Lock-in thermography: basics and use for evaluating electronic devices and materials
Saved in:
Bibliographic Details
Main Authors: Breitenstein, Otwin (Author), Warta, Wilhelm (Author), Langenkamp, Martin (Author)
Format: Electronic eBook
Language:English
Published: Berlin [u.a.] Springer 2010
Edition:2. ed.
Series:Springer series in advanced microelectronics 10
Subjects:
Online Access:BTU01
FHI01
FHN01
FHR01
Volltext
Physical Description:1 Online-Ressource (X, 255 S.) Ill., graph. Darst.
ISBN:9783642024160
9783642024177
DOI:10.1007/978-3-642-02417-7

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Get full text