The Kelvin probe for surface engineering: fundamentals and design
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton, Fla. [u.a.]
CRC/Taylor & Francis [u.a.]
2009
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Klappentext |
| Beschreibung: | Literaturverz. S. [159] - 180 |
| Beschreibung: | XVIII, 182 S. Ill., graph. Darst. |
| ISBN: | 1420080776 9781420080773 |
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| 020 | |a 9781420080773 |c (hbk.) : GBP 52.99 |9 978-1-420-08077-3 | ||
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| 245 | 1 | 0 | |a The Kelvin probe for surface engineering |b fundamentals and design |c A. Subrahmanyam ; C. Suresh Kumar |
| 264 | 1 | |a Boca Raton, Fla. [u.a.] |b CRC/Taylor & Francis [u.a.] |c 2009 | |
| 300 | |a XVIII, 182 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 700 | 1 | |a Suresh Kumar, C. |e Verfasser |4 aut | |
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Datensatz im Suchindex
| _version_ | 1804143504161505280 |
|---|---|
| adam_text | Contents
Preface
vii
Biography of Lord Kelvin
ix
Acronyms/Abbreviation
xv
Symbols Used
xvii
Chapter
1 :
Introduction to Surfaces and Interfaces
1-20
1.1
Introduction
1
1.2
Basics of Surfaces and Surface Science
3
1.3
The Structure of Surfaces
4
1.4
The Ionization Energy and Heat of Formation in Surfaces
6
1.4.1
Ionization Energy
6
1.4.2
Heat of Formation
6
1.5
Mobility of Atoms on the Surface
6
1.6
Surface Band Structure and Surface States
7
1.7
Interaction of Adsorbed Species and Adsorbate-Induced
Changes in Surface Electronic Properties
9
1.7.1
Monovalent
Adatom
10
1.8
Adsorbate-induced Work Function Changes
11
1.9
An Outline of Surface Characterization Techniques
13
1.10
Experimental Techniques for Surface Structure Evaluation
14
1.11
Chemical Composition and Bonding
14
1.12
Electronic and Optical Properties
15
1.13
Kelvin Probe Applied to Surface Studies
18
1.14
A Brief Record and Versatility of Kelvin Probe
18
Chapter
2:
The Thermodynamics of Surfaces and
21-44
Definition of Work Function and Measurement
2.1.
Introduction to Thermodynamics of Charges on the Surfaces
21
2.2.
Chemcial Potential and Contact Potential Difference
22
X¡¡
Kelvin Probe
for Surface Engineering: Fundamentals and Design
2.2.1
Surface Energy
22
2.2.2
Chemical Potential
24
2.3
Chemical Potential of Few-electron System or Atomic Chemical
Potential
26
2.4
Fermi Energy and Chemical Potential in Semiconductors
27
2.5
Electrochemical Potential
29
2.6
Electrochemical Potential Distribution with Electrical Current and
Temperature Distribution
30
2.7
Definition of Work Function
30
2.7.1
Work Function Based on Electro-chemical Potential
30
2.7.2
Work Function Based on Contact Potential Difference
32
2.7.3
Work Function Based on Thermionic
/
Field Emission
32
2.7.4
Note on the Diversity of Work Function
32
2.8
Work Function: Band Model
33
2.9
The Vacuum Level
33
2.10
Negative Work Function
34
2.11
Surface and Bulk Work Function of Metals and Semiconductors
35
2.11.1
Work Function Measurements Based upon Diode Method
35
2.11.2
Field Emission Technique of Measuring Work Function
36
2.11.3
Photoelectric Method of Measuring Work Function
37
2.12
Contact potential Difference
:
Metal-Metal System
38
2.13
Principle of Measuring CPD
40
2.13.1
Metal-semiconductor System
41
2.14
Non-uniformity of Real Surface and Averaging of the Kelvin Probe
42
2.15
Anisotropy of the Work Function
42
Chapter
3:
Design of the Kelvin Probe and the Methods
45-82
of Measurement of Contact Potential
Difference (CPD)
3.1
Introduction
45
3.2
The Design Aspects of the Kelvin Probe: The Vibrating Capacitor
47
3.2.1
Ideal Parallel Plate Capacitor Geometry
47
3.2.2
Effect of Fringe Field and Non-parallelism
49
3.2.3
Stray Capacitance Effect
51
3.2.4
Non-uniformity of Work Function
51
3.3
The Modulation Methods and Noise Reduction Techniques: An
Outline of Literature
51
3.4
Kelvin Probe Design
52
3.4.1
Kelvin Probe Head Mechanical Design
53
3.4.2
Vibration Characteristics of the Probe
53
