INSTRUMENTATION 413 16.2.2.1 PLASMA SOURCES 423
IMAGE 9
CONTENTS XIII
16.2.2.2 PLASMA CONDITIONS 425
16.2.2.3 DETECTION OF OPTICAL EMISSION 415 16.2.2.4 MASS SPECTROSCOPY
426 16.2.3 QUANTIFICATION 416 16.2.3.1 GLOW DISCHARGE-OPTICAL EMISSION
SPECTROSCOPY 426 16.2.3.2 GLOW DISCHARGE-MASS SPECTROSCOPY 427 16.2.4
APPLICATIONS 428 16.2.4.1 GLOW DISCHARGE-OPTICAL EMISSION SPECTROSCOPY
428 16.2.4.2 GLOW DISCHARGE-MASS SPECTROSCOPY 418 16.3 SECONDARY ION
MASS SPECTROMETRY (SIMS) 420 16.3.1 PRINCIPLE OF THE METHOD 420 16.3.2
DATA ANALYSIS 423 16.3.3 QUANTIFICATION 425 16.3.4 APPLICATIONS FOR
SOLAR CELLS 426 16.4 AUGER ELECTRON SPECTROSCOPY (AES) 427 16.4.1
INTRODUCTION 427 16.4.2 THE AUGER PROCESS 427 16.4.3 AUGER ELECTRON
SIGNALS 428 16.4.4 INSTRUMENTATION 429 16.4.5 AUGER ELECTRON SIGNAL
INTENSITIES AND QUANTIFICATION 431 16.4.6 QUANTIFICATION 432 16.4.7
APPLICATION 433 16.5 X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) 435 16.5.1
THEORETICAL PRINCIPLES 435 16.5.2 INSTRUMENTATION 437 16.5.3 APPLICATION
TO THIN FILM SOLAR CELLS 438 16.6 ENERGY-DISPERSIVE X-RAY ANALYSIS ON
FRACTURED
CROSS SECTIONS 440
16.6.1 BASICS ON ENERGY-DISPERSIVE X-RAY SPECTROMETRY IN A SCANNING
ELECTRON MICROSCOPE 440 16.6.2 SPATIAL RESOLUTIONS 442 16.6.3
APPLICATIONS 442 16.6.3.1 SAMPLE PREPARATION 445
REFERENCES 445
17 HYDROGEN EFFUSION EXPERIMENTS 449 WOLFHARD BEYER AND FLORIAN EINSELE
17.1 INTRODUCTION 449
17.2 EXPERIMENTAL SETUP 450
17.3 DATA ANALYSIS 454
17.3.1 IDENTIFICATION OF RATE-LIMITING PROCESS 455 17.3.2 ANALYSIS OF
DIFFUSING HYDROGEN SPECIES FROM HYDROGEN EFFUSION MEASUREMENTS 458
17.3.3 ANALYSIS OF H 2 SURFACE DESORPTION 459 17.3.4 ANALYSIS OF
DIFFUSION-LIMITED EFFUSION 460
IMAGE 10
XIV CONTENTS
17.3.5 ANALYSIS OF EFFUSION SPECTRA IN TERMS OF HYDROGEN DENSITY
OF STATES 462
17.3.6 ANALYSIS OF FILM MICROSTRUCTURE BY EFFUSION OF IMPLANTED RARE
GASES 463 17.4 DISCUSSION OF SELECTED RESULTS 467 17.4.1 AMORPHOUS
SILICON AND GERMANIUM FILMS 467
17.4.1.1 MATERIAL DENSITY VERSUS ANNEALING AND HYDROGEN CONTENT 467
17.4.1.2 EFFECT OF DOPING ON H EFFUSION 468 17.4.2 AMORPHOUS SILICON
ALLOYS: SI-C 469 17.4.3 MICROCRYSTALLINE SILICON 470 17.4.4 ZINC OXIDE
FILMS 472
17.5 COMPARISON WITH OTHER EXPERIMENTS 471 17.6 CONCLUDING REMARKS 472
REFERENCES 473
PART FOUR MATERIALS AND DEVICE MODELING 477
18 AB-LNITIO MODELING OF DEFECTS IN SEMICONDUCTORS 479 KARSTEN ALBE,
PETER AGOSTON, ANDJOHAN POHL 18.1 INTRODUCTION 479
18.2 DENSITY FUNCTIONAL THEORY AND METHODS 480 18.2.1 BASIS SETS 480
18.2.2 FUNCTIONALS FOR EXCHANGE AND CORRELATION 481 18.2.2.1 LOCAL
APPROXIMATIONS 482 18.2.2.2 FUNCTIONALS BEYOND LDA/GGA 481 18.3 METHODS
BEYOND DFT 483
18.4 FROM TOTAL ENERGIES TO MATERIALS' PROPERTIES 485 18.5 AB-INITIO
CHARACTERIZATION OF POINT DEFECTS 486 18.5.1 THERMODYNAMICS OF POINT
DEFECTS 488 18.5.2 FORMATION ENERGIES FROM AB-LNITIO CALCULATIONS 493
18.5.3 CASE STUDY: POINT DEFECTS IN ZNO 494 18.6 CONCLUSIONS 497
REFERENCES 497
19 ONE-DIMENSIONAL ELECTRO-OPTICAL SIMULATIONS OF THIN-FILM SOLAR CELLS
502 BART E. PIETERS, KOEN DECOCK, MARC BURGELMAN, ROLFSTANGL, AND THOMAS
KIRCHARTZ 19.1 INTRODUCTION 501
19.2 FUNDAMENTALS 501
19.3 MODELING HYDROGENATED AMORPHOUS AND MICROCRYSTALLINE SILICON 503
19.3.1 DENSITY OF STATES AND TRANSPORT HYDROGENATED AMORPHOUS SILICON
503 19.3.2 DENSITY OF STATES AND TRANSPORT HYDROGENATED MICROCRYSTALLINE
SILICON 507
IMAGE 11
CONTENTS XV
19.3.3 MODELING RECOMBINATION IN A-SI:H AND |IC-SI: H 508
19.3.3.1 RECOMBINATION STATISTICS FOR SINGLE-ELECTRON STATES:
SHOCKLEY-READ-HALL RECOMBINATION 508 19.3.3.2 RECOMBINATION STATISTICS
FOR AMPHOTERIC STATES 510 19.3.4 MODELING CU(IN,GA)SE 2 SOLAR CELLS 512
19.3.4.1 GRADED BAND-GAP DEVICES 512
19.3.4.2 ISSUES WHEN MODELING GRADED BAND-GAP DEVICES 523 19.3.4.3
