Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen: = X-ray analysis of spintronic semiconductor and half metal thin film systems
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Elektronisch E-Book |
| Sprache: | German |
| Veröffentlicht: |
2010
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Zsfassung in dt. und engl. Sprache |
| Beschreibung: | 1 Online-Ressource (80 S.) Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nmm a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV036608448 | ||
| 003 | DE-604 | ||
| 005 | 20160324 | ||
| 006 | a m||| 00||| | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 100810s2010 |||| o||u| ||||||ger d | ||
| 024 | 7 | |a urn:nbn:de:bvb:20-opus-49309 |2 urn | |
| 035 | |a (OCoLC)705725164 | ||
| 035 | |a (DE-599)BVBBV036608448 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a ger | |
| 049 | |a DE-384 |a DE-473 |a DE-703 |a DE-1051 |a DE-824 |a DE-29 |a DE-12 |a DE-91 |a DE-19 |a DE-1049 |a DE-92 |a DE-739 |a DE-898 |a DE-355 |a DE-706 |a DE-20 |a DE-1102 | ||
| 100 | 1 | |a Stahl, Andreas |d 1978- |e Verfasser |0 (DE-588)142305081 |4 aut | |
| 245 | 1 | 0 | |a Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen |b = X-ray analysis of spintronic semiconductor and half metal thin film systems |c von Andreas Stahl |
| 246 | 1 | 1 | |a X-ray analysis of spintronic semiconductor and half metal thin film systems |
| 264 | 1 | |c 2010 | |
| 300 | |a 1 Online-Ressource (80 S.) |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Zsfassung in dt. und engl. Sprache | ||
| 502 | |a Würzburg, Univ., Diss., 2010 | ||
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbmetall |0 (DE-588)4158819-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterschicht |0 (DE-588)4158812-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spintronik |0 (DE-588)7755384-6 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterschicht |0 (DE-588)4158812-5 |D s |
| 689 | 0 | 1 | |a Spintronik |0 (DE-588)7755384-6 |D s |
| 689 | 0 | 2 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbmetall |0 (DE-588)4158819-8 |D s |
| 689 | 1 | 1 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 1 | 2 | |a Spintronik |0 (DE-588)7755384-6 |D s |
| 689 | 1 | 3 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 1 | |5 DE-604 | |
| 856 | 4 | 0 | |s 10586 KB |u https://nbn-resolving.org/urn:nbn:de:bvb:20-opus-49309 |x Resolving-System |z kostenfrei |3 Volltext |
| 912 | |a ebook | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-020528781 | ||
Datensatz im Suchindex
| _version_ | 1804143212896452608 |
|---|---|
| any_adam_object | |
| author | Stahl, Andreas 1978- |
| author_GND | (DE-588)142305081 |
| author_facet | Stahl, Andreas 1978- |
| author_role | aut |
| author_sort | Stahl, Andreas 1978- |
| author_variant | a s as |
| building | Verbundindex |
| bvnumber | BV036608448 |
| collection | ebook |
| ctrlnum | (OCoLC)705725164 (DE-599)BVBBV036608448 |
| format | Thesis Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02199nmm a2200505 c 4500</leader><controlfield tag="001">BV036608448</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160324 </controlfield><controlfield tag="006">a m||| 00||| </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">100810s2010 |||| o||u| ||||||ger d</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">urn:nbn:de:bvb:20-opus-49309</subfield><subfield code="2">urn</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)705725164</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV036608448</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">ger</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-473</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-1051</subfield><subfield code="a">DE-824</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-12</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-1049</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-1102</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Stahl, Andreas</subfield><subfield code="d">1978-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)142305081</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen</subfield><subfield code="b">= X-ray analysis of spintronic semiconductor and half metal thin film systems</subfield><subfield code="c">von Andreas Stahl</subfield></datafield><datafield tag="246" ind1="1" ind2="1"><subfield code="a">X-ray analysis of spintronic semiconductor and half metal thin film systems</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (80 S.)