Design and test technology for dependable systems-on-chip:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hershay, Pa. [u.a.]
Information Science Reference
2011
|
| Schriftenreihe: | Premier reference source
|
| Schlagworte: | |
| Beschreibung: | XXVI, 550 S. graph. Darst. |
| ISBN: | 9781609602123 9781609602147 |
Internformat
MARC
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| 020 | |a 9781609602147 |9 978-1-60960-214-7 | ||
| 035 | |a (OCoLC)837888773 | ||
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Datensatz im Suchindex
| _version_ | 1804143759751905280 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV037168714 |
| classification_rvk | ZN 4904 |
| ctrlnum | (OCoLC)837888773 (DE-599)BVBBV037168714 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV037168714 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:52:46Z |
| institution | BVB |
| isbn | 9781609602123 9781609602147 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-021083357 |
| oclc_num | 837888773 |
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| owner | DE-634 |
| owner_facet | DE-634 |
| physical | XXVI, 550 S. graph. Darst. |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Information Science Reference |
| record_format | marc |
| series2 | Premier reference source |
| spelling | Design and test technology for dependable systems-on-chip Raimund Ubar ... Hershay, Pa. [u.a.] Information Science Reference 2011 XXVI, 550 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Premier reference source System-on-Chip (DE-588)4740357-3 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content System-on-Chip (DE-588)4740357-3 s DE-604 Ubar, Raimund Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Design and test technology for dependable systems-on-chip System-on-Chip (DE-588)4740357-3 gnd |
| subject_GND | (DE-588)4740357-3 (DE-588)4143413-4 |
| title | Design and test technology for dependable systems-on-chip |
| title_auth | Design and test technology for dependable systems-on-chip |
| title_exact_search | Design and test technology for dependable systems-on-chip |
| title_full | Design and test technology for dependable systems-on-chip Raimund Ubar ... |
| title_fullStr | Design and test technology for dependable systems-on-chip Raimund Ubar ... |
| title_full_unstemmed | Design and test technology for dependable systems-on-chip Raimund Ubar ... |
| title_short | Design and test technology for dependable systems-on-chip |
| title_sort | design and test technology for dependable systems on chip |
| topic | System-on-Chip (DE-588)4740357-3 gnd |
| topic_facet | System-on-Chip Aufsatzsammlung |
| work_keys_str_mv | AT ubarraimund designandtesttechnologyfordependablesystemsonchip |