Contents_____________________________________
x¡¡¡
3.5
Description
of the Measuring Circuit
57
3.5.1
Conversion of the Displacement Current of Vibrating
Capacitor into Voltage
57
3.5.2
The Preamplifier
59
3.5.3
Analysis of the Preamplifier Output
60
3.5.4
Harmonic Content of the Output Signal
62
3.6
Method of CPD Measurement
67
3.6.1
Off-null Method
67
3.6.2
Feed Back Loop System
68
3.6.3
Effect of Noise
70
3.7
Spacing Dependence of CPD
71
3.8
The Reference Electrode
73
3.9
Vacuum System
74
3.10
Description of the Sample Holder
75
3.11
Scanning Kelvin Probe
75
3.11.1
Electrochromic Properties of Tungsten Oxide
78
3.11.2
Electrical Potential Gradient in the Presence of Local
Electric Current
80
Chapter
4:
Photo-Emission Yield SpectroscopyiPEYS)
83-110
4.1
Introduction
83
4.2
Basics of
Photoemission
from Solids
84
4.2.1
Photoelectric Work Function
84
4.2.2 Photoemission
Process
85
4.2.3
Experimental Techniques Based on
Photoemission 86
4.3
Fowler s Theory of Threshold
Photoemission
from Metals
86
4.4
Band Structure Approach to Ionization Energy of Semiconductor
Surfaces
87
4.5
Measurement of Photoelectric Threshold
89
4.5.1
Experimental Set up 89
4.5.2
Measurement Procedure
91
4.5.3
Types of Samples 92
4.5.4
Preparation of Reference Electrode in PEYS Experiments
93
4.6
Studies on Metallic Surfaces
^3
4.6.1
Gold Thin Film 94
4.6.2
Gold Foil 97
4.6.3
Silver Thin Film
4.6.4
Molybdenum Thin Film 101
4.6.5
Reference Electrode Work Function
:
Graphite
04
4.6.6
Studies on GaAs
(100)
Surfaces 106
XIV
Kelvin
Probe for Surface Engineering: Fundamentals and Design
Chapter
5:
Surface
Photovoltage (SPV)
Spetroscopy of
111-142
Semiconductor Surfaces
5.1
Introduction 111
5.2
A Brief Literature on SPV Technique
112
5.3
Basics of Surface
Photovoltage Spectroscopy
113
5.4
An Outline of the Relations between the Excess Charge (Ap)
and SPV
114
5.4.1
Super-band Gap SPV
116
5.4.2
Sub-band Gap SPV
116
5.4.3
Principle of SPV Measurement Using Kelvin Probe
118
5.5
Surface
Photovoltage
Experimental Setup
119
5.5.1
Samples for SPV Measurement
120
5.6
Results
121
5.6.1
Super-band Gap SPV in GaAs, CdS and CdTe/Silicon
Heteroj unction
121
5.6.2
Moderately Doped
η
-type
GaAs
(100)
Surfaces
122
5.6.3
Heavily Doped p-GaAs
( 100)
Surfaces
130
5.6.4
Semi-insulating GaAs
(100)
Surfaces
133
5.6.5
GaAs
p
-п
Junction
137
APPENDICES
143-158
Appendix I Surface States in Semiconductors
143
Appendix II The Fourier Coefficients of CJt)
147
Appendix
ΠΙ
Specifications of Low Power
FET
-input
Electrometer Grade Op Amp AD5
15
AJ
153
Appendix IV Theory of Large-Signal Surface
Photovoltage
154
References
159-180
Index
181-182
Kelvin Probe
for
Surface
Engineering
Fundamentals and Design
About the Book
Conventionally, Kelvin probe is an established and powerful tool to measure the work
function of metals and semiconductor surfaces; it is a non-destructive technique; the surface
remains virgin even after the measurement. With the emergence of
nano
and bio systems,
the potential of Kelvin probe is truly exceptional and still unexplored. The authors have
designed and fabricated a Kelvin probe set up in their laboratory at Indian Institute of
Technology Madras, Chennai, India. The Kelvin probe equipment is now being
manufactured by several companies. So far, the fundamentals and the research results on
Kelvin probe are all scattered. This book has been planned in such a way that an outline of
the required fundamentals, the rudiments of design factors and the possible precautions one
has to exercise in the fabrication and assembling of the equipment are all pooled together to
one place. Also, it is the intention of the authors to expose the power of Kelvin probe in
conducting
Photoemission
yield spectroscopy and Surface
photovoltage
spectroscopy
experiments. This book is a modest attempt to describe the fundamentals and the design
aspects. It is the earnest hope of the authors that this book may be of good use to the
researchers working on the aspects of surface science and surface engineering.