EXAMPLE 524 19.3.5 MODELING OFCDTE SOLAR CELLS 514 19.3.5.1 BASELINE 516
19.3.5.2 THE 5 B - N AC (BARRIER-DOPING) TRADE-OFF 516 19.3.5.3 C-V
ANALYSIS AS AN INTERPRETATION AID OF I-V CURVES 518 19.4 OPTICAL
MODELING OF THIN SOLAR CELLS 519 19.4.1 COHERENT MODELING OF FLAT
INTERFACES 52 9 19.4.2 MODELING OF ROUGH INTERFACES 529 19.5 TOOLS 521
19.5.1 AFORS-HET 521 19.5.2 AMPS-ID 522
19.5.3 ASA 523
19.5.4 PC1D 523
19.5.5 SCAPS 523
19.5.6 SC-SIMUL 524 REFERENCES 524
20 TWO- AND THREE-DIMENSIONAL ELECTRONIC MODELING OF THIN-FILM SOLAR
CELLS 529 ANA KANEVCE AND WYATT K. METZGER 20.1 INTRODUCTION 529
20.2 APPLICATIONS 529
20.3 METHODS 531
20.3.1 EQUIVALENT-CIRCUIT MODELING 531 20.3.2 SOLVING SEMICONDUCTOR
EQUATIONS 532 20.3.2.1 CREATING A SEMICONDUCTOR MODEL 533 20.4 EXAMPLES
534
20.4.1 EQUIVALENT-CIRCUIT MODELING EXAMPLES 534 20.4.2 SEMICONDUCTOR
MODELING EXAMPLES 535 20.5 SUMMARY 539
REFERENCES 539
INDEX 541 |
| any_adam_object | 1 |
| author2 | Abou-Ras, Daniel |
| author2_role | edt |
| author2_variant | d a r dar |
| author_GND | (DE-588)143844768 |
| author_facet | Abou-Ras, Daniel |
| building | Verbundindex |
| bvnumber | BV037261483 |
| classification_rvk | UX 2000 VN 6050 ZN 5160 ZP 3730 |
| ctrlnum | (OCoLC)724443162 (DE-599)DNB1007027711 |
| dewey-full | 621.31244 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.31244 |
| dewey-search | 621.31244 |
| dewey-sort | 3621.31244 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Elektrotechnik / Elektronik / Nachrichtentechnik Energietechnik |
| format | Book |
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| id | DE-604.BV037261483 |
| illustrated | Illustrated |
| indexdate | 2024-07-20T11:00:37Z |
| institution | BVB |
| isbn | 9783527410033 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-021174611 |
| oclc_num | 724443162 |
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| physical | XXXVI, 547 S. Ill., graph. Darst. |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Wiley-VCH |
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| spelling | Advanced characterization techniques for thin film solar cells ed. by Daniel Abou-Ras ... Weinheim, Bergstr Wiley-VCH 2011 XXXVI, 547 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Hier auch später erschienene, unveränderte Nachdrucke Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film sol Dünnschichtsolarzelle (DE-588)4150833-6 gnd rswk-swf Dünnschichtsolarzelle (DE-588)4150833-6 s DE-604 Abou-Ras, Daniel (DE-588)143844768 edt X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=3539224&prov=M&dok_var=1&dok_ext=htm Inhaltstext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=021174611&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Advanced characterization techniques for thin film solar cells Dünnschichtsolarzelle (DE-588)4150833-6 gnd |
| subject_GND | (DE-588)4150833-6 |
| title | Advanced characterization techniques for thin film solar cells |
| title_auth | Advanced characterization techniques for thin film solar cells |
| title_exact_search | Advanced characterization techniques for thin film solar cells |
| title_full | Advanced characterization techniques for thin film solar cells ed. by Daniel Abou-Ras ... |
| title_fullStr | Advanced characterization techniques for thin film solar cells ed. by Daniel Abou-Ras ... |
| title_full_unstemmed | Advanced characterization techniques for thin film solar cells ed. by Daniel Abou-Ras ... |
| title_short | Advanced characterization techniques for thin film solar cells |
| title_sort | advanced characterization techniques for thin film solar cells |
| topic | Dünnschichtsolarzelle (DE-588)4150833-6 gnd |
| topic_facet | Dünnschichtsolarzelle |
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