Scanning electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2010
|
| Ausgabe: | 2., completely rev. and updated ed., [Nachdr.] |
| Schriftenreihe: | Springer series in optical sciences
45 |
| Schlagworte: | |
| Beschreibung: | XIV, 527 S. Ill., graph. Darst. |
| ISBN: | 9783540639763 |
Internformat
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| 245 | 1 | 0 | |a Scanning electron microscopy |b physics of image formation and microanalysis |c Ludwig Reimer |
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Datensatz im Suchindex
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| author | Reimer, Ludwig |
| author_facet | Reimer, Ludwig |
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| discipline | Physik |
| edition | 2., completely rev. and updated ed., [Nachdr.] |
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| id | DE-604.BV036661926 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:45:11Z |
| institution | BVB |
| isbn | 9783540639763 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020581212 |
| oclc_num | 705794981 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-29 |
| owner_facet | DE-355 DE-BY-UBR DE-29 |
| physical | XIV, 527 S. Ill., graph. Darst. |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Reimer, Ludwig Verfasser aut Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer 2., completely rev. and updated ed., [Nachdr.] Berlin [u.a.] Springer 2010 XIV, 527 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 45 Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Springer series in optical sciences 45 (DE-604)BV000000237 45 |
| spellingShingle | Reimer, Ludwig Scanning electron microscopy physics of image formation and microanalysis Springer series in optical sciences Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | Scanning electron microscopy physics of image formation and microanalysis |
| title_auth | Scanning electron microscopy physics of image formation and microanalysis |
| title_exact_search | Scanning electron microscopy physics of image formation and microanalysis |
| title_full | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Rasterelektronenmikroskopie |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig scanningelectronmicroscopyphysicsofimageformationandmicroanalysis |