</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Zsfassung in dt. und engl. Sprache</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="a">Würzburg, Univ., Diss., 2010</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbmetall</subfield><subfield code="0">(DE-588)4158819-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterschicht</subfield><subfield code="0">(DE-588)4158812-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spintronik</subfield><subfield code="0">(DE-588)7755384-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterschicht</subfield><subfield code="0">(DE-588)4158812-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Spintronik</subfield><subfield code="0">(DE-588)7755384-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Halbmetall</subfield><subfield code="0">(DE-588)4158819-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Spintronik</subfield><subfield code="0">(DE-588)7755384-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="3"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="s">10586 KB</subfield><subfield code="u">https://nbn-resolving.org/urn:nbn:de:bvb:20-opus-49309</subfield><subfield code="x">Resolving-System</subfield><subfield code="z">kostenfrei</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ebook</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-020528781</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV036608448 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:44:05Z |
| institution | BVB |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020528781 |
| oclc_num | 705725164 |
| open_access_boolean | 1 |
| owner | DE-384 DE-473 DE-BY-UBG DE-703 DE-1051 DE-824 DE-29 DE-12 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-1049 DE-92 DE-739 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-706 DE-20 DE-1102 |
| owner_facet | DE-384 DE-473 DE-BY-UBG DE-703 DE-1051 DE-824 DE-29 DE-12 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-1049 DE-92 DE-739 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-706 DE-20 DE-1102 |
| physical | 1 Online-Ressource (80 S.) Ill., graph. Darst. |
| psigel | ebook |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| record_format | marc |
| spelling | Stahl, Andreas 1978- Verfasser (DE-588)142305081 aut Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems von Andreas Stahl X-ray analysis of spintronic semiconductor and half metal thin film systems 2010 1 Online-Ressource (80 S.) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Zsfassung in dt. und engl. Sprache Würzburg, Univ., Diss., 2010 Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Halbmetall (DE-588)4158819-8 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Spintronik (DE-588)7755384-6 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Halbleiterschicht (DE-588)4158812-5 s Spintronik (DE-588)7755384-6 s Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 Halbmetall (DE-588)4158819-8 s Dünne Schicht (DE-588)4136925-7 s 10586 KB https://nbn-resolving.org/urn:nbn:de:bvb:20-opus-49309 Resolving-System kostenfrei Volltext |
| spellingShingle | Stahl, Andreas 1978- Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems Dünne Schicht (DE-588)4136925-7 gnd Halbmetall (DE-588)4158819-8 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Halbleiterschicht (DE-588)4158812-5 gnd Spintronik (DE-588)7755384-6 gnd |
| subject_GND | (DE-588)4136925-7 (DE-588)4158819-8 (DE-588)4137203-7 (DE-588)4158812-5 (DE-588)7755384-6 (DE-588)4113937-9 |
| title | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems |
| title_alt | X-ray analysis of spintronic semiconductor and half metal thin film systems |
| title_auth | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems |
| title_exact_search | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems |
| title_full | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems von Andreas Stahl |
| title_fullStr | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems von Andreas Stahl |
| title_full_unstemmed | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen = X-ray analysis of spintronic semiconductor and half metal thin film systems von Andreas Stahl |
| title_short | Röntgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Dünnschichtsystemen |
| title_sort | rontgenstrukturuntersuchungen an spintronischen halbleiter und halbmetall dunnschichtsystemen x ray analysis of spintronic semiconductor and half metal thin film systems |
| title_sub | = X-ray analysis of spintronic semiconductor and half metal thin film systems |
| topic | Dünne Schicht (DE-588)4136925-7 gnd Halbmetall (DE-588)4158819-8 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Halbleiterschicht (DE-588)4158812-5 gnd Spintronik (DE-588)7755384-6 gnd |
| topic_facet | Dünne Schicht Halbmetall Röntgenstrukturanalyse Halbleiterschicht Spintronik Hochschulschrift |
| url | https://nbn-resolving.org/urn:nbn:de:bvb:20-opus-49309 |
| work_keys_str_mv | AT stahlandreas rontgenstrukturuntersuchungenanspintronischenhalbleiterundhalbmetalldunnschichtsystemenxrayanalysisofspintronicsemiconductorandhalfmetalthinfilmsystems AT stahlandreas xrayanalysisofspintronicsemiconductorandhalfmetalthinfilmsystems |