About the Authors
Dr
Subrahmanyam has been working in the Department of Physics at Indian Institute of
Technology (NT) Madras, Chennai over the past twenty five years. He has established a thin
film laboratory. His main interests are: surface Physics and surface Engineering of metal
oxides. He has published over one hundred research papers in journals and has been
granted seven patents. He has presented several key note lectures, plenary lectures and
invited talks at National and International conferences and Symposia. He has been awarded
BOYSCAST Fellowship (Department of Science and Technology, Government of India) and
Humboldt
Fellowship
(Humboldt
Foundation, Germany). He is the first Saint Gobain Chair at
Ecole Polytechnique, Paliseau
(Saint Gobain, Paris). He has been nominated as Guest
Professor by
DAAD
(Germany).
Dr Suresh
Kumar has been working on the design and development of innovative surface
measurement techniques over the past twenty years, with special interest on Kelvin Probe
and its applications to semiconductor research. His research interests include Design,
fabrication and characterization of semiconductor devices, Study of surfaces and interfaces,
Thin films, Nano-materials, Low-dimensional artificial structures and Renewable Energy.
He is also an expert in semiconductor characterization techniques like contact potential
difference (CPD) measurements, Surface photo-voltage spectroscopy,
Photoemission
yield
spectroscopy and impedance spectroscopy. He has authored several research papers and
delivered invited talks. In the Year
2007,
Dr
Suresh Kumar has been awarded Professor
A.L.
Läskar
Prize (for the best Ph.
D
thesis) for his thesis Design and Fabrication of Kelvin
Probe and Surface Passivation Studies of GaAs .
Dr
Suresh Kumar is presently the president of KG Design Services Pvt. Ltd, India.
Ane
Books
Pvt. Ltd.
Taylor
δι
Francis
Taylor
&.
Francis Group
A
CRC
PRESS BOOK
www.
с
re press.com
|
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| id | DE-604.BV036808892 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:48:42Z |
| institution | BVB |
| isbn | 1420080776 9781420080773 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020724916 |
| oclc_num | 706023458 |
| open_access_boolean | |
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| owner_facet | DE-703 |
| physical | XVIII, 182 S. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
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| publisher | CRC/Taylor & Francis [u.a.] |
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| spelling | Subrahmanyam, A. Verfasser aut The Kelvin probe for surface engineering fundamentals and design A. Subrahmanyam ; C. Suresh Kumar Boca Raton, Fla. [u.a.] CRC/Taylor & Francis [u.a.] 2009 XVIII, 182 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. [159] - 180 Oberflächenbehandlung (DE-588)4042908-8 gnd rswk-swf Kelvin-Sonde (DE-588)4688513-4 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 s Oberflächenbehandlung (DE-588)4042908-8 s Kelvin-Sonde (DE-588)4688513-4 s DE-604 Suresh Kumar, C. Verfasser aut Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020724916&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020724916&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Klappentext |
| spellingShingle | Subrahmanyam, A. Suresh Kumar, C. The Kelvin probe for surface engineering fundamentals and design Oberflächenbehandlung (DE-588)4042908-8 gnd Kelvin-Sonde (DE-588)4688513-4 gnd Oberflächenphysik (DE-588)4134881-3 gnd |
| subject_GND | (DE-588)4042908-8 (DE-588)4688513-4 (DE-588)4134881-3 |
| title | The Kelvin probe for surface engineering fundamentals and design |
| title_auth | The Kelvin probe for surface engineering fundamentals and design |
| title_exact_search | The Kelvin probe for surface engineering fundamentals and design |
| title_full | The Kelvin probe for surface engineering fundamentals and design A. Subrahmanyam ; C. Suresh Kumar |
| title_fullStr | The Kelvin probe for surface engineering fundamentals and design A. Subrahmanyam ; C. Suresh Kumar |
| title_full_unstemmed | The Kelvin probe for surface engineering fundamentals and design A. Subrahmanyam ; C. Suresh Kumar |
| title_short | The Kelvin probe for surface engineering |
| title_sort | the kelvin probe for surface engineering fundamentals and design |
| title_sub | fundamentals and design |
| topic | Oberflächenbehandlung (DE-588)4042908-8 gnd Kelvin-Sonde (DE-588)4688513-4 gnd Oberflächenphysik (DE-588)4134881-3 gnd |
| topic_facet | Oberflächenbehandlung Kelvin-Sonde Oberflächenphysik |
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