Lock-in thermography: basics and use for evaluating electronic devices and materials
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2010
|
| Ausgabe: | 2. ed. |
| Schriftenreihe: | Springer series in advanced microelectronics
10 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FHI01 FHN01 FHR01 Volltext |
| Beschreibung: | 1 Online-Ressource (X, 255 S.) Ill., graph. Darst. |
| ISBN: | 9783642024160 9783642024177 |
| DOI: | 10.1007/978-3-642-02417-7 |
Internformat
MARC
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Datensatz im Suchindex
| _version_ | 1804143420001746944 |
|---|---|
| any_adam_object | |
| author | Breitenstein, Otwin Warta, Wilhelm Langenkamp, Martin |
| author_facet | Breitenstein, Otwin Warta, Wilhelm Langenkamp, Martin |
| author_role | aut aut aut |
| author_sort | Breitenstein, Otwin |
| author_variant | o b ob w w ww m l ml |
| building | Verbundindex |
| bvnumber | BV036755244 |
| classification_rvk | ZM 3700 ZN 4032 ZQ 3820 |
| collection | ZDB-2-ENG |
| ctrlnum | (OCoLC)873710427 (DE-599)BVBBV036755244 |
| discipline | Werkstoffwissenschaften / Fertigungstechnik Elektrotechnik / Elektronik / Nachrichtentechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| doi_str_mv | 10.1007/978-3-642-02417-7 |
| edition | 2. ed. |
| format | Electronic eBook |
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| id | DE-604.BV036755244 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:47:22Z |
| institution | BVB |
| isbn | 9783642024160 9783642024177 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020672427 |
| oclc_num | 873710427 |
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| physical | 1 Online-Ressource (X, 255 S.) Ill., graph. Darst. |
| psigel | ZDB-2-ENG |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in advanced microelectronics |
| series2 | Springer series in advanced microelectronics |
| spelling | Breitenstein, Otwin Verfasser aut Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp 2. ed. Berlin [u.a.] Springer 2010 1 Online-Ressource (X, 255 S.) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Springer series in advanced microelectronics 10 Infrarotthermographie (DE-588)4242353-3 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Infrarotthermographie (DE-588)4242353-3 s DE-604 Elektronisches Bauelement (DE-588)4014360-0 s Prüftechnik (DE-588)4047610-8 s Warta, Wilhelm Verfasser aut Langenkamp, Martin Verfasser aut Springer series in advanced microelectronics 10 (DE-604)BV041461435 10 https://doi.org/10.1007/978-3-642-02417-7 Verlag Volltext |
| spellingShingle | Breitenstein, Otwin Warta, Wilhelm Langenkamp, Martin Lock-in thermography basics and use for evaluating electronic devices and materials Springer series in advanced microelectronics Infrarotthermographie (DE-588)4242353-3 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4242353-3 (DE-588)4014360-0 (DE-588)4047610-8 |
| title | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_auth | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_exact_search | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_full | Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp |
| title_fullStr | Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp |
| title_full_unstemmed | Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein ; W. Warta ; M. Langenkamp |
| title_short | Lock-in thermography |
| title_sort | lock in thermography basics and use for evaluating electronic devices and materials |
| title_sub | basics and use for evaluating electronic devices and materials |
| topic | Infrarotthermographie (DE-588)4242353-3 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Infrarotthermographie Elektronisches Bauelement Prüftechnik |
| url | https://doi.org/10.1007/978-3-642-02417-7 |
| volume_link | (DE-604)BV041461435 |
| work_keys_str_mv | AT breitensteinotwin lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials AT wartawilhelm lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials AT langenkampmartin lